Magnetic recording medium and method of manufacturing the same
    2.
    发明授权
    Magnetic recording medium and method of manufacturing the same 失效
    磁记录介质及其制造方法

    公开(公告)号:US5968679A

    公开(公告)日:1999-10-19

    申请号:US758015

    申请日:1996-11-27

    IPC分类号: G11B5/64 G11B5/66 G11B5/73

    摘要: In a magnetic recording medium having an underlying film of a body-centered-cubic (bcc) CrV-based alloy and a magnetic film of a hexagonal close-packed (hcp) CoPtCr-based alloy deposited on the underlying film, a difference between a crystal lattice plane distance d.sub.(002) of (002) planes in the hcp alloy of the magnetic film and another crystal lattice plane distance d.sub.(110) of (110) planes in the bcc alloy of the nonmagnetic film is given by subtracting d.sub.(110) from d.sub.(002) and falls within a range between 0.002 and 0.032 angstrom. Preferably, the difference d.sub.(002) -d.sub.(110) is present between 0.014 and 0.030 angstrom only a single pair of the underlying film and the magnetic film may be included in the magnetic recording medium or plural pairs of the underlying film and the magnetic film may be included in the magnetic recording medium.

    摘要翻译: 在具有体心立方(bcc)CrV基合金的基底膜和沉积在基底膜上的六方密堆积(hcp)CoPtCr基合金的磁性膜的磁记录介质中, 磁性薄膜的hcp合金中的(002)面的晶格平面距离d(002)和非磁性膜的bcc合金中的(110)面的另一个晶格面距离d(110)给出是减去d( 110),并且落在0.002和0.032埃之间的范围内。 优选地,差d(002)-d(110)仅存在于0.014和0.030埃之间,只有一对下面的膜,并且磁膜可以包括在磁记录介质中或多对下面的膜和磁性 膜可以包括在磁记录介质中。

    Magnetic recording media and methods for producing the same
    3.
    发明授权
    Magnetic recording media and methods for producing the same 失效
    磁记录介质及其制造方法

    公开(公告)号:US5824427A

    公开(公告)日:1998-10-20

    申请号:US673754

    申请日:1996-06-27

    CPC分类号: G11B5/7325 G11B5/656

    摘要: A magnetic recording medium comprising a non-magnetic underlayer and a CoPt magnetic layer provided on a substrate in this order wherein the non-magnetic underlayer comprises one or more non-magnetic layers, one of the non-magnetic layers which is in contact with the CoPt magnetic layer consists mainly of Cr and Mo, and difference (d.sub.(002) -d.sub.(110)) obtained by subtracting a crystalline lattice spacing of bcc (110) faces in the non-magnetic layer consisting mainly of Cr and Mo from a crystalline lattice spacing of hcp (002) faces in the magnetic layer falls within a range of from 0.002 to 0.032 .ANG., which shows a high magnetic coercive force and square ratio and a low medium noise, and a method for producing the magnetic recording medium mentioned above wherein at least the non-magnetic layer consisting mainly of Cr and Mo and the CoPt magnetic layer are formed by a sputtering technique using a substrate heating temperature within a range of 250.degree. to 425.degree. C. and an Ar gas pressure within a range of 0.5 to 10 mTorr.

    摘要翻译: 一种包括非磁性底层和设置在基板上的CoPt磁性层的磁记录介质,其中非磁性底层包括一个或多个非磁性层,与非磁性层接触的非磁性层之一 CoPt磁性层主要由Cr和Mo组成,并且通过从主要由Cr和Mo组成的非磁性层中减去bcc(110)面的晶格间距而得到的差(d(002)-d(110)) 磁性层中的hcp(002)面的晶格间距在0.002〜0.032的范围内,具有高的矫顽力和平方比以及低的中等噪音,以及提供的磁记录介质的制造方法 其中至少主要由Cr和Mo组成的非磁性层和CoPt磁性层通过使用基板加热温度在250°至425℃范围内的溅射技术形成,并且Ar气体压制 在0.5至10 mTorr的范围内。

    Magnetic recording medium
    4.
    发明授权
    Magnetic recording medium 失效
    磁记录介质

    公开(公告)号:US5939170A

    公开(公告)日:1999-08-17

    申请号:US819129

    申请日:1997-03-17

    IPC分类号: G11B5/64 G11B5/72 G11B5/73

    摘要: There is provided a magnetic recording medium comprising a nonmagnetic substrate (10, 20), at least one magnetic layer (30) having an upper surface (30a), and a protection layer (40) made of zirconia and having an upper surface (40a). The upper surface (30a) has a surface roughness of 3 nm or smaller defined by maximum height (R.sub.max) while the upper surface (40a) has a surface roughness ranging from 5 nm to 60 nm. When a distance Zi indicates a degree of irregularities of the upper surface (40a) of the protection layer (40), a standard deviation of the heights Zi is 5.7 nm or smaller.

    摘要翻译: 提供了一种磁记录介质,其包括非磁性基板(10,20),至少一个具有上表面(30a)的磁性层(30)和由氧化锆制成并具有上表面(40a)的保护层(40) )。 上表面(30a)具有由最大高度(Rmax)限定的3nm或更小的表面粗糙度,而上表面(40a)具有5nm至60nm的表面粗糙度。 当距离Zi表示保护层(40)的上表面(40a)的不规则度时,高度Zi的标准偏差为5.7nm以下。