公开(公告)号：US06603690B1

公开(公告)日：2003-08-05

申请号：US10091663

申请日：2002-03-06

申请人： Howard Hao Chen ,  Louis Lu-Chen Hsu ,  Li-Kong Wang

发明人： Howard Hao Chen ,  Louis Lu-Chen Hsu ,  Li-Kong Wang

IPC分类号： G11C700

CPC分类号： G11C29/802

摘要： A static column redundancy scheme for a semiconductor memory such as an eDRAM. By utilizing the existing scan registers for SRAM array testing, the column redundancy information of each bank or each microcell of the memory chip can be scanned, stored and programmed during the power-on period. Two programming methods are disclosed to find the column redundancy information on the fly. In the first method, the column redundancy information is first stored in the SRAM, and is then written into the program registers of the corresponding bank or microcell location. In the second method, the column redundancy information is loaded directly into the program registers of a bank or microcell location according to the bank address information without loading the SRAM. Since the new static column redundancy scheme does not need to compare the incoming addresses, it eliminates the use of control and decoding circuits, which significantly reduces the power consumption for memory macros.

摘要翻译： 用于诸如eDRAM的半导体存储器的静态列冗余方案。 通过利用现有的扫描寄存器进行SRAM阵列测试，可以在上电期间扫描，存储和编程存储器芯片的每个存储体或每个微单元的列冗余信息。 公开了两种编程方法来即时查找列冗余信息。 在第一种方法中，列冗余信息首先存储在SRAM中，然后被写入对应的存储体或微小区位置的程序寄存器中。 在第二种方法中，列冗余信息根据存储体地址信息被直接加载到存储体或微小区位置的程序寄存器中而不加载SRAM。 由于新的静态列冗余方案不需要比较输入地址，因此无需使用控制和解码电路，这显着降低了存储宏的功耗。

公开(公告)号：US06504777B1

公开(公告)日：2003-01-07

申请号：US09924661

申请日：2001-08-08

申请人： Louis Lu-Chen Hsu ,  Li-Kong Wang

发明人： Louis Lu-Chen Hsu ,  Li-Kong Wang

IPC分类号： G11C700

CPC分类号： G11C7/12 ,  G11C11/4094

摘要： In a high density dynamic memory circuit, the sense amplifiers are shared by several bitlines in order to maintain a high density and low power design. However, the bitline equalization level drifts after several cycles of operation, caused by an unbalanced capacitance resulting from a size difference of n-FET and p-FET latches in the sense amplifiers. An extra compensating capacitance Ce is added to the NCS node to adjust the loading capacitance to eliminate the bitline drifting.

摘要翻译： 在高密度动态存储器电路中，读出放大器由几个位线共享，以保持高密度和低功率设计。 然而，由于读出放大器中的n-FET和p-FET锁存器的大小差异导致的不平衡电容引起了几个周期的操作之后，位线均衡电平漂移。 一个额外的补偿电容Ce被添加到NCS节点以调整负载电容以消除位线漂移。

公开(公告)号：US06823293B2

公开(公告)日：2004-11-23

申请号：US10334312

申请日：2002-12-31

申请人： Howard H. Chen ,  Louis Lu-Chen Hsu ,  Brian L. Ji ,  Li-Kong Wang

发明人： Howard H. Chen ,  Louis Lu-Chen Hsu ,  Brian L. Ji ,  Li-Kong Wang

IPC分类号： G06F1500

CPC分类号： G01R31/3004 ,  G01R31/31721

摘要： A hierarchical power supply noise monitoring device and system for very large scale integrated circuits. The noise-monitoring device is fabricated on-chip to measure the noise on the chip. The noise-monitoring system includes a plurality of on-chip noise-monitoring devices distributed strategically across the chip. A noise-analysis algorithm analyzes the noise characteristics from the noise data collected from the noise-monitoring devices, and a hierarchical noise-monitoring system maps the noise of each core to the system on chip.

摘要翻译： 一种用于大规模集成电路的分层电源噪声监测装置和系统。 噪声监测装置是片上制造的，以测量芯片上的噪声。 噪声监测系统包括跨芯片战略性分布的多个片上噪声监测装置。 噪声分析算法从噪声监测装置收集的噪声数据中分析噪声特性，分层噪声监测系统将每个核心的噪声映射到片上系统。

公开(公告)号：US06426903B1

公开(公告)日：2002-07-30

申请号：US09923721

申请日：2001-08-07

申请人： Lawrence A. Clevenger ,  Louis Lu-Chen Hsu ,  Li-Kong Wang ,  Keith Kwong-Hon Wong

发明人： Lawrence A. Clevenger ,  Louis Lu-Chen Hsu ,  Li-Kong Wang ,  Keith Kwong-Hon Wong

IPC分类号： G11C700

CPC分类号： G11C29/80 ,  Y10S977/888 ,  Y10S977/943

摘要： A static redundancy arrangement for a circuit using a focused ion beam anti-fuse methodology which reduces the circuit layout area and the switching activity compared to a prior art dynamic redundancy scheme, resulting in less power, a simpler design and higher speed. Focused ion beam anti-fuse methodology is used to program redundancy for circuits, particularly wide I/O embedded DRAM macros. An anti-fuse array circuit is comprised of a plurality of anti-fuse programming elements, each of which comprises a latch circuit controlled by a set input signal, and an anti-fuse device which is programmed by a focused ion beam.

摘要翻译： 使用聚焦离子束反熔丝方法的电路的静态冗余布置，与现有技术的动态冗余方案相比，其减小了电路布局面积和开关活动，导致较少的功率，更简单的设计和更高的速度。 聚焦离子束反熔丝方法用于编程电路冗余，特别是宽I / O嵌入式DRAM宏。 反熔丝阵列电路由多个反熔丝编程元件组成，每个反熔丝编程元件包括由设定的输入信号控制的锁存电路和由聚焦离子束编程的反熔丝器件。

公开(公告)号：US06529402B1

公开(公告)日：2003-03-04

申请号：US10094533

申请日：2002-03-08

申请人： John E. Andersen ,  Louis Lu-Chen Hsu ,  Li-Kong Wang

发明人： John E. Andersen ,  Louis Lu-Chen Hsu ,  Li-Kong Wang

IPC分类号： G11C1100

CPC分类号： G11C11/417 ,  G11C5/025 ,  G11C8/08

摘要： A stacked block array architecture.for a SRAM memory for low power applications. The architecture turns on only the required data cells and sensing circuitry to access a particular set of data cells of interest. The wordline delay is reduced by using a shorter and wider wordline wire size. Although less power is consumed, the performance is improved by the reduction in loading of wordlines and bitlines.

摘要翻译： 堆叠块阵列架构，用于低功耗应用的SRAM存储器。 该架构仅打开所需的数据单元和感测电路以访问感兴趣的特定数据单元组。 通过使用更短和更宽的字线大小减小字线延迟。 虽然功耗较低，但通过减少字线和位线的负载来提高性能。

公开(公告)号：US06504173B2

公开(公告)日：2003-01-07

申请号：US09757153

申请日：2001-01-09

申请人： Louis Lu-Chen Hsu ,  Li-Kong Wang

发明人： Louis Lu-Chen Hsu ,  Li-Kong Wang

IPC分类号： H01L3300

CPC分类号： H01L29/66772 ,  H01L29/78648

摘要： The present invention is directed to a method of fabricating a dual gate structure for use in FET devices wherein the dual gate structure comprises a bottom gate that is substantially a mirror image of the top gate. The method utilizes a shallow trench isolation process for the purpose of planarization and gate alignment. Also disclosed is a dual gate structure which is fabricated utilizing the method of the present invention.

摘要翻译： 本发明涉及一种制造用于FET器件的双栅极结构的方法，其中双栅结构包括基本上是顶栅的镜像的底栅。 该方法利用浅沟槽隔离工艺，用于平坦化和栅极对准。 还公开了利用本发明的方法制造的双栅结构。

公开(公告)号：US06207530B1

公开(公告)日：2001-03-27

申请号：US09100900

申请日：1998-06-19

申请人： Louis Lu-Chen Hsu ,  Li-Kong Wang

发明人： Louis Lu-Chen Hsu ,  Li-Kong Wang

IPC分类号： H01L2176

CPC分类号： H01L29/66772 ,  H01L29/78648

摘要： The present invention is directed to a method of fabricating a dual gate structure for use in FET devices wherein the dual gate structure comprises a bottom gate that is substantially a mirror image of the top gate. The method utilizes a shallow trench isolation process for the purpose of planarization and gate alignment. Also disclosed is a dual gate structure which is fabricated utilizing the method of the present invention.

摘要翻译： 本发明涉及一种制造用于FET器件的双栅极结构的方法，其中双栅结构包括基本上是顶栅的镜像的底栅。 该方法利用浅沟槽隔离工艺，用于平坦化和栅极对准。 还公开了利用本发明的方法制造的双栅结构。

公开(公告)号：US06781185B2

公开(公告)日：2004-08-24

申请号：US10091193

申请日：2002-03-05

申请人： Howard Hao Chen ,  Louis L. Hsu ,  Li-Kong Wang

发明人： Howard Hao Chen ,  Louis L. Hsu ,  Li-Kong Wang

IPC分类号： H01L27108

CPC分类号： H01L28/91 ,  H01L23/5222 ,  H01L27/0805 ,  H01L28/55 ,  H01L2924/0002 ,  H01L2924/00

摘要： Apparatus and method for providing high dielectric constant decoupling capacitors for semiconductor structures. The high dielectric constant decoupling capacitor can be fabricated by depositing high dielectric constant material between adjacent conductors on the same level, between conductors in successive levels, or both, to thereby provide very large capacitance value without any area or reliability penalty.

摘要翻译： 用于为半导体结构提供高介电常数去耦电容器的装置和方法。 高介电常数去耦电容器可以通过在相同电平上的相邻导体之间，连续电平的导体之间沉积高介电常数材料或两者来制造，从而提供非常大的电容值而没有任何面积或可靠性损失。

公开(公告)号：US07447273B2

公开(公告)日：2008-11-04

申请号：US10708240

申请日：2004-02-18

申请人： Louis L. Hsu ,  Carl Radens ,  Li-Kong Wang

发明人： Louis L. Hsu ,  Carl Radens ,  Li-Kong Wang

IPC分类号： H01L21/82 ,  H01P1/10

CPC分类号： H04L1/22 ,  H04L25/029 ,  H04L25/08

摘要： An integrated circuit is provided having a plurality of data transmitters, including a plurality of default data transmitters for transmitting data from a plurality of data sources and at least one redundancy data transmitter. A plurality of connection elements are provided having a first, low impedance connecting state and having a second, high impedance, disconnecting state. The connection elements are operable to disconnect a failing data transmitter from a corresponding output signal line and to connect the redundancy data transmitter to that output signal line in place of the failing data transmitter. In one preferred form, the connection elements include a fuse and an antifuse. In another form, the connection elements include micro-electromechanical (MEM) switches. The connecting elements preferably present the low impedance connecting state at frequencies which include signal switching frequencies above about 500 MHz.

摘要翻译： 提供了具有多个数据发送器的集成电路，包括用于从多个数据源发送数据的多个默认数据发送器和至少一个冗余数据发送器。 提供了具有第一低阻抗连接状态并且具有第二高阻抗断开状态的多个连接元件。 连接元件可操作以将故障数据发射器与相应的输出信号线断开连接，并将冗余数据发射器连接到该输出信号线来代替故障数据发射器。 在一个优选形式中，连接元件包括保险丝和反熔丝。 在另一种形式中，连接元件包括微机电（MEM）开关。 连接元件优选地在包括高于约500MHz的信号切换频率的频率处呈现低阻抗连接状态。

公开(公告)号：US20080263383A1

公开(公告)日：2008-10-23

申请号：US12163493

申请日：2008-06-27

申请人： Daniel R. Knebel ,  William Robert Reohr ,  Li-Kong Wang

发明人： Daniel R. Knebel ,  William Robert Reohr ,  Li-Kong Wang

IPC分类号： G06F1/04

CPC分类号： G06F11/008

摘要： A number of performance parameters for the electronic system are determined at a particular age of the electronic system. The performance parameters can be correlated to maximum operating frequency of electronic components of the electronic system for the particular age of the electronic system. Operating frequency of the electronic components is adjusted in accordance with the performance parameters. The performance parameters may be predetermined (such as through reliability and burn-in testing), determined during the life of the electronic system, or some combination of these. Performance parameters can comprise prior operating frequencies, hours of operation, ambient temperature, and supply voltage. Performance parameters can comprise performance statistics determined using age-monitoring circuits, where an aged circuit is compared with a circuit enabled only for comparison. Performance statistics may also be determined though error detection circuits. If an error is detected, the operating frequency can be reduced.

摘要翻译： 在电子系统的特定年龄确定电子系统的许多性能参数。 性能参数可以与电子系统的特定年龄的电子系统的电子部件的最大工作频率相关联。 电子元件的工作频率根据性能参数进行调整。 性能参数可以是预定的（例如通过可靠性和老化测试），在电子系统的寿命期间确定，或者这些的一些组合。 性能参数可以包括以前的工作频率，工作时间，环境温度和电源电压。 性能参数可以包括使用年龄监测电路确定的性能统计，其中老化电路与仅用于比较的电路进行比较。 也可以通过错误检测电路来确定性能统计。 如果检测到错误，则可以减少工作频率。