RFID tag and method receiving RFID tag signal
    1.
    发明授权
    RFID tag and method receiving RFID tag signal 有权
    RFID标签和方法接收RFID标签信号

    公开(公告)号:US08659394B2

    公开(公告)日:2014-02-25

    申请号:US13093254

    申请日:2011-04-25

    IPC分类号: H04Q5/22 H04L5/12 H03D3/02

    CPC分类号: G06K19/07771 H04Q2213/095

    摘要: Provided are a Radio Frequency IDentification (RFID) tag with a signal reception method. The RFID tag includes a demodulator that receives a read signal containing read data. The demodulator includes; a voltage generating circuit that provides a first voltage signal and a second voltage signal derived from the received read signal, an inverter that provides a data pulse signal indicative of the read data by inverting the second voltage signal using an inverting voltage defined in relation to the first voltage signal, and a buffer that recovers the read data by buffering the data pulse signal.

    摘要翻译: 提供了具有信号接收方法的射频识别(RFID)标签。 RFID标签包括接收包含读取数据的读取信号的解调器。 解调器包括: 电压产生电路,其提供从所接收的读取信号导出的第一电压信号和第二电压信号;反相器,其通过使用相对于所述读取信号定义的反相电压来反转所述第二电压信号来提供指示所述读取数据的数据脉冲信号 第一电压信号和通过缓冲数据脉冲信号来恢复读取数据的缓冲器。

    Method of forming T-shaped isolation layer, method of forming elevated salicide source/drain region using the same, and semiconductor device having T-shaped isolation layer
    2.
    发明授权
    Method of forming T-shaped isolation layer, method of forming elevated salicide source/drain region using the same, and semiconductor device having T-shaped isolation layer 有权
    形成T型隔离层的方法,使用其形成升高的自对准硅源/漏区的方法,以及具有T形隔离层的半导体器件

    公开(公告)号:US06383877B1

    公开(公告)日:2002-05-07

    申请号:US09573268

    申请日:2000-05-18

    IPC分类号: H01L21425

    摘要: A method of forming a T-shaped isolation layer, a method of forming an elevated salicide source/drain region using the same, and a semiconductor device having the T-shaped isolation layer are provided. In the method of forming the T-shaped isolation layer, an isolation layer having a narrow trench region in the lower portion thereof and a wide trench region in the upper portion thereof is formed on a semiconductor substrate. Also, in the method of forming the elevated salicide source/drain region, the method of forming the T-shaped isolation layer is used. In particular, conductive impurities can also be implanted into the lower portion of the wide trench region which constitutes the head of the T-shaped isolation layer and is extended to both sides from the upper end of the narrow trench region by controlling the depth of the wide trench region in an ion implantation step for forming the source/drain region.

    摘要翻译: 提供形成T形隔离层的方法,使用该方法形成提高的自对准硅化物源极/漏极区域的方法以及具有T形隔离层的半导体器件。 在形成T形隔离层的方法中,在半导体衬底上形成在其下部具有窄沟槽区和其上部宽沟槽区的隔离层。 此外,在形成升高的自对准硅化物源极/漏极区域的方法中,使用形成T形隔离层的方法。 特别地,也可以将导电杂质注入构成T形隔离层的头部的宽沟槽区域的下部,并且通过控制该窄沟槽区域的深度而从窄沟槽区域的上端延伸到两侧 在用于形成源极/漏极区域的离子注入步骤中形成宽沟槽区域。