公开(公告)号：US11789063B2

公开(公告)日：2023-10-17

申请号：US17488353

申请日：2021-09-29

申请人： IBIDEN CO., LTD.

发明人： Takayuki Mori ,  Taishi Takeda

IPC分类号： G01R31/27 ,  G01R31/28 ,  G01R1/02 ,  G01R1/04 ,  G01R1/067 ,  G01R1/073 ,  G01R1/20

CPC分类号： G01R31/2808 ,  G01R1/0416

摘要： A conduction inspection jig includes a first member having first openings, a second member having second openings and formed to be positioned above the first member, a third member formed to be positioned between the first member and the second member such that the third member forms a space between the first member and the second member and at least substantially surrounds the space, and a probe formed to pass through one of the first openings and one of the second openings such that the probe extends through the space formed between the first member and the second member.