Wafer defect detection system with traveling lens multi-beam scanner
    1.
    发明授权
    Wafer defect detection system with traveling lens multi-beam scanner 有权
    带移动透镜多光束扫描仪的晶圆缺陷检测系统

    公开(公告)号:US06853475B2

    公开(公告)日:2005-02-08

    申请号:US10617449

    申请日:2003-07-11

    摘要: A system for inspecting a specimen, such as a semiconductor wafer that uses a laser light source for providing a beam of light. The beam is applied to a traveling lens acousto-optic device having an active region and responsive to an RF input signal to selectively generate plural traveling lenses in the active region. The traveling lens acousto-optic device is operative to receive the light beam and generate plural flying spot beams, at the respective focus of each of the generated traveling lenses. A light detector unit, having a plurality of detector sections, each detector section having a plurality of light detectors and at least one multi-stage storage device operative to receive in parallel an input from the plurality of light detectors, is used to generate useable scan data. Information stored in each of the storage devices is serially read out concurrently from the multiple stages.

    摘要翻译: 用于检查样本的系统,例如使用激光源提供光束的半导体晶片。 光束被施加到具有有源区域并且响应于RF输入信号的移动透镜声光器件,以在有源区域中选择性地生成多个行进透镜。 移动透镜声光装置可操作以在每个所生成的行进透镜的各个焦点处接收光束并产生多个飞点光束。 一种具有多个检测器部分的光检测器单元,每个检测器部分具有多个光检测器和用于并行接收来自多个光检测器的输入的至少一个多级存储装置,用于产生可用的扫描 数据。 存储在每个存储设备中的信息从多个阶段同时连续地读出。

    High resolution wafer inspection system
    4.
    发明授权
    High resolution wafer inspection system 有权
    高分辨率晶圆检测系统

    公开(公告)号:US07714999B2

    公开(公告)日:2010-05-11

    申请号:US11952010

    申请日:2007-12-06

    IPC分类号: G01N21/00

    摘要: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region at a scan rate. A detector receives the returning probe radiation, and forms an image of the region that corresponds to a resolution better than pump and probe Abbe limits of the optical system. Roles of the pump and probe beams may be alternated, and a modulation frequency of the pump beam may be changed, to produce more information. Information extracted from the probe signal can also differentiate between different materials on the region.

    摘要翻译: 一种用于检查区域的方法,包括通过具有泵浦波长的泵浦光束的光学系统照射该区域。 探测波长的探测光束照射该区域,以产生从该区域返回的探测光束辐射。 以扫描速率跨越该区域扫描光束。 检测器接收返回的探针辐射,并且形成对应于分辨率的区域的图像优于光学系统的泵浦和探针阿贝限制。 泵和探针光束的作用可以交替变化,并且可以改变泵浦光束的调制频率,以产生更多的信息。 从探测信号中提取的信息也可以区分该区域上的不同材料。

    HIGH RESOLUTION WAFER INSPECTION SYSTEM
    5.
    发明申请
    HIGH RESOLUTION WAFER INSPECTION SYSTEM 失效
    高分辨率波浪检测系统

    公开(公告)号:US20100188658A1

    公开(公告)日:2010-07-29

    申请号:US12752995

    申请日:2010-04-01

    IPC分类号: G01N21/88 G01N21/00

    摘要: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region at a scan rate. A detector receives the returning probe radiation, and forms an image of the region that corresponds to a resolution better than pump and probe Abbe limits of the optical system. Roles of the pump and probe beams may be alternated, and a modulation frequency of the pump beam may be changed, to produce more information. Information extracted from the probe signal can also differentiate between different materials on the region

    摘要翻译: 一种用于检查区域的方法,包括通过具有泵浦波长的泵浦光束的光学系统照射该区域。 在探测波长处的探测光束照射该区域,以产生从该区域返回的探测光束辐射。 以扫描速率跨越该区域扫描光束。 检测器接收返回的探针辐射,并且形成对应于分辨率的区域的图像优于光学系统的泵浦和探针阿贝限制。 泵和探针光束的作用可以交替变化,并且可以改变泵浦光束的调制频率,以产生更多的信息。 从探测信号中提取的信息也可以区分该区域上的不同材料

    HIGH RESOLUTION WAFER INSPECTION SYSTEM
    6.
    发明申请
    HIGH RESOLUTION WAFER INSPECTION SYSTEM 有权
    高分辨率波浪检测系统

    公开(公告)号:US20080231845A1

    公开(公告)日:2008-09-25

    申请号:US11952010

    申请日:2007-12-06

    IPC分类号: G01N21/95

    摘要: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region at a scan rate. A detector receives the returning probe radiation, and forms an image of the region that corresponds to a resolution better than pump and probe Abbe limits of the optical system. Roles of the pump and probe beams may be alternated, and a modulation frequency of the pump beam may be changed, to produce more information. Information extracted from the probe signal can also differentiate between different materials on the region

    摘要翻译: 一种用于检查区域的方法,包括通过具有泵浦波长的泵浦光束的光学系统照射该区域。 探测波长的探测光束照射该区域,以产生从该区域返回的探测光束辐射。 以扫描速率跨越该区域扫描光束。 检测器接收返回的探针辐射,并且形成对应于分辨率的区域的图像优于光学系统的泵浦和探针阿贝限制。 泵和探针光束的作用可以交替变化,并且可以改变泵浦光束的调制频率,以产生更多的信息。 从探测信号中提取的信息也可以区分该区域上的不同材料

    High resolution wafer inspection system
    7.
    发明授权
    High resolution wafer inspection system 失效
    高分辨率晶圆检测系统

    公开(公告)号:US07973919B2

    公开(公告)日:2011-07-05

    申请号:US12752995

    申请日:2010-04-01

    IPC分类号: G01N21/00

    摘要: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region at a scan rate. A detector receives the returning probe radiation, and forms an image of the region that corresponds to a resolution better than pump and probe Abbe limits of the optical system. Roles of the pump and probe beams may be alternated, and a modulation frequency of the pump beam may be changed, to produce more information. Information extracted from the probe signal can also differentiate between different materials on the region.

    摘要翻译: 一种用于检查区域的方法,包括通过具有泵浦波长的泵浦光束的光学系统照射该区域。 探测波长的探测光束照射该区域,以产生从该区域返回的探测光束辐射。 以扫描速率跨越该区域扫描光束。 检测器接收返回的探针辐射,并且形成对应于分辨率的区域的图像优于光学系统的泵浦和探针阿贝限制。 泵和探针光束的作用可以交替变化,并且可以改变泵浦光束的调制频率,以产生更多的信息。 从探测信号中提取的信息也可以区分该区域上的不同材料。

    High throughput inspection system and method for generating transmitted and/or reflected images
    8.
    发明授权
    High throughput inspection system and method for generating transmitted and/or reflected images 有权
    高通量检测系统和用于产生透射和/或反射图像的方法

    公开(公告)号:US06930770B2

    公开(公告)日:2005-08-16

    申请号:US10215972

    申请日:2002-08-08

    IPC分类号: G01N21/88 G01N21/956

    CPC分类号: G01N21/8806 G01N21/956

    摘要: Inspection system and method for high-throughput inspection, the system and method is capable to generate and sense transmitted and/or reflected short duration beams. According to one embodiment of the invention the transmitted and reflected short duration beams are generated and sensed simultaneously thus provide a reflected image and a transmitted image simultaneously. The reflected and transmitted short duration radiation beams are manipulated either in the frequency domain or are distinctly polarized such that they are directed to the appropriate area sensors. According to another aspect of the invention the system changes the manipulation of a short duration beam of radiation to selectively direct the short duration beam to distinct area sensors.

    摘要翻译: 用于高通量检测的检测系统和方法,该系统和方法能够产生和感测传输和/或反射的短持续时间波束。 根据本发明的一个实施例,同时产生和感测发射和反射的短持续时间波束,同时提供反射图像和透射图像。 反射和发射的短持续时间的辐射束在频域中被操纵或被明显极化,使得它们被引导到适当的区域传感器。 根据本发明的另一方面,系统改变对短持续时间的射束的操纵,以选择性地将短持续时间的射束引导到不同的区域传感器。

    High Throughput Inspection System and a Method for Generating Transmitted and/or Reflected Images
    9.
    发明申请
    High Throughput Inspection System and a Method for Generating Transmitted and/or Reflected Images 有权
    高通量检测系统和生成传输和/或反射图像的方法

    公开(公告)号:US20060221331A1

    公开(公告)日:2006-10-05

    申请号:US11425101

    申请日:2006-06-19

    IPC分类号: G01N21/88

    CPC分类号: G01N21/8806 G01N21/956

    摘要: Inspection system and method for high-throughput inspection, the system and method is capable to generate and sense transmitted and/or reflected short duration beams. According to one embodiment of the invention the transmitted and reflected short duration beams are generated and sensed simultaneously thus provide a reflected image and a transmitted image simultaneously. The reflected and transmitted short duration radiation beams are manipulated either in the frequency domain or are distinctly polarized such that they are directed to the appropriate area sensors. According to another aspect of the invention the system changes the manipulation of a short duration beam of radiation to selectively direct the short duration beam to distinct area sensors.

    摘要翻译: 用于高通量检测的检测系统和方法,该系统和方法能够产生和感测传输和/或反射的短持续时间波束。 根据本发明的一个实施例,同时产生和感测发射和反射的短持续时间波束,同时提供反射图像和透射图像。 反射和发射的短持续时间的辐射束在频域中被操纵或被明显极化,使得它们被引导到适当的区域传感器。 根据本发明的另一方面,系统改变对短持续时间的射束的操纵,以选择性地将短持续时间的射束引导到不同的区域传感器。