公开(公告)号：US20160313370A1

公开(公告)日：2016-10-27

申请号：US14655684

申请日：2014-07-28

Applicant: INTEL CORPORATION

Inventor： James Neeb ,  Vineet Pancholi ,  Gerard McSweeney ,  Shelby Rollins ,  Chris Johnson ,  Nathan Blackwell ,  Bradly L. Inman ,  Steven Lill ,  Rodney J. Christner ,  Phillip Barnes

IPC: G01R1/02 ,  G01R31/28 ,  G01R29/26

CPC classification number: G01R1/025 ,  G01R29/26 ,  G01R31/2896 ,  G01R31/31907

Abstract: A method is described that includes configuring multiple test units of a semiconductor device tester with respective information indicating respective storage space within either or both of an off load processing unit and central control unit of the tester. The method further includes streaming DUT data from the test units to their respective storage space within at least one of the off load processing unit and the central control unit such that the test units continually initiate the sending of their respective DUT data to their respective storage space.

Abstract translation: 描述了一种方法，其包括配置半导体器件测试器的多个测试单元，其各自的信息指示测试仪的卸载处理单元和中央控制单元中的任一个或两者中的相应存储空间。 该方法还包括将DUT数据从测试单元传送到其关闭负载处理单元和中央控制单元中的至少一个中的相应存储空间，使得测试单元连续地开始将它们各自的DUT数据发送到它们各自的存储空间 。