公开(公告)号：US20130150247A1

公开(公告)日：2013-06-13

申请号：US13466037

申请日：2012-05-07

申请人： Jodi Lynn Reeves ,  David M. Gibson ,  Walter M. Gibson ,  Huapeng Huang

发明人： Jodi Lynn Reeves ,  David M. Gibson ,  Walter M. Gibson ,  Huapeng Huang

IPC分类号： H01B12/02

CPC分类号： H01B12/02 ,  C30B23/002 ,  C30B29/22 ,  H01L39/2461

摘要： A method for forming a superconductive article is disclosed. According to one method, a substrate is provided, the substrate having an aspect ratio of not less than about 1×103, forming a buffer layer overlying the substrate, forming a superconductor layer overlying the buffer layer, and characterizing at least one of the substrate, the buffer layer and the superconductor layer by x-ray diffraction. In this regard, x-ray diffraction is carried out such that data are taken at multiple phi angles. Data acquisition at multiple phi angles permits robust characterization of the film or layer subject to characterization, and such data may be utilized for process control and/or quality control. Additional methods for forming superconductive articles, and for characterizing same with XRD are also disclosed.

摘要翻译： 公开了一种形成超导制品的方法。 根据一种方法，提供衬底，所述衬底具有不小于约1×103的纵横比，形成覆盖在衬底上的缓冲层，形成覆盖缓冲层的超导体层，以及表征衬底中的至少一个 ，缓冲层和超导体层通过X射线衍射。 在这方面，进行x射线衍射使得以多个角度拍摄数据。 以多个角度进行的数据采集允许经受表征的胶片或层的强化表征，并且这些数据可用于过程控制和/或质量控制。 还公开了用于形成超导制品并用于用XRD表征其的附加方法。

公开(公告)号：US07236566B2

公开(公告)日：2007-06-26

申请号：US11346699

申请日：2006-02-03

申请人： David M. Gibson ,  Walter M. Gibson ,  Huapeng Huang

发明人： David M. Gibson ,  Walter M. Gibson ,  Huapeng Huang

IPC分类号： G01N23/20 ,  G21K1/06

CPC分类号： G01N23/207 ,  G01N23/20

摘要： An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation—with a collimating optic disposed with respect to the fixed source for producing a substantially parallel beam of x-ray radiation by receiving and redirecting the divergent paths of the divergent x-ray radiation. A first x-ray detector collects radiation diffracted from the sample; wherein the source and detector are fixed, during operation thereof, in position relative to each other and in at least one dimension relative to the sample according to a-priori knowledge about the known characteristic of the sample. A second x-ray detector may be fixed relative to the first x-ray detector according to the a-priori knowledge about the known characteristic of the sample, especially in a phase monitoring embodiment of the present invention.

摘要翻译： 用于测量原位状态的材料的样品的已知特性的x射线衍射技术。 该技术包括使用x射线源发射基本上发散的X射线辐射 - 通过相对于固定源设置的准直光学器件，用于通过接收和重定向发散的发散路径来产生基本上平行的X射线束 x射线辐射。 第一x射线检测器收集从样品衍射的辐射; 其中所述源和检测器在其操作期间相对于彼此处于固定的位置，并且相对于所述样品在至少一个维度中根据关于样品的已知特征的先验知识而被固定。 根据关于样品的已知特征的先验知识，第二X射线检测器可相对于第一x射线检测器固定，特别是在本发明的相位监测实施例中。

公开(公告)号：US20050018809A1

公开(公告)日：2005-01-27

申请号：US10893511

申请日：2004-07-16

申请人： David Gibson ,  Walter Gibson ,  Huapeng Huang ,  Jodi Reeves

发明人： David Gibson ,  Walter Gibson ,  Huapeng Huang ,  Jodi Reeves

IPC分类号： G01N23/207 ,  G01N23/20

CPC分类号： G01N23/207

摘要： An x-ray diffraction measurement apparatus for measuring a sample, having an x-ray source and detector coupled together in a combination for coordinated rotation around the sample, such that x-ray diffraction data can be taken at multiple phi angles. The apparatus may provide a pole figure representation of crystal orientation of the sample, wherein the pole figure represents the crystal alignment, and a full width half maximum value is calculated from the pole figure for crystal alignment quantification. Data may be taken at discrete positions along a length of the sample, and the sample is in a fixed position during measuring; or data may be taken continuously along a length of the article, as the sample continuously moves along its length in a movement path between the source and detector. The sample may be in the form of a tape, linearly passing through a measurement zone.

摘要翻译： 一种用于测量样品的x射线衍射测量装置，其具有以组合的方式耦合在一起的X射线源和检测器，以便围绕样品进行协调旋转，使得可以以多个角度拍摄X射线衍射数据。 该装置可以提供样品的晶体取向的极图表示，其中极图表示晶体对准，并且从用于晶体取向定量的极数计算全宽半最大值。 数据可以沿着样品的长度的离散位置进行，并且样品在测量期间处于固定位置; 或者随着样品在源和检测器之间的运动路径中连续地沿其长度移动，可以沿物品的长度连续地取走数据。 样品可以是带状的，线性地通过测量区域的形式。

公开(公告)号：US20050014653A1

公开(公告)日：2005-01-20

申请号：US10892731

申请日：2004-07-16

申请人： Jodi Reeves ,  David Gibson ,  Walter Gibson ,  Huapeng Huang

发明人： Jodi Reeves ,  David Gibson ,  Walter Gibson ,  Huapeng Huang

IPC分类号： C10F5/00 ,  C30B23/02 ,  C30B29/22 ,  H01L20060101

CPC分类号： H01B12/02 ,  C30B23/002 ,  C30B29/22 ,  H01L39/2461

摘要： A method for forming a superconductive article is disclosed. According to one method, a substrate is provided, the substrate having an aspect ratio of not less than about 1×103, forming a buffer layer overlying the substrate, forming a superconductor layer overlying the buffer layer, and characterizing at least one of the substrate, the buffer layer and the superconductor layer by x-ray diffraction. In this regard, x-ray diffraction is carried out such that data are taken at multiple phi angles. Data acquisition at multiple phi angles permits robust characterization of the film or layer subject to characterization, and such data may be utilized for process control and/or quality control. Additional methods for forming superconductive articles, and for characterizing same with XRD are also disclosed.

摘要翻译： 公开了一种形成超导制品的方法。 根据一种方法，提供衬底，所述衬底具有不小于约1×10 3的纵横比，形成覆盖在衬底上的缓冲层，形成覆盖缓冲层的超导体层，以及表征至少一个 衬底，缓冲层和超导体层通过X射线衍射。 在这方面，进行x射线衍射使得以多个角度拍摄数据。 以多个角度进行的数据采集允许经受表征的胶片或层的强化表征，并且这些数据可用于过程控制和/或质量控制。 还公开了用于形成超导制品并用于用XRD表征其的附加方法。

公开(公告)号：US20110038457A1

公开(公告)日：2011-02-17

申请号：US12710827

申请日：2010-02-23

申请人： Huapeng HUANG ,  Alexei VERSHININ

发明人： Huapeng HUANG ,  Alexei VERSHININ

IPC分类号： G01N23/207

CPC分类号： G01N23/207

摘要： An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.

摘要翻译： 一种用于测量多颗粒样品的晶体取向的x射线衍射装置。 提供了具有聚焦光学元件的x射线激发路径，用于从x射线源收集X射线，并将所收集的x射线重定向成会聚在多晶粒样品的单个晶粒上的x射线束。 至少一个点检测器和样品相对于彼此旋转; 并且基于从装置内的第一和第二晶粒晶面收集的衍射图案获得晶粒取向。

公开(公告)号：US20080159479A1

公开(公告)日：2008-07-03

申请号：US11837119

申请日：2007-08-10

申请人： Huapeng HUANG ,  Walter M. Gibson

发明人： Huapeng HUANG ,  Walter M. Gibson

IPC分类号： G01N23/207

CPC分类号： G01N23/20

摘要： An x-ray diffraction technique (apparatus, method and program products) for measuring crystal structure from a large sample area. The measurements are carried out using a large size collimating optic (up to 25 mm or more in diameter or corresponding cross-section) along with a 2-dimensional x-ray image detector. The unique characteristics of polycapillary collimating optics enable an efficient x-ray diffraction system (either low power or high power) to measure a large portion (or even the whole sample surface area) of the sample to obtain critical crystal structure information, such as the orientation of the whole sample, defects in the crystal, the presence of a secondary crystal, etc. Real-time, visual monitoring of the detected diffraction patterns is also provided. Turbine blade crystal structure measurement examples are disclosed.

摘要翻译： 用于从大样品区域测量晶体结构的x射线衍射技术（设备，方法和程序产品）。 使用大尺寸准直光学元件（直径至多25mm或相应的横截面）以及二维X射线图像检测器进行测量。 多毛细管准直光学器件的独特特征使得能够有效的x射线衍射系统（低功率或高功率）测量样品的大部分（或甚至整个样品表面积）以获得关键的晶体结构信息，例如 整个样品的取向，晶体缺陷，二次晶体的存在等。还提供了对所检测的衍射图案的实时，可视化监测。 公开了涡轮叶片晶体结构测量实例。

公开(公告)号：US20060140343A1

公开(公告)日：2006-06-29

申请号：US11346699

申请日：2006-02-03

申请人： David Gibson ,  Walter Gibson ,  Huapeng Huang

发明人： David Gibson ,  Walter Gibson ,  Huapeng Huang

IPC分类号： G01N23/20

CPC分类号： G01N23/207 ,  G01N23/20

摘要： An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation—with a collimating optic disposed with respect to the fixed source for producing a substantially parallel beam of x-ray radiation by receiving and redirecting the divergent paths of the divergent x-ray radiation. A first x-ray detector collects radiation diffracted from the sample; wherein the source and detector are fixed, during operation thereof, in position relative to each other and in at least one dimension relative to the sample according to a-priori knowledge about the known characteristic of the sample. A second x-ray detector may be fixed relative to the first x-ray detector according to the a-priori knowledge about the known characteristic of the sample, especially in a phase monitoring embodiment of the present invention.

摘要翻译： 用于测量原位状态的材料的样品的已知特性的x射线衍射技术。 该技术包括使用x射线源发射基本上发散的X射线辐射 - 通过相对于固定源设置的准直光学器件，用于通过接收和重定向发散的发散路径来产生基本上平行的X射线束 x射线辐射。 第一x射线检测器收集从样品衍射的辐射; 其中所述源和检测器在其操作期间相对于彼此处于固定的位置，并且相对于所述样品在至少一个维度中根据关于样品的已知特征的先验知识而被固定。 根据关于样品的已知特征的先验知识，第二X射线检测器可相对于第一x射线检测器固定，特别是在本发明的相位监测实施例中。

公开(公告)号：US08647705B2

公开(公告)日：2014-02-11

申请号：US13466037

申请日：2012-05-07

申请人： Jodi Lynn Reeves ,  David M. Gibson ,  Walter M. Gibson ,  Huapeng Huang

发明人： Jodi Lynn Reeves ,  David M. Gibson ,  Walter M. Gibson ,  Huapeng Huang

IPC分类号： B05D5/12

CPC分类号： H01B12/02 ,  C30B23/002 ,  C30B29/22 ,  H01L39/2461

摘要： A method for forming a superconductive article is disclosed. According to one method, a substrate is provided, the substrate having an aspect ratio of not less than about 1×103, forming a buffer layer overlying the substrate, forming a superconductor layer overlying the buffer layer, and characterizing at least one of the substrate, the buffer layer and the superconductor layer by x-ray diffraction. In this regard, x-ray diffraction is carried out such that data are taken at multiple phi angles. Data acquisition at multiple phi angles permits robust characterization of the film or layer subject to characterization, and such data may be utilized for process control and/or quality control. Additional methods for forming superconductive articles, and for characterizing same with XRD are also disclosed.

摘要翻译： 公开了一种形成超导制品的方法。 根据一种方法，提供衬底，所述衬底具有不小于约1×103的纵横比，形成覆盖在衬底上的缓冲层，形成覆盖缓冲层的超导体层，以及表征衬底中的至少一个 ，缓冲层和超导体层通过X射线衍射。 在这方面，进行x射线衍射使得以多个角度拍摄数据。 以多个角度进行的数据采集允许经受表征的胶片或层的强化表征，并且这些数据可用于过程控制和/或质量控制。 还公开了用于形成超导制品并用于用XRD表征其的附加方法。

公开(公告)号：US08130908B2

公开(公告)日：2012-03-06

申请号：US12710827

申请日：2010-02-23

申请人： Huapeng Huang ,  Alexei Vershinin

发明人： Huapeng Huang ,  Alexei Vershinin

IPC分类号： G01N23/207

CPC分类号： G01N23/207

摘要： An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.

摘要翻译： 一种用于测量多颗粒样品的晶体取向的x射线衍射装置。 提供了具有聚焦光学元件的x射线激发路径，用于从x射线源收集X射线，并将所收集的x射线重定向成会聚在多晶粒样品的单个晶粒上的x射线束。 至少一个点检测器和样品相对于彼此旋转; 并且基于从装置内的第一和第二晶粒晶面收集的衍射图案获得晶粒取向。

公开(公告)号：US07711088B2

公开(公告)日：2010-05-04

申请号：US10893511

申请日：2004-07-16

申请人： David M. Gibson ,  Walter M. Gibson ,  Huapeng Huang ,  Jodi Lynn Reeves

发明人： David M. Gibson ,  Walter M. Gibson ,  Huapeng Huang ,  Jodi Lynn Reeves

IPC分类号： G01N23/20 ,  G21K1/06

CPC分类号： G01N23/207

摘要： An x-ray diffraction measurement apparatus for measuring a sample, having an x-ray source and detector coupled together in a combination for coordinated rotation around the sample, such that x-ray diffraction data can be taken at multiple phi angles. The apparatus may provide a pole figure representation of crystal orientation of the sample, wherein the pole figure represents the crystal alignment, and a full width half maximum value is calculated from the pole figure for crystal alignment quantification. Data may be taken at discrete positions along a length of the sample, and the sample is in a fixed position during measuring; or data may be taken continuously along a length of the article, as the sample continuously moves along its length in a movement path between the source and detector. The sample may be in the form of a tape, linearly passing through a measurement zone.

摘要翻译： 一种用于测量样品的x射线衍射测量装置，其具有以组合的方式耦合在一起的X射线源和检测器，以便围绕样品进行协调旋转，使得可以以多个角度拍摄X射线衍射数据。 该装置可以提供样品的晶体取向的极图表示，其中极图表示晶体对准，并且从用于晶体取向定量的极数计算全宽半最大值。 数据可以沿着样品的长度的离散位置进行，并且样品在测量期间处于固定位置; 或者随着样品在源和检测器之间的运动路径中连续地沿其长度移动，可以沿物品的长度连续地取走数据。 样品可以是带状的，线性地通过测量区域的形式。