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公开(公告)号：US20190132541A1
公开(公告)日：2019-05-02
申请号：US16094165
申请日：2017-04-06
Applicant: IMEC VZW
Inventor： Jonathan BORREMANS , Nicolaas TACK , Maarten ROSMEULEN , Paul GOETSCHALCKX , Piet De Moor
CPC classification number: H04N5/37206 , H04N5/347 , H04N5/378
Abstract: An imaging sensor is disclosed, comprising: a set of at least two charge-coupled device, CCD, sub-arrays, wherein each sub-array comprises pixels arranged in columns and rows, and each pixel being arranged to accumulate an electric charge proportional to an intensity of light incident on the pixel; a time delay and integration, TDI, clocking circuitry for controlling and timing transfer of accumulated electric charges between rows of pixels in a column direction in order to integrate the accumulated electric charges in each column of pixels; wherein each CCD sub-array further comprises a readout row for converting the integrated electric charge of each column of pixels into voltage or current, wherein the readout row comprises transistors enabling readout of the signal by the readout block; and a readout block which is arranged to receive input from selected readout rows and convert the input into digital domain or convert the input to a combined representation of pixel values based on the set of CCD sub-arrays.
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公开(公告)号：US10742916B2
公开(公告)日：2020-08-11
申请号：US16094165
申请日：2017-04-06
Applicant: IMEC VZW
Inventor： Jonathan Borremans , Nicolaas Tack , Maarten Rosmeulen , Paul Goetschalckx , Piet De Moor
Abstract: An imaging sensor is disclosed, comprising: a set of at least two charge-coupled device, CCD, sub-arrays, wherein each sub-array comprises pixels arranged in columns and rows, and each pixel being arranged to accumulate an electric charge proportional to an intensity of light incident on the pixel; a time delay and integration, TDI, clocking circuitry for controlling and timing transfer of accumulated electric charges between rows of pixels in a column direction in order to integrate the accumulated electric charges in each column of pixels; wherein each CCD sub-array further comprises a readout row for converting the integrated electric charge of each column of pixels into voltage or current, wherein the readout row comprises transistors enabling readout of the signal by the readout block; and a readout block which is arranged to receive input from selected readout rows and convert the input into digital domain or convert the input to a combined representation of pixel values based on the set of CCD sub-arrays.
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公开(公告)号：US11012628B2
公开(公告)日：2021-05-18
申请号：US16677184
申请日：2019-11-07
Applicant: IMEC VZW
Inventor： Maarten Rosmeulen , Pierre Boulenc , Piet De Moor
Abstract: A device for time delay and integration imaging comprises: an array of pixels being arranged in rows and columns extending in a first and second direction, respectively. Pixels may accumulate generated charges in response to received electro-magnetic radiation along each column. The rows comprise at least one lateral charge shifting row to selectively shift accumulated charges in a column to an adjacent column and a controller configured to receive at least two angle correction input values. Each angle correction input value is based on a received intensity of electro-magnetic radiation on a measurement line, wherein the at least two angle correction input values are acquired by measurement lines extending in directions defining different angles in relation to the second direction, wherein the controller is configured to, based on the received at least two angle correction input values, control activation of the at least one lateral charge shifting row.
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