公开(公告)号：US08130908B2

公开(公告)日：2012-03-06

申请号：US12710827

申请日：2010-02-23

申请人： Huapeng Huang ,  Alexei Vershinin

发明人： Huapeng Huang ,  Alexei Vershinin

IPC分类号： G01N23/207

CPC分类号： G01N23/207

摘要： An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.

摘要翻译： 一种用于测量多颗粒样品的晶体取向的x射线衍射装置。 提供了具有聚焦光学元件的x射线激发路径，用于从x射线源收集X射线，并将所收集的x射线重定向成会聚在多晶粒样品的单个晶粒上的x射线束。 至少一个点检测器和样品相对于彼此旋转; 并且基于从装置内的第一和第二晶粒晶面收集的衍射图案获得晶粒取向。