公开(公告)号：US4624566A

公开(公告)日：1986-11-25

申请号：US722973

申请日：1985-04-12

Applicant: Gordon A. Shifrin ,  Jerome M. Welner

Inventor： Gordon A. Shifrin ,  Jerome M. Welner

IPC: G01J3/28 ,  G01J9/00 ,  G01S3/782 ,  H01J40/14

CPC classification number: G01S3/782 ,  G01J9/00 ,  G01J3/2803

Abstract: A spectral analyzer and direction indicator system (10) is disclosed and includes first and second optical channels (20,30) for providing detected optical information indicative of incidence direction and spectral content of incident radiation. The first optical channel includes a reflector element (11) having a non-ruled section (11a) and a spectrally dispersing ruled section (11b); an analytical optical system (13); and a detector array (15). In the reflector element of the first optical channel the non-ruled section is tilted relative to the ruled section. The second optical channel includes a non-dispersing reflector element (17), an analytical optical system (19), and a detector array (21).

Abstract translation: 公开了一种光谱分析仪和方向指示器系统（10），并且包括用于提供指示入射辐射的入射方向和光谱含量的检测光信息的第一和第二光通道（20,30）。 第一光通道包括具有非刻度部分（11a）和光谱分散刻划部分（11b）的反射器元件（11）。 分析光学系统（13）; 和检测器阵列（15）。 在第一光学通道的反射器元件中，非格形部分相对于刻线部分倾斜。 第二光通道包括非分散反射器元件（17），分析光学系统（19）和检测器阵列（21）。

公开(公告)号：US3939347A

公开(公告)日：1976-02-17

申请号：US520991

申请日：1974-11-05

Applicant: Gordon A. Shifrin

Inventor： Gordon A. Shifrin

IPC: G01R31/02 ,  H01J31/10 ,  H01J31/49 ,  G01R15/12

CPC classification number: H01J31/10 ,  G01J5/522 ,  G01R31/02

Abstract: A contour plotter for testing the response of an infrared detector comprig a small, cathode-ray tube with a hidden electron gun for generating a flying-hot-spot raster, a refracting, optical lens for focussing a reduced image of this raster on the detector under test, an oscilloscope, a two-dimensional sweep generator for sweeping the oscilloscope and the small, cathode ray tube in synchronism, and an electronic amplifier for applying the output of the detector to the Z-axis of the oscilloscope so that the intensity of the oscilloscope scanning beam is varied in accordance with the detector output response.In one embodiment, the small, cathode-ray tube uses an infrared phosphor screen to produce a small source of radiation. In a second embodiment, the cathode-ray tube uses a thin membrane screen formed by a thin film dielectric substrate with a refractory metal film deposited on it for producing a flying hot spot.

Abstract translation: 一种用于测试红外检测器的响应的轮廓绘图仪，其包括具有用于产生飞行热点光栅的隐藏电子枪的小型阴极射线管，用于将该光栅的缩小图像聚焦在检测器上的折射光学透镜 测试中，示波器，用于同步扫描示波器和小型阴极射线管的二维扫描发生器，以及用于将检测器的输出施加到示波器的Z轴的电子放大器，使得强度 示波器扫描光束根据检测器输出响应而变化。

公开(公告)号：US4966456A

公开(公告)日：1990-10-30

申请号：US374206

申请日：1989-06-30

Applicant: Gordon A. Shifrin

Inventor： Gordon A. Shifrin

IPC: B64F1/20 ,  G01J3/28 ,  G01J9/00 ,  G01S1/70 ,  G01S3/784

CPC classification number: B64F1/20 ,  G01J3/021 ,  G01J3/1804 ,  G01J9/00 ,  G01S1/70 ,  G01S3/784 ,  G01J3/2803

Abstract: A spectral analyzer and direction indicator system (10) is disclosed and includes optical channels (20,30,40) for providing detected optical information indicative of incidence direction and spectral content of incident radiation. Each optical channel includes a reflector element (11,17,23) having a non-ruled section (11a,17a,23a) and a spectrally dispersing ruled section (11b,17b,23b); an analytical optical system (13,19,25); and a detector array (15,21,27). For each reflector element the non-ruled section is tilted in one or two directions relative to the ruled section. The disclosed spectral analyzer and direction indicator system is advantageously utilized as an aircraft based sensor in an aircraft landing system having ground lasers (29L,29R,33L,33R,37L,37R) directed into the landing approach path.

Abstract translation: 公开了一种光谱分析仪和方向指示器系统（10），并且包括用于提供指示入射辐射的入射方向和光谱含量的检测光信息的光通道（20,30,40）。 每个光通道包括具有非刻度部分（11a，17a，23a）和光谱分散刻划部分（11b，17b，23b）的反射器元件（11,17,23）。 分析光学系统（13,19,25）; 和检测器阵列（15,21,27）。 对于每个反射器元件，非划线部分相对于刻划部分在一个或两个方向上倾斜。 所公开的频谱分析仪和方向指示器系统有利地用作飞行器着陆系统中的基于飞机的传感器，其具有被引导到着陆进场路径中的地面激光器（29L，29R，33L，33R，37L，37R）。

公开(公告)号：US4764009A

公开(公告)日：1988-08-16

申请号：US69781

申请日：1987-07-06

Applicant: Gordon A. Shifrin

Inventor： Gordon A. Shifrin

IPC: G01J9/00 ,  G01S3/784 ,  G01J3/36 ,  G01B11/26

CPC classification number: G01S3/784 ,  G01J9/00

Abstract: A spectral analyzer and direction indicator is disclosed and is responsive to collimated or essentially collimated incident radiation. The spectral analyzer and direction indicator includes optical apparatus (13, 15, 113) for providing optical information including diffracted optical information. A detector structure (21, 23, 117) is responsive to the optical information to provide detection output information indicative of incidence direction and spectral content collimated or essentially collimated incident radiation. A processor (20, 120) determines whether the diffraction information includes second order diffraction.

Abstract translation: 公开了一种光谱分析仪和方向指示器，并且响应于准直或基本上准直的入射辐射。 频谱分析仪和方向指示器包括用于提供包括衍射光学信息的光学信息的光学设备（13,15,113）。 检测器结构（21,23,117）响应于光学信息以提供指示入射方向和光谱内容准直或基本准直的入射辐射的检测输出信息。 处理器（20,120）确定衍射信息是否包括二阶衍射。

公开(公告)号：US4677740A

公开(公告)日：1987-07-07

申请号：US838409

申请日：1986-03-07

Applicant: Gordon A. Shifrin ,  Robert G. Hunsperger

Inventor： Gordon A. Shifrin ,  Robert G. Hunsperger

IPC: H01L21/00 ,  H01L31/00 ,  H01L31/173 ,  H01L21/265

CPC classification number: H01L31/00 ,  H01L21/00 ,  H01L31/173

Abstract: Disclosed are novel opto-isolator devices and processes for fabricating same wherein suitable semiconductive substrates, such as galium arsenide wafers, are treated with conductivity type determining impurities in such a manner as to form radiation emitters, radiation detectors and interconnecting waveguides therein. These operative regions which form a monolithic opto-isolator have the necessary electro-optical characteristics for generating and coupling radiation from the emitter and through the waveguide coupler to the detector; and all of these regions may be integrally fabricated in a monolithic batch fabrication process. Such process may use, for example, particle implantation and masking steps, thereby ensuring high yield and low cost device fabrication.

Abstract translation: 公开了新颖的光隔离器器件及其制造方法，其中合适的半导体衬底（例如砷化镓晶片）以导电类型确定杂质以在其中形成辐射发射器，辐射探测器和互连波导的方式进行处理。 形成单片光隔离器的这些操作区域具有用于产生和耦合来自发射器和波导耦合器到检测器的辐射所需的电光特性; 并且所有这些区域可以整体制造在整体批量制造工艺中。 这样的过程可以使用例如颗粒注入和掩蔽步骤，从而确保高产量和低成本的器件制造。

公开(公告)号：US5043726A

公开(公告)日：1991-08-27

申请号：US737114

申请日：1985-05-23

Applicant: Gordon A. Shifrin

Inventor： Gordon A. Shifrin

IPC: B64F1/20 ,  G01J3/28 ,  G01J9/00 ,  G01S1/70 ,  G01S3/784

CPC classification number: G01J9/00 ,  B64F1/20 ,  G01S1/70 ,  G01S3/784 ,  G01J3/2803

Abstract: A spectral analyzer and direction indicator system (10) is disclosed and includes optical channels (20,30,40) for providing detected optical information indicative of incidence direction and spectral content of incident radiation. Each optical channel includes a reflector element (11,17,23) having a non-ruled section (11a, 17a, 23a) and a spectrally dispersing ruled section (11b, 17b, 23b); an analytical optical system (13,19,25); and a detector array (15,21,27). For each reflector element the non-ruled section is tilted in one or two directions relative to the ruled section. The disclosed spectral analyzer and direction indicator system is advantageously utilized as an aircraft based sensor in an aircraft landing system having ground based lasers (29L, 29R, 33L, 33R, 37L, 37R) directed into the landing approach path.

Abstract translation: 公开了一种光谱分析仪和方向指示器系统（10），并且包括用于提供指示入射辐射的入射方向和光谱含量的检测光信息的光通道（20,30,40）。 每个光通道包括具有非刻度部分（11a，17a，23a）和光谱分散刻划部分（11b，17b，23b）的反射器元件（11,17,23）。 分析光学系统（13,19,25）; 和检测器阵列（15,21,27）。 对于每个反射器元件，非划线部分相对于刻划部分在一个或两个方向上倾斜。 所公开的光谱分析仪和方向指示器系统有利地用作飞行器着陆系统中的基于飞机的传感器，其具有指向着陆进场路径的基于地面的激光器（29L，29R，33L，33R，37L，37R）。

公开(公告)号：US4674871A

公开(公告)日：1987-06-23

申请号：US637098

申请日：1984-08-02

Applicant: Gordon A. Shifrin

Inventor： Gordon A. Shifrin

IPC: G01J3/28 ,  G01J3/02 ,  G01J9/00 ,  G01S3/78 ,  G01S3/783 ,  G01S3/784 ,  G01B11/26 ,  G01J3/36

CPC classification number: G01J9/00 ,  G01S3/783 ,  G01S3/784

Abstract: A spectral analyzer and direction indicator and direction indicator (10,20) is disclosed and includes reflection gratings (13,15,25,27,37,39), associated optical systems (17,19,29,33,41,45) and associated detectors (21,23,31,35,43,47,30). The reflection gratings (13,15,25,27,37,39) are arranged to provided angles of diffraction which are utilized to determine spectral content and incidence direction of collimated or essentially collimated incident radiation.

Abstract translation: 公开了一种光谱分析仪和方向指示器和方向指示器（10,20），包括反射光栅（13,15,25,27,37,39），相关联的光学系统（17,19,29,33,41,45） 和相关联的检测器（21,23,31,35,43,47,30）。 反射光栅（13,15,25,27,37,39）被布置成提供衍射角，其用于确定准直或基本上准直的入射辐射的光谱含量和入射方向。

公开(公告)号：US4439004A

公开(公告)日：1984-03-27

申请号：US437079

申请日：1982-10-27

Applicant: Robert G. Hunsperger ,  Gordon A. Shifrin

Inventor： Robert G. Hunsperger ,  Gordon A. Shifrin

IPC: G02F1/025 ,  G02F1/035 ,  G02B5/172 ,  G02F1/015

CPC classification number: G02F1/025 ,  G02F1/035

Abstract: Disclosed is an improved optical waveguide and modulator and an ion implantation process for fabricating same. The process includes the step of implanting high energy protons in a suitable semiconductive substrate material, such as gallium arsenide, to form a semi-insulating wave guiding layer therein for efficiently sustaining light propagation. The relatively large difference between the refractive indices of the high resistivity proton implanted layer and of the underlying low resistivity substrate result in highly efficient coupling and modulation of light passing through the proton implanted layer. The letter is partly the result of the relatively high resistivity attainable by proton implantation and partly the result of the sharp profile of ion dosage versus proton implantation distance into the substrate.

Abstract translation: 公开了一种改进的光波导和调制器以及用于制造它的离子注入工艺。 该方法包括将高能质子注入合适的半导体衬底材料如砷化镓中以在其中形成半绝缘波导层以有效维持光传播的步骤。 高电阻率质子注入层和底层低电阻率衬底的折射率之间的相对较大的差别导致通过质子注入层的光的高效耦合和调制。 该字母部分是由质子注入可获得的相对较高的电阻率的结果，部分是离子剂量与衬底中质子注入距离的锐利轮廓的结果。

公开(公告)号：US4021675A

公开(公告)日：1977-05-03

申请号：US538287

申请日：1975-01-02

Applicant: Gordon A. Shifrin

Inventor： Gordon A. Shifrin

IPC: G01T1/29 ,  H01J37/244 ,  H01J37/304 ,  G01N23/00

CPC classification number: H01J37/244 ,  G01T1/29 ,  H01J37/304 ,  H01J2237/24405 ,  H01J2237/24507

Abstract: Disclosed is an ion implantation process control system wherein the ion dosage in semiconductor wafers is continuously controlled. This control is achieved by controllably and incrementally integrating the ion beam current to provide a control signal, and then utilizing this control signal to provide controlled relative movement between the ion beam and the surface area upon which it fails.

Abstract translation: 公开了一种离子注入工艺控制系统，其中半导体晶片中的离子剂量被连续控制。 该控制是通过可控地和渐进地集成离子束电流来实现的，以提供控制信号，然后利用该控制信号来提供离子束与其失效的表面区域之间受控的相对运动。