Abstract:
Placement of coded indicia as etched lines in the kerf area of a semiconductor wafer. Scanning and image rotation are used to read out the indicia, which may be binary or frequency coded. Placement of the etched lines at a different angle from the circuit lines allows illumination of the etched lines with minimum interference from the circuit lines.
Abstract:
Vacuum coating apparatus having isolatable coating and vacuum chambers whose volumes are correlated to each other to minimize contamination and pump-down time, with the coating chamber having a closure means mounting a substrate holder for positioning substrates in an evaporant stream from a vapor source contained in the vacuum chamber.
Abstract:
A coating apparatus, such as for vacuum deposition, in which an access port, of a deposition chamber, is provided with a hatch door having mounted on its inner surface workpiece supports adapted for turning on two mutually perpendicular axii within a stream of coating material. Included is a modification in which a plurality of supports are concentrically orbited about a third axis with the coating stream.