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    SEMICONDUCTOR WAFER AND METHOD FOR AUTO-CALIBRATING INTEGRATED CIRCUIT CHIPS AT WAFER LEVEL
    1.
    发明申请
    SEMICONDUCTOR WAFER AND METHOD FOR AUTO-CALIBRATING INTEGRATED CIRCUIT CHIPS AT WAFER LEVEL 审中-公开
    用于自动校准集成电路晶片的半导体晶体管和方法

    公开(公告)号：US20130278305A1

    公开(公告)日：2013-10-24

    申请号：US13605608

    申请日：2012-09-06

    申请人： Hyunseok KIM ,  Su Na Choi ,  Heyung Sub Lee ,  Cheol Sig Pyo

    发明人： Hyunseok KIM ,  Su Na Choi ,  Heyung Sub Lee ,  Cheol Sig Pyo

    IPC分类号： H03L7/00

    CPC分类号： G01R31/2822

    摘要： In integrated circuit chips that are used for RFID, a method of calibrating an operation frequency that is generated in an operation frequency generator and a semiconductor wafer including a calibration circuit are provided. The method of calibrating an operation frequency of integrated circuit chips includes: supplying DC power to the integrated circuit chips; selecting an integrated circuit chip to perform calibration of an operation frequency; receiving an operation frequency that is generated in the selected integrated circuit chip; generating a frequency calibration value by comparing the operation frequency with a calibration target frequency; transmitting a control signal including the frequency calibration value to the integrated circuit chip; and releasing a selection of the integrated circuit chip in which calibration of the operation frequency is complete.

    摘要翻译： 在用于RFID的集成电路芯片中，提供校准在操作频率发生器中产生的操作频率的方法和包括校准电路的半导体晶片。 校准集成电路芯片的工作频率的方法包括：向集成电路芯片提供直流电力; 选择集成电路芯片来执行操作频率的校准; 接收在所选集成电路芯片中产生的工作频率; 通过将操作频率与校准目标频率进行比较来产生频率校准值; 将包括所述频率校准值的控制信号发送到所述集成电路芯片; 并且释放其中操作频率的校准完成的集成电路芯片的选择。

    SEMICONDUCTOR WAFER AND METHOD FOR AUTO-CALIBRATING INTEGRATED CIRCUIT CHIPS USING PLL AT WAFER LEVEL
    2.
    发明申请
    SEMICONDUCTOR WAFER AND METHOD FOR AUTO-CALIBRATING INTEGRATED CIRCUIT CHIPS USING PLL AT WAFER LEVEL 有权
    半导体波形和使用PLL在水平方向自动校准集成电路芯片的方法

    公开(公告)号：US20130278309A1

    公开(公告)日：2013-10-24

    申请号：US13605554

    申请日：2012-09-06

    申请人： Hyunseok KIM ,  Su Na Choi ,  Heyung Sub Lee ,  Cheol Sig Pyo

    发明人： Hyunseok KIM ,  Su Na Choi ,  Heyung Sub Lee ,  Cheol Sig Pyo

    IPC分类号： H03L7/06

    CPC分类号： G06K19/0726 ,  G06K19/0722

    摘要： In integrated circuit chips that are used for RFID, a method of calibrating an operation frequency that is generated in an operation frequency generator and a semiconductor wafer including a calibration circuit are provided. The method of calibrating an operation frequency of integrated circuit chips includes: supplying DC power to the integrated circuit chips; selecting an integrated circuit chip to perform calibration of an operation frequency; receiving an operation frequency that is generated in the selected integrated circuit chip; calculating a difference between a phase of the operation frequency and a phase of a calibration target frequency; generating a frequency calibration value of the operation frequency using the phase difference; transmitting a control signal including the frequency calibration value to the integrated circuit chip; and releasing a selection of the integrated circuit chip in which calibration of the operation frequency is complete.

    摘要翻译： 在用于RFID的集成电路芯片中，提供校准在操作频率发生器中产生的操作频率的方法和包括校准电路的半导体晶片。 校准集成电路芯片的工作频率的方法包括：向集成电路芯片提供直流电力; 选择集成电路芯片来执行操作频率的校准; 接收在所选集成电路芯片中产生的工作频率; 计算操作频率的相位和校准目标频率的相位之间的差; 使用相位差产生运转频率的频率校准值; 将包括所述频率校准值的控制信号发送到所述集成电路芯片; 并且释放其中操作频率的校准完成的集成电路芯片的选择。

    Synchronization method between reader and tag
    3.
    发明授权
    Synchronization method between reader and tag 有权
    阅读器和标签之间的同步方法

    公开(公告)号：US08274374B2

    公开(公告)日：2012-09-25

    申请号：US12265205

    申请日：2008-11-05

    申请人： Hyunseok Kim ,  Su Na Choi ,  Heyung Sub Lee ,  Nak Seon Seong ,  Cheol Sig Pyo ,  Jong-Suk Chae

    发明人： Hyunseok Kim ,  Su Na Choi ,  Heyung Sub Lee ,  Nak Seon Seong ,  Cheol Sig Pyo ,  Jong-Suk Chae

    IPC分类号： H04Q5/22 ,  G08B13/14 ,  G04F1/00

    CPC分类号： G06K7/0008

    摘要： Disclosed is a synchronization method between a reader and tag according to an example embodiment, the method including: transmitting, by the reader, a first write command message to the tag at a first time; detecting, by the tag, the first write command message from the reader at a second time and transmitting a first response message to the reader in response to the first write message; transmitting, by the reader, a second write command message including first time information of the first time to the tag; and correcting, by the tag, a clock offset using a difference between the first time and the second time.

    摘要翻译： 公开了根据示例实施例的读取器和标签之间的同步方法，所述方法包括：由读取器在第一时间向标签发送第一写入命令消息; 通过标签在第二时间从读取器检测第一写入命令消息，并响应于第一写入消息向读取器发送第一响应消息; 由读取器发送包含第一次的第一时间信息到标签的第二写入命令消息; 以及使用所述第一时间和所述第二时间之间的差异，通过所述标签来校正时钟偏移。

    Semiconductor wafer and method for auto-calibrating integrated circuit chips using PLL at wafer level
    4.
    发明授权
    Semiconductor wafer and method for auto-calibrating integrated circuit chips using PLL at wafer level 有权
    半导体晶片和方法，用于在晶片级使用PLL自动校准集成电路芯片

    公开(公告)号：US09030217B2

    公开(公告)日：2015-05-12

    申请号：US13605554

    申请日：2012-09-06

    申请人： Hyunseok Kim ,  Su Na Choi ,  Heyung Sub Lee ,  Cheol Sig Pyo

    发明人： Hyunseok Kim ,  Su Na Choi ,  Heyung Sub Lee ,  Cheol Sig Pyo

    IPC分类号： G06K19/07

    CPC分类号： G06K19/0726 ,  G06K19/0722

    摘要： In integrated circuit chips that are used for RFID, a method of calibrating an operation frequency that is generated in an operation frequency generator and a semiconductor wafer including a calibration circuit are provided. The method of calibrating an operation frequency of integrated circuit chips includes: supplying DC power to the integrated circuit chips; selecting an integrated circuit chip to perform calibration of an operation frequency; receiving an operation frequency that is generated in the selected integrated circuit chip; calculating a difference between a phase of the operation frequency and a phase of a calibration target frequency; generating a frequency calibration value of the operation frequency using the phase difference; transmitting a control signal including the frequency calibration value to the integrated circuit chip; and releasing a selection of the integrated circuit chip in which calibration of the operation frequency is complete.

    摘要翻译： 在用于RFID的集成电路芯片中，提供校准在操作频率发生器中产生的操作频率的方法和包括校准电路的半导体晶片。 校准集成电路芯片的工作频率的方法包括：向集成电路芯片提供直流电力; 选择集成电路芯片来执行操作频率的校准; 接收在所选集成电路芯片中产生的工作频率; 计算操作频率的相位和校准目标频率的相位之间的差; 使用相位差产生运转频率的频率校准值; 将包括所述频率校准值的控制信号发送到所述集成电路芯片; 并且释放其中操作频率的校准完成的集成电路芯片的选择。

    LOW-POWERED RFID TAG AND METHOD OF EXPANDING LIFECYCLE OF RFID TAG
    10.
    发明申请
    LOW-POWERED RFID TAG AND METHOD OF EXPANDING LIFECYCLE OF RFID TAG 审中-公开
    低功率RFID标签和扩展RFID标签生物的方法

    公开(公告)号：US20080136603A1

    公开(公告)日：2008-06-12

    申请号：US11875493

    申请日：2007-10-19

    申请人： Su Na Choi ,  Hae Won Son ,  JunHo Yeo ,  Jae Young Jung ,  Jong Hyun Seo ,  Gil Young Choi ,  Cheol Sig Pyo ,  Jong Suk Chae

    发明人： Su Na Choi ,  Hae Won Son ,  JunHo Yeo ,  Jae Young Jung ,  Jong Hyun Seo ,  Gil Young Choi ,  Cheol Sig Pyo ,  Jong Suk Chae

    IPC分类号： H04B7/00

    CPC分类号： G06K19/0723 ,  H04W52/0229 ,  Y02D70/166

    摘要： A battery-powered RFID tag capable of reducing power consumption and a method of waking up the RFID tag are provided. The battery-powered RFID tag has an activated mode where a general command is detected by decoding a signal received from an RFID tag reader and the general command is executed and a standby mode where the general command is not detected. If a voltage of a continuous wave detected from the signal is equal to or higher than a predetermined voltage or if a wake-up command is detected from the signal, the state of the RFID tag is changed from the standby mode to the activated mode. In addition, the RFID tag is driven by a higher one between the voltage of the continuous wave and a voltage of a built-in battery.

    摘要翻译： 提供了能够降低功耗的电池供电的RFID标签和唤醒RFID标签的方法。 电池供电的RFID标签具有激活模式，其中通过对从RFID标签读取器接收的信号进行解码来检测通用命令，并且执行通用命令以及未检测到通用命令的待机模式。 如果从信号检测到的连续波的电压等于或高于预定电压，或者如果从该信号检测到唤醒命令，则RFID标签的状态从待机模式改变为激活模式。 此外，RFID标签由连续波的电压和内置电池的电压之间的较高驱动。