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公开(公告)号:US20190011899A1
公开(公告)日:2019-01-10
申请号:US15977086
申请日:2018-05-11
发明人: Mandar Vartak , Sanjay K. Dave
IPC分类号: G05B19/409
摘要: A method includes obtaining parameter values for multiple process variables associated with at least one industrial process, where the parameter values for each process variable include low and high limits and a current value. The method also includes presenting a graphical display that includes radial lines each associated with a different one of the process variables, a first graphical indicator passing through the radial lines and identifying the low limits of the process variables, a second graphical indicator passing through the radial lines and identifying the high limits of the process variables, and third graphical indicators identifying the current values of the process variables along the radial lines.
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公开(公告)号:US10761496B2
公开(公告)日:2020-09-01
申请号:US15973272
申请日:2018-05-07
发明人: Andrew John Trenchard , Sanjay K. Dave , Christopher J. Webb , Michael Niemiec , Mandar Vartak , Sriram Hallihole
IPC分类号: G05B19/4063 , G05B13/04 , G05B19/406 , G05B19/418 , G05B23/02
摘要: A method includes obtaining data identifying values of one or more controlled variables associated with an industrial process controller. The method also includes identifying periods when at least one of the one or more controlled variables has been moved to an associated limit by the controller. The method further includes, for each identified period, (i) identifying a standard deviation of predicted values for the associated controlled variable and (ii) determining a control giveaway value for the associated controlled variable based on the standard deviation. The control giveaway value is associated with an offset between the associated controlled variable's average value and the associated limit. In addition, the method includes identifying variances in the one or more controlled variables using the control giveaway values and generating a graphical display identifying one or more impacts or causes for at least some of the variances.
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公开(公告)号:US10678194B2
公开(公告)日:2020-06-09
申请号:US15972534
申请日:2018-05-07
发明人: Sanjay K. Dave , Andrew John Trenchard , Christopher J. Webb , Matthew G. Grizzle , Mandar Vartak , Sriram Hallihole
IPC分类号: G05B13/04 , G05B19/4063 , G05B19/406 , G05B19/418 , G05B23/02
摘要: A method includes obtaining data associated with operation of a model-based industrial process controller. The method also includes identifying at least one estimated impact of at least one operational problem of the industrial process controller, where each estimated impact is expressed in terms of a lost opportunity associated with operation of the industrial process controller. The method further includes presenting the at least one estimated impact to a user. The at least one estimated impact could include impacts associated with noise or variance in process variables used by the industrial process controller, misconfiguration of an optimizer in the industrial process controller, one or more limits on one or more process variables, a quality of at least one model used by the industrial process controller, a quality of one or more inferred properties used by the industrial process controller, or one or more process variables being dropped from use by the industrial process controller.
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公开(公告)号:US10235447B2
公开(公告)日:2019-03-19
申请号:US14814296
申请日:2015-07-30
发明人: Ranganathan Srinivasan , Mandar Vartak , Ravi Kumar Ramamurthy , Navaneeth Vengallur , Andrew John Trenchard
IPC分类号: G06F17/30
摘要: A method implemented using a server includes receiving, from a first application, a tag associated with an equipment, the tag indicating an event. The method also includes retrieving, from at least a second application, at least one of an action or context information linked to the event based on the tag. The method further includes transmitting the tag indicating the event and the action linked to event. In addition, the method includes displaying, on a plant graphic, a location of the event using the tag and the action linked to the event.
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公开(公告)号:US11507036B2
公开(公告)日:2022-11-22
申请号:US16879243
申请日:2020-05-20
发明人: Sanjay K. Dave , Andrew Trenchard , Christopher J. Webb , Matthew G. Grizzle , Mandar Vartak , Sriram Hallihole
IPC分类号: G05B19/418 , G05B13/04 , G05B19/4063 , G05B19/406 , G05B23/02
摘要: A method includes obtaining data associated with operation of a model-based industrial process controller. The method also includes identifying at least one estimated impact of at least one operational problem of the industrial process controller, where each estimated impact is expressed in terms of a lost opportunity associated with operation of the industrial process controller. The method further includes presenting the at least one estimated impact to a user. The at least one estimated impact could include impacts associated with noise or variance in process variables used by the industrial process controller, misconfiguration of an optimizer in the industrial process controller, one or more limits on one or more process variables, a quality of at least one model used by the industrial process controller, a quality of one or more inferred properties used by the industrial process controller, or one or more process variables being dropped from use by the industrial process controller.
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公开(公告)号:US20200348629A1
公开(公告)日:2020-11-05
申请号:US16879243
申请日:2020-05-20
发明人: Sanjay K. Dave , Andrew Trenchard , Christopher J. Webb , Matthew G. Grizzle , Mandar Vartak , Sriram Hallihole
IPC分类号: G05B13/04 , G05B19/4063 , G05B19/406 , G05B19/418 , G05B23/02
摘要: A method includes obtaining data associated with operation of a model-based industrial process controller. The method also includes identifying at least one estimated impact of at least one operational problem of the industrial process controller, where each estimated impact is expressed in terms of a lost opportunity associated with operation of the industrial process controller. The method further includes presenting the at least one estimated impact to a user. The at least one estimated impact could include impacts associated with noise or variance in process variables used by the industrial process controller, misconfiguration of an optimizer in the industrial process controller, one or more limits on one or more process variables, a quality of at least one model used by the industrial process controller, a quality of one or more inferred properties used by the industrial process controller, or one or more process variables being dropped from use by the industrial process controller.
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公开(公告)号:US20200293007A1
公开(公告)日:2020-09-17
申请号:US16888633
申请日:2020-05-29
发明人: Mandar Vartak , Andrew Trenchard , Matthew G. Grizzle , Christopher J. Webb , Sanjay K. Dave , Sriram Hallihole
IPC分类号: G05B13/04 , G05B19/4063 , G05B19/406 , G05B19/418 , G05B23/02
摘要: A method includes obtaining data associated with operation of an industrial process controller and identifying impacts of operational problems of the industrial process controller. The method also includes generating a graphical display for a user, where the graphical display presents one or more recommended actions to reduce or eliminate at least one of the impacts of at least one of the operational problems. The method further includes triggering at least one of the one or more recommended actions based on input from the user. The method could also include executing one or more analytic algorithms to process the obtained data and identify the operational problems of the industrial process controller. Each of the one or more analytic algorithms could be instantiated as a container, and multiple containers could be instantiated and executed as needed. Results of executing the one or more analytic algorithms could be transformed into a standard format.
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公开(公告)号:US20180356811A1
公开(公告)日:2018-12-13
申请号:US15972432
申请日:2018-05-07
发明人: Andrew John Trenchard , Christopher J. Webb , Sanjay K. Dave , Michael Niemiec , Mandar Vartak , Sriram Hallihole
IPC分类号: G05B23/02
CPC分类号: G05B13/041 , G05B19/406 , G05B2219/37001
摘要: A method includes obtaining data identifying values of one or more process variables associated with an industrial process controller and identifying one or more constraint violations using the data. The method also includes, for each identified constraint violation, analyzing a behavior of the controller, a behavior of an industrial process being controlled, and how the controller was being used by at least one operator for a period of time. At least part of the period of time is prior to the identified constraint violation. The method further includes generating a graphical display based on the analysis, where the graphical display identifies one or more probable causes for at least one of the one or more constraint violations.
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公开(公告)号:US20180356790A1
公开(公告)日:2018-12-13
申请号:US15972535
申请日:2018-05-07
发明人: Mandar Vartak , Andrew John Trenchard , Matthew G. Grizzle , Christopher J. Webb , Sanjay K. Dave , Michael Niemiec , Sriram Hallihole
IPC分类号: G05B19/406
CPC分类号: G05B13/041 , G05B19/406 , G05B19/4063 , G05B19/41885 , G05B23/0272 , G05B2219/23292 , G05B2219/31359 , G05B2219/37001
摘要: A method includes obtaining data associated with operation of an industrial process controller and identifying impacts of operational problems of the industrial process controller. The method also includes generating a graphical display for a user, where the graphical display presents one or more recommended actions to reduce or eliminate at least one of the impacts of at least one of the operational problems. The method further includes triggering at least one of the one or more recommended actions based on input from the user. The method could also include executing one or more analytic algorithms to process the obtained data and identify the operational problems of the industrial process controller. Each of the one or more analytic algorithms could be instantiated as a container, and multiple containers could be instantiated and executed as needed. Results of executing the one or more analytic algorithms could be transformed into a standard format.
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公开(公告)号:US11740596B2
公开(公告)日:2023-08-29
申请号:US17212697
申请日:2021-03-25
发明人: Mandar Vartak , Christopher J. Webb , Michael Niemiec , Sriram Hallihole , Andrew John Trenchart , Sanjay Dave , Matthew G. Grizzle
IPC分类号: G05B13/00 , G05B13/04 , G06Q10/0635
CPC分类号: G05B13/042 , G05B13/00 , G05B13/048 , G06Q10/0635
摘要: A field device, method, and non-transitory computer readable medium provide for cost of lost opportunity to operators in real-time using an advance process control. The field device includes a memory and a processor operably connected to the memory. The processor receives current values and average values for controlled variables and manipulated variables; determines costs of lost opportunity for each of controlled variable variance issues, limit issues, model quality issues, inferential quality issues, and variable model issues based on the current values and the average values of the controlled variables; and stores the costs of lost opportunity for the field device.
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