POLARISATION SEPARATION DEVICE, DIFFERENTIAL INTERFEROMETER AND DIFFERENTIAL OPTICAL CONTRAST MICROSCOPE COMPRISING SUCH A DEVICE

    公开(公告)号:US20220155607A1

    公开(公告)日:2022-05-19

    申请号:US17438763

    申请日:2020-03-11

    Abstract: Disclosed is a polarization separation device to receive an incident light beam. The device includes first and second geometric-phase lenses, having respective first optical centers, first optical axes and first focal lengths. The first and second geometric-phase lenses are separated from one another by a first distance according to the first optical axis, the first geometric-phase lens and the second geometric-phase lens being disposed to have an optical power with the same sign for a first circular polarization state and an optical power with an opposite sign for another circular polarization state orthogonal to the first circular polarization state. The device is configured and directed so a projection of the first optical center according to the first optical axis on the second geometric-phase optical lens is located at a non-zero second distance from the second optical center.

    METHOD AND INSTRUMENT FOR MEASURING ETCH DEPTH BY DIFFERENTIAL POLARIMETRIC INTERFEROMETRY AND GLOW DISCHARGE SPECTROMETRY APPARATUS COMPRISING SUCH A MEASURING INSTRUMENT

    公开(公告)号:US20200103214A1

    公开(公告)日:2020-04-02

    申请号:US16470061

    申请日:2017-12-14

    Inventor: Simon RICHARD

    Abstract: Disclosed is a method for measuring etch depth including the following steps: splitting a light beam into a first, and respectively second, incident beam directed towards a first, respectively second, area of a sample exposed to an etching treatment to form a first, and respectively second, reflected beam, recombining the first reflected beam and the second reflected beam to form an interferometric beam; detecting a first, and respectively second, interferometric intensity signal relative to a first, respectively second, polarisation component; calculating a lower envelope function and an upper envelope function of a differential polarimetric interferometry signal; determining an offset function and a normalisation function from the first lower envelope function and the first upper envelope function; and calculating a differential polarimetric interferometry function normalised locally at each time instant.

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