Abstract:
An H-configured integration circuit includes a pair of squelch transistors forming two legs of the H with a pair of integrating switch transistors forming the other two legs. A pair of capacitors having a common terminal to a reference potential form the crossbar in the H. Rapid integration and differentially balanced squelching is provided for both capacitors. A phase shift measuring circuit shares the squelch reference with the integration circuit such that any variation in the reference on the integrator also adjusts the phase shift measuring circuit. Such circuit differentially compares the integrated values from the integrators with a reference derived from the squelch for indicating phase shift of the input integrated signal with respect to a timing reference.
Abstract:
Alternately cycled integrators alternately and successively drive first and second demodulator output circuits to supply data signals to first and second detecting latches, respectively, to convert received periodic digital signals to detected timed data signals. For high-frequency operation, the alternately cycled integrators are squelched in successive alternate time periods after a short predetermined squelch delay. The delay enables reliable sampling of the integrated signal amplitudes.
Abstract:
Alternately cycled integrators alternately and successively drive first and second demodulator output circuits to supply data signals to first and second detecting latches, respectively, to convert received periodic digital signals to detected timed data signals. For high-frequency operation, the alternately cycled integrators are squelched in successive alternate time periods after a short predetermined squelch delay. The delay enables reliable sampling of the integrated signal amplitudes. A common data output circuit converts the detected timed data signals to NRZI, NRZ, or other suitable synchronized signal formats. Phase errors are also detected.