BIT RECORDING PROCESS ON FERROELECTRIC MEDIUM USING PROBE OR SMALL CONDUCTIVE STRUCTURE AND RECORDING MEDIUM THEREOF
    2.
    发明申请
    BIT RECORDING PROCESS ON FERROELECTRIC MEDIUM USING PROBE OR SMALL CONDUCTIVE STRUCTURE AND RECORDING MEDIUM THEREOF 失效
    使用探头或小导电结构和记录介质对电介质进行位记录处理

    公开(公告)号:US20080180832A1

    公开(公告)日:2008-07-31

    申请号:US11851028

    申请日:2007-09-06

    IPC分类号: G11B21/02

    CPC分类号: G11B9/02

    摘要: A method of recording bits on a ferroelectric medium using a scanning probe or a small conductive structure and a recording medium thereof, in which bit sizes can be decreased to increase data recording density as well as to reduce losses in reproduction signals. The method includes applying switching voltages to a lower electrode of the ferroelectric medium and the probe so as to write bits while approaching the probe to or bringing the probe into contact with a surface of the ferroelectric medium; and applying a base bias voltage, which is equal or smaller in magnitude and opposite in sign to the switching voltages between the switching voltages to make the probe equipotential with an upper portion of the record medium.

    摘要翻译: 使用扫描探针或小导电结构及其记录介质在铁电介质上记录位的方法,其中可以减小比特大小以增加数据记录密度以及减少再现信号中的损失。 该方法包括向铁电介质和探针的下电极施加开关电压,以便在接近探头或使探针与铁电介质的表面接触时写入位; 以及施加基本偏置电压,其大小等于或小于符号相反的开关电压之间的开关电压,以使探针与记录介质的上部等电位。

    FERROELECTRIC MEDIA MANUFACTURING METHOD THEREOF AND INFORMATION STORAGE DEVICE USING THE SAME
    3.
    发明申请
    FERROELECTRIC MEDIA MANUFACTURING METHOD THEREOF AND INFORMATION STORAGE DEVICE USING THE SAME 失效
    其电磁介质制造方法及其使用的信息存储装置

    公开(公告)号:US20080220247A1

    公开(公告)日:2008-09-11

    申请号:US11953096

    申请日:2007-12-10

    IPC分类号: B32B9/04 B05D5/12 B32B17/06

    摘要: A ferroelectric medium, a manufacturing method thereof and an information storage device are disclosed. The manufacturing method includes the steps of: forming an electrode layer on a substrate; forming an insulation layer on the electrode; and forming on the insulation layer a ferroelectric layer. Dielectric breakdown does not occur at a high voltage by forming the insulation layer.

    摘要翻译: 公开了铁电介质,其制造方法和信息存储装置。 该制造方法包括以下步骤:在基板上形成电极层; 在所述电极上形成绝缘层; 以及在所述绝缘层上形成铁电层。 通过形成绝缘层,在高电压下不会发生介电击穿。