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公开(公告)号：US08567044B2
公开(公告)日：2013-10-29
申请号：US13223060
申请日：2011-08-31
CPC分类号： G11B5/82 , B82Y10/00 , G11B5/743 , G11B5/8404 , G11B5/855
摘要： A defect inspection is performed for each of glass substrates by a surface defect detector. The distance from the center of the glass substrate to a detected defect, as a radius of a nonmagnetic region to be formed circular, is recorded along with an ID assigned to the glass substrate. Such defect information is recorded in a defect list using a printer or recorded in an RFID tag using an RFID writer. The defect list or the RFID tag is attached to a glass-substrate case. Each glass substrate and its defect information are in one-to-one correspondence and are provided to a customer as a magnetic disk manufacturer. Based on the obtained defect information, the customer manufactures magnetic disks each being a discrete track recording medium having the nonmagnetic region formed at the position where the defect is present.
摘要翻译： 通过表面缺陷检测器对玻璃基板进行缺陷检查。 将从玻璃基板的中心到检测到的缺陷的距离作为形成圆形的非磁性区域的半径与分配给玻璃基板的ID一起被记录。 使用打印机将这样的缺陷信息记录在缺陷列表中，或者使用RFID写入器记录在RFID标签中。 缺陷列表或RFID标签附着在玻璃基板外壳上。 每个玻璃基板及其缺陷信息是一一对应的，并作为磁盘制造商提供给客户。 基于获得的缺陷信息，客户制造磁盘，每个磁盘都是具有在存在缺陷的位置处形成的非磁性区域的离散轨道记录介质。
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2.发明申请公开(公告)号：US20110308073A1
公开(公告)日：2011-12-22
申请号：US13223060
申请日：2011-08-31
IPC分类号： G11B5/84
CPC分类号： G11B5/82 , B82Y10/00 , G11B5/743 , G11B5/8404 , G11B5/855
摘要： A defect inspection is performed for each of glass substrates by a surface defect detector. The distance from the center of the glass substrate to a detected defect, as a radius of a nonmagnetic region to be formed circular, is recorded along with an ID assigned to the glass substrate. Such defect information is recorded in a defect list using a printer or recorded in an RFID tag using an RFID writer. The defect list or the RFID tag is attached to a glass-substrate case. Each glass substrate and its defect information are in one-to-one correspondence and are provided to a customer as a magnetic disk manufacturer. Based on the obtained defect information, the customer manufactures magnetic disks each being a discrete track recording medium having the nonmagnetic region formed at the position where the defect is present.
摘要翻译： 通过表面缺陷检测器对玻璃基板进行缺陷检查。 将从玻璃基板的中心到检测到的缺陷的距离作为形成圆形的非磁性区域的半径与分配给玻璃基板的ID一起被记录。 使用打印机将这样的缺陷信息记录在缺陷列表中，或者使用RFID写入器记录在RFID标签中。 缺陷列表或RFID标签附着在玻璃基板外壳上。 每个玻璃基板及其缺陷信息是一一对应的，并作为磁盘制造商提供给客户。 基于获得的缺陷信息，客户制造磁盘，每个磁盘都是具有在存在缺陷的位置处形成的非磁性区域的离散轨道记录介质。
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公开(公告)号：US08033008B2
公开(公告)日：2011-10-11
申请号：US12014398
申请日：2008-01-15
CPC分类号： G11B5/82 , B82Y10/00 , G11B5/743 , G11B5/8404 , G11B5/855
摘要： A defect inspection is performed for each of glass substrates by a surface defect detector. The distance from the center of the glass substrate to a detected defect, as a radius of a nonmagnetic region to be formed circular, is recorded along with an ID assigned to the glass substrate. Such defect information is recorded in a defect list using a printer or recorded in an RFID tag using an RFID writer. The defect list or the RFID tag is attached to a glass-substrate case. Each glass substrate and its defect information are in one-to-one correspondence and are provided to a customer as a magnetic disk manufacturer. Based on the obtained defect information, the customer manufactures magnetic disks each being a discrete track recording medium having the nonmagnetic region formed at the position where the defect is present.
摘要翻译： 通过表面缺陷检测器对玻璃基板进行缺陷检查。 将从玻璃基板的中心到检测到的缺陷的距离作为形成圆形的非磁性区域的半径与分配给玻璃基板的ID一起被记录。 使用打印机将这样的缺陷信息记录在缺陷列表中，或者使用RFID写入器记录在RFID标签中。 缺陷列表或RFID标签附着在玻璃基板外壳上。 每个玻璃基板及其缺陷信息是一一对应的，并作为磁盘制造商提供给客户。 基于获得的缺陷信息，客户制造磁盘，每个磁盘都是具有在存在缺陷的位置处形成的非磁性区域的离散轨道记录介质。
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公开(公告)号：US5939170A
公开(公告)日：1999-08-17
申请号：US819129
申请日：1997-03-17
CPC分类号： G11B5/7325 , G11B5/64 , G11B5/656 , G11B5/72 , Y10S428/90 , Y10T428/24355 , Y10T428/24942
摘要： There is provided a magnetic recording medium comprising a nonmagnetic substrate (10, 20), at least one magnetic layer (30) having an upper surface (30a), and a protection layer (40) made of zirconia and having an upper surface (40a). The upper surface (30a) has a surface roughness of 3 nm or smaller defined by maximum height (R.sub.max) while the upper surface (40a) has a surface roughness ranging from 5 nm to 60 nm. When a distance Zi indicates a degree of irregularities of the upper surface (40a) of the protection layer (40), a standard deviation of the heights Zi is 5.7 nm or smaller.
摘要翻译： 提供了一种磁记录介质，其包括非磁性基板（10,20），至少一个具有上表面（30a）的磁性层（30）和由氧化锆制成并具有上表面（40a）的保护层（40） ）。 上表面（30a）具有由最大高度（Rmax）限定的3nm或更小的表面粗糙度，而上表面（40a）具有5nm至60nm的表面粗糙度。 当距离Zi表示保护层（40）的上表面（40a）的不规则度时，高度Zi的标准偏差为5.7nm以下。
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公开(公告)号：US5919560A
公开(公告)日：1999-07-06
申请号：US493268
申请日：1995-06-21
申请人： Ken-ichi Nishimori
发明人： Ken-ichi Nishimori
CPC分类号： G11B5/725 , G11B5/8408 , Y10S428/90 , Y10T428/261 , Y10T428/3154
摘要： In a magnetic recording medium including a nonmagnetic substrate on which a magnetic layer, a protection film, and a lubricant film are successively tacked, the lubricant film is formed by quantitatively controlling an amount of a lubricant in consideration of a surface coverage ratio of the lubricant film relative to the protection film and an average thickness of the lubricant film. Preferably, the surface coverage ratio is selected between 0.55 and 0.985 while the average thickness is not smaller than 0.4 time an attenuation length of a photoelectron which is emitted from a predetermined element and which is attenuated in the lubricant film. To this end, an X-ray photoelectron spectroscopy is used to evaluate the lubricant film.
摘要翻译： 在包括磁性层，保护膜和润滑剂膜的非磁性基板的磁记录介质中，润滑剂膜是通过考虑润滑剂的表面覆盖率定量地控制润滑剂的量而形成的 膜相对于保护膜和润滑剂膜的平均厚度。 优选地，表面覆盖率选择在0.55和0.985之间，而平均厚度不小于从预定元素发射并且在润滑膜中衰减的光电子的衰减长度的0.4倍。 为此，使用X射线光电子能谱来评价润滑剂膜。
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