摘要:
A semiconductor memory device with multi-bank structure, includes multiple voltage boosting circuits or internal power supply voltage generating circuits, each of which generates a high voltage to be provided to a bank. The respective voltage boosting circuits or internal power supply voltage generating circuits are sequentially selected under the control of a select signal generating circuit which generates select signals corresponding to the voltage boosting circuits by use of a row address strobe signal. According to the above-mentioned configuration, the number of the voltage boosting circuits is less than the number of banks in the memory device. Therefore, the area that the voltage boosting circuits or internal power supply voltage generating circuits occupy on a chip does not increase in proportion to the increase in the number of banks.
摘要:
A power up signal generator includes a signal converter for converting an applied external source voltage to a voltage applied at a trigger node when the external source voltage rises to a first threshold, and a current source for flowing a reference current from the trigger node. A first inverter connected to the trigger node outputs a low level signal when the trigger node voltage reaches a second threshold. A second inverter outputs a power up signal after receiving the low level signal from the first inverter. The signal converter may include a PMOS transistor configuration, such that the trip voltage of the power up signal generator is dependent only on a single MOSFET transistor threshold voltage.
摘要:
A semiconductor memory device having a bit line sense amplifier connected to a bit line pair may include a precharge part to precharge first and second drive nodes of the bit line sense amplifier to an equal voltage level. The device may include a switching part operatively connecting the first and second precharge nodes to the first and second drive nodes in response to sense amplifier drive signals applied during a data non-access mode. To drive power in the bit line sense amplifier, the precharge voltage may be applied in a precharge state to precharge the first and second drive nodes to the equal voltage level, the device may shift from the precharge state to an operational state to cut off the applied precharge voltage, and driving voltages may be applied to the first and second drive nodes to power the bit line sense amplifier of the device.
摘要:
A semiconductor memory device with a bit line sense enable signal generating circuit is disclosed. The semiconductor memory device includes a word line selection signal generating circuit for generating a word line selection signal for selecting a word line; a delay circuit for generating a delayed signal by delaying a signal to the same extent of time period which is needed for the word line selection signal generating circuit to generate the word line selection signal; and a Schmitt trigger for generating a word line enable detecting signal by receiving an output signal from the delay circuit and that is connected to a power supply voltage which has the same voltage level as the voltage level used to enable the word line. The bit line sense enable signal generating circuit in the present invention occupies a relatively smaller layout area than that of conventional semiconductor memory devices. Furthermore, the generating circuit generates a bit line sense enable signal with constant delay time that is immune from process changes, voltage fluctuations, and temperature fluctuations.
摘要:
Provided is a circuit and method of generating a boosted voltage while maintaining a constant difference between the boosted voltage and an array reference voltage when the array reference voltage is varied in a normal mode, a test mode, and a burn-in test mode of a semiconductor device. The boosted voltage generating circuit comprises a sensing signal generating circuit which generates a sensing signal, a pulse generating circuit which generates a driving signal in response to the sensing signal, and a pumping circuit which generates the boosted voltage in response to the driving signal to control a word line of a semiconductor device. The sensing signal generating circuit comprises a comparator which includes a first input terminal, a second input terminal for receiving a reference voltage, and an output terminal for outputting the sensing signal, a resistor coupled between the boosted voltage and the first input terminal, and a constant current source coupled between the first input terminal and a ground voltage.
摘要:
An internal power voltage generating circuit capable of accurately adjusting a level of an internal power voltage in response to an overshoot of the internal power voltage. In one embodiment, the circuit comprises an internal power voltage generator for generating an internal power voltage to an internal power voltage generating terminal, first and second resistor devices, serially connected between the internal power voltage generating terminal and a ground voltage, for distributing the internal power voltage and for generating a distributed voltage to a distributed voltage generating node, and a current discharging device, connected between the internal power voltage generating terminal and the ground voltage, for discharging current from the internal power voltage generating terminal to the ground voltage in response to the distributed voltage.
摘要:
An apparatus and a method are disclosed for package level burn-in test circuit in semiconductor devices. The apparatus includes a package burn-in register, a test voltage generator for the package level burn-in test, a burn-in master signal generator, and a burn-in test circuit. The package burn-in register stores a package burn-in set-order from the outside and generates a package burn-in set-signal. The test voltage generator generates burn-in test voltages in response to the package burn-in set-signal and to address signals through first address terminals from the outside. The burn-in master signal generator generates a burn-in master signal by combining and receiving the second address signal form first address terminals, a wafer burn-in enable signal from a control signal input terminal, and the package burn-in set-signal. After receiving the burn-in master signal, multiple address signals from multiple third address terminals, and the test voltages for the package level burn-in test, the burn-in test circuit performs a package level burn-in test.
摘要:
An input buffer circuit simultaneously supports a low voltage interface and a general low voltage transistor-transistor logic (LVTTL) interface and operates at high speed. In the input buffer circuit, a self bias voltage generated by a self biased differential amplification circuit is used not only for tracking a common mode input voltage in the differential amplification circuit but also for controlling the current of a current source and/or sink that controls the current used in the differential amplification circuit. Accordingly, the self bias voltage remains at a substantially uniform level. Therefore, the entire transconductance gain gm of the differential amplification circuit is substantially uniform regardless of the change in a reference voltage input to the differential amplification circuit. As a result, a low voltage interface characteristic is improved. The input buffer circuit can further include a swing width control circuit that responds to an inverted signal generated from the output signal of the differential amplification circuit and prevents the voltage swing of the output signal from becoming excessively large. This reduces skew and thus improves the operating speed of the input buffer.
摘要:
A device according to the invention includes memory cells and a current sense amplifier. It also includes a feedback circuit to adjust a gain of the current sense amplifier. The gain is adjusted depending on relative delays of data stored in different ones of the memory cells to be read on the current sense amplifier.
摘要:
A high voltage generating circuit includes a standby high voltage generating means and an active high voltage generating means. The standby high voltage generating means detects a level of a high voltage in both a standby mode and an active mode to boost the high voltage when the level of the high voltage is lower than a predetermined level. The active high voltage generating means varies a voltage boosting ability responsive to a control signal when an active command is applied in the active mode to thereby boost the level of the high voltage. The active high voltage generating means also detects whether the level of the high voltage is lower than the predetermined level to adjust a level of the control signal.