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公开(公告)号:US20230189534A1
公开(公告)日:2023-06-15
申请号:US17644098
申请日:2021-12-14
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: ASHIM DUTTA , MICHAEL RIZZOLO , JON SLAUGHTER , CHIH-CHAO YANG , THEODORUS E. STANDAERT
CPC classification number: H01L27/222 , H01L43/12 , H01L43/02
Abstract: An MRAM device is provided. The MRAM device includes a first dielectric cap layer formed on an underlying layer, a second dielectric cap layer formed on the first dielectric cap layer, the first dielectric cap layer including a lower-κ material than that of the second dielectric cap layer. The MRAM device also includes a bottom electrode contact (BEC) formed through the first dielectric cap layer and the second dielectric cap layer, an MRAM stack formed on the BEC, and wherein the second dielectric cap layer surrounds an upper portion of the BEC.