SYNCHRONOUS PHOTOELASTIC MODULATOR DRIVING AND DETECTION

    公开(公告)号:US20200174289A1

    公开(公告)日:2020-06-04

    申请号:US16692796

    申请日:2019-11-22

    发明人: John Freudenthal

    IPC分类号: G02F1/03 G02F1/11 H03L7/093

    摘要: Apparatus include a photoelastic modulator (PEM) optical element, a controller having a frequency generator configured to produce a frequency signal at a selected frequency based on a clock signal of the controller wherein the controller is configured to produce a PEM driving signal based on the frequency signal, a PEM transducer coupled to the PEM optical element and the controller and configured to drive the PEM with the PEM driving signal, and a detector optically coupled to the PEM optical element and configured to receive a PEM modulated output and to produce a PEM detection signal that includes a PEM modulation signal, wherein the controller is configured to receive the PEM detection signal and to extract the PEM modulation signal from the PEM detection signal using the frequency signal and the clock signal.

    Unambiguous retardance measurement

    公开(公告)号:US09841372B2

    公开(公告)日:2017-12-12

    申请号:US14866612

    申请日:2015-09-25

    IPC分类号: G01J4/00 G01N21/21 G01N21/23

    CPC分类号: G01N21/21 G01N21/23

    摘要: This invention is directed to methods of unambiguously measuring the absolute retardance, δA of an optical sample. A method for measuring absolute retardance of an optical sample includes directing light comprising a plurality of wavelengths through a polarization state generator source, the optical sample, and a polarization state analyzer, detecting, at an imaging device, retardance measurement light emanating from the optical sample after also passing through the polarization state analyzer at the plurality of wavelengths, determining a measurement retardance associated with the detected retardance measurement light at each of the wavelengths, and determining an absolute retardance associated with the optical sample based on the measurement retardances determined at each of the wavelengths.

    POLARIZATION PROPERTIES IMAGING SYSTEMS
    4.
    发明申请
    POLARIZATION PROPERTIES IMAGING SYSTEMS 有权
    偏振特性成像系统

    公开(公告)号:US20160116397A1

    公开(公告)日:2016-04-28

    申请号:US14893157

    申请日:2014-05-20

    IPC分类号: G01N21/23

    摘要: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one example, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. An example spatially resolved imaging approach described herein is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

    摘要翻译: 本公开一般涉及用于对光学材料样品的偏振特性进行成像的系统。 作为一个示例,提供了一种用于在宽范围的入射角下精确地同时成像样品材料的面内和平面外双折射性质的系统的系统。 除了作为优选实施例讨论的平面内和平面外双折射度量之外,本文描述的示例性空间分辨成像方法适于确定宽范围的偏振特性。

    Synchronous photoelastic modulator driving and detection

    公开(公告)号:US11686957B2

    公开(公告)日:2023-06-27

    申请号:US16692796

    申请日:2019-11-22

    发明人: John Freudenthal

    IPC分类号: G02F1/03 H03L7/093 G02F1/11

    摘要: Apparatus include a photoelastic modulator (PEM) optical element, a controller having a frequency generator configured to produce a frequency signal at a selected frequency based on a clock signal of the controller wherein the controller is configured to produce a PEM driving signal based on the frequency signal, a PEM transducer coupled to the PEM optical element and the controller and configured to drive the PEM with the PEM driving signal, and a detector optically coupled to the PEM optical element and configured to receive a PEM modulated output and to produce a PEM detection signal that includes a PEM modulation signal, wherein the controller is configured to receive the PEM detection signal and to extract the PEM modulation signal from the PEM detection signal using the frequency signal and the clock signal.

    Universal cushion support for photoelastic modulator

    公开(公告)号:US11307438B2

    公开(公告)日:2022-04-19

    申请号:US15853201

    申请日:2017-12-22

    IPC分类号: G02F1/01

    摘要: An apparatus includes an elastically deformable optical element holder situated to receive an optical element having a plurality of holder contact surfaces, the optical element holder including a plurality of receiving portions adjacent to an aperture and corresponding to respective holder contact surfaces, each receiving portion displaceable through deformation of the optical element holder so that the optical element is insertable in the aperture so as to be cushionably supported in a predetermined position with the receiving portions in contact with the respective holder contact surfaces.

    UNAMBIGUOUS RETARDANCE MEASUREMENT
    7.
    发明申请
    UNAMBIGUOUS RETARDANCE MEASUREMENT 审中-公开
    不可逾越的测量

    公开(公告)号:US20160091416A1

    公开(公告)日:2016-03-31

    申请号:US14866612

    申请日:2015-09-25

    IPC分类号: G01N21/21

    CPC分类号: G01N21/21 G01N21/23

    摘要: This invention is directed to methods of unambiguously measuring the absolute retardance, δA of an optical sample. A method for measuring absolute retardance of an optical sample includes directing light comprising a plurality of wavelengths through a polarization state generator source, the optical sample, and a polarization state analyzer, detecting, at an imaging device, retardance measurement light emanating from the optical sample after also passing through the polarization state analyzer at the plurality of wavelengths, determining a measurement retardance associated with the detected retardance measurement light at each of the wavelengths, and determining an absolute retardance associated with the optical sample based on the measurement retardances determined at each of the wavelengths.

    摘要翻译: 本发明涉及明确测量光学样品的绝对延迟δA的方法。 用于测量光学样本的绝对延迟的方法包括通过偏振态发生器源,光学样本和偏振状态分析器引导包括多个波长的光,在成像装置处检测从光学样本发出的延迟测量光 在通过多个波长的偏振状态分析器之后,确定与每个波长处的检测到的延迟测量光相关联的测量延迟,并且基于在每个波长处确定的测量阻抗来确定与光学样本相关联的绝对延迟 波长。

    Dual transducer photoelastic modulator

    公开(公告)号:US11054672B2

    公开(公告)日:2021-07-06

    申请号:US16206398

    申请日:2018-11-30

    IPC分类号: G02F1/03 G02F1/07 G02F1/01

    摘要: An apparatus includes a photoelastic modulator (PEM) optical element including a first driving axis and a second driving axis arranged at a selected angle with respect to each other and perpendicular to an optical axis, wherein the first driving axis and the second driving axis extend respective predetermined non-equal lengths that correspond to respective predetermined non-equal natural first and second PEM frequencies f1 and f2. Methods of manufacture and operation are also disclosed.

    DUAL TRANSDUCER PHOTOELASTIC MODULATOR
    9.
    发明申请

    公开(公告)号:US20190171042A1

    公开(公告)日:2019-06-06

    申请号:US16206398

    申请日:2018-11-30

    IPC分类号: G02F1/01

    摘要: An apparatus includes a photoelastic modulator (PEM) optical element including a first driving axis and a second driving axis arranged at a selected angle with respect to each other and perpendicular to an optical axis, wherein the first driving axis and the second driving axis extend respective predetermined non-equal lengths that correspond to respective predetermined non-equal natural first and second PEM frequencies f1 and f2. Methods of manufacture and operation are also disclosed.

    Polarization properties imaging systems

    公开(公告)号:US10168274B2

    公开(公告)日:2019-01-01

    申请号:US15612564

    申请日:2017-06-02

    IPC分类号: G01N21/23 G01J4/00 G01N21/21

    摘要: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.