公开(公告)号：US20160254158A1

公开(公告)日：2016-09-01

申请号：US14634483

申请日：2015-02-27

Applicant: GLOBALFOUNDRIES Inc.

Inventor： Hoon KIM ,  Min-Gyu SUNG ,  Chanro PARK ,  Ruilong XIE

IPC: H01L21/28 ,  H01L21/02 ,  H01L29/40

CPC classification number: H01L21/28158 ,  H01L21/02181 ,  H01L21/823821 ,  H01L21/823842 ,  H01L29/401 ,  H01L29/4966 ,  H01L29/517

Abstract: Co-fabricating non-planar (i.e., three-dimensional) semiconductor devices with different threshold voltages includes providing a starting semiconductor structure, the structure including a semiconductor substrate, multiple raised semiconductor structures coupled to the substrate, at least two gate structures encompassing a portion of the raised structures, each gate structure including a gate opening lined with dielectric material and partially filled with work function material, a portion of the work function material being recessed. The co-fabrication further includes creating at least one conformal barrier layer in one or more and less than all of the gate openings, filling the gate openings with conductive material, and modifying the work function of at least one and less than all of the filled gate structures.

Abstract translation: 共同制造具有不同阈值电压的非平面（即，三维）半导体器件包括提供起始半导体结构，该结构包括半导体衬底，耦合到衬底的多个凸起半导体结构，至少两个栅极结构， 每个栅极结构包括一个衬有介电材料并部分填充有功函材料的栅极开口，一部分功函材料被凹入。 共同制造还包括在一个或多个且少于所有的栅极开口中产生至少一个共形阻挡层，用导电材料填充栅极开口，以及修改至少一个且小于所有填充的栅极开口的功函数 门结构。