公开(公告)号：US12188979B2

公开(公告)日：2025-01-07

申请号：US18326717

申请日：2023-05-31

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Benjamin Neil Trombley ,  Chung-Lung K. Shum ,  Karl Evan Smock Anderson ,  Bodo Hoppe ,  Erica Stuecheli ,  Shiri Moran ,  Patrick James Meaney ,  Arvind Haran ,  Douglas Balazich

IPC: G01R31/317 ,  G01R31/3181 ,  G01R31/3185

Abstract: Error protection analysis of an integrated circuit includes receiving a design model for the integrated circuit, and a list of error checkers associated with the design model. The design model is traversed from each of the error checkers to group storage cells of the design model into checking groups. The design model is updated to include, for each checking group, a unique group identifier associated with each of the storage cells in the checking group.

公开(公告)号：US11481534B2

公开(公告)日：2022-10-25

申请号：US16295734

申请日：2019-03-07

Applicant: International Business Machines Corporation

Inventor： Flavio M. De Paula ,  Bradley D. Bingham ,  Arvind Haran

IPC: G06F9/44 ,  G06F30/33

Abstract: A method, computer program product, and a computer system are disclosed for providing a trace abstraction framework to compute trace-based functional coverage models that in one or more embodiments receive a set of traces; rewrite a trace of the set of traces into a second trace; abstract the second trace; rewrite the abstracted second trace; and generate an abstract trace representative the trace of the set of traces.

公开(公告)号：US20200285712A1

公开(公告)日：2020-09-10

申请号：US16295734

申请日：2019-03-07

Applicant: International Business Machines Corporation

Inventor： Flavio M. De Paula ,  Bradley D. Bingham ,  Arvind Haran

IPC: G06F17/50

Abstract: A method, computer program product, and a computer system are disclosed for providing a trace abstraction framework to compute trace-based functional coverage models that in one or more embodiments receive a set of traces; rewrite a trace of the set of traces into a second trace; abstract the second trace; rewrite the abstracted second trace; and generate an abstract trace representative the trace of the set of traces.