公开(公告)号：US11476858B2

公开(公告)日：2022-10-18

申请号：US17221166

申请日：2021-04-02

Applicant: Imec vzw

Inventor： Ewout Martens ,  Davide Dermit ,  Jan Craninckx

IPC: H03M1/06 ,  H03M1/10 ,  H03M1/46

Abstract: An successive approximation register analog-to-digital converter is provided. The successive approximation register analog-to-digital converter includes a digital-to-analog converter, a successive approximation register, a comparator, and a threshold voltage determining unit. In this context, the threshold voltage determining unit is configured to dynamically determine the threshold voltage of the comparator on the basis of the input signal of the digital-to-analog converter or the output signal of the comparator.

公开(公告)号：US20230275593A1

公开(公告)日：2023-08-31

申请号：US18019308

申请日：2021-07-13

Applicant: Sony Semiconductor Solutions Corporation ,  IMEC VZW

Inventor： Keigo Bunsen ,  Ewout Martens ,  Davide Dermit ,  Jan Craninckx

IPC: H03M1/06

CPC classification number: H03M1/0604

Abstract: There is provided an analog-to-digital converter circuit including: a first converter circuit generating a first digital code by performing analog-to-digital conversion on the basis of an input voltage; a second converter circuit generating a second digital code by performing, on the basis of the input voltage and the first digital code, analog-to-digital conversion over a voltage range wider than that. of a least significant. bit of the first converter circuit; an error detector detecting a conversion error of the analog-to-digital conversion on the basis of the first and second digital codes, thereby generating error data indicating a bit having a conversion error and the kind of the conversion error; and a calibration circuit estimating an error factor on the basis of the first and second digital codes and the error data, and performing calibration of a circuit relevant to the estimated error factor on the basis of an estimation result.

公开(公告)号：US12301242B2

公开(公告)日：2025-05-13

申请号：US18019308

申请日：2021-07-13

Applicant: Sony Semiconductor Solutions Corporation ,  IMEC VZW

Inventor： Keigo Bunsen ,  Ewout Martens ,  Davide Dermit ,  Jan Craninckx

IPC: H03M1/14 ,  H03M1/06

Abstract: There is provided an analog-to-digital converter circuit including: a first converter circuit generating a first digital code by performing analog-to-digital conversion on the basis of an input voltage; a second converter circuit generating a second digital code by performing, on the basis of the input voltage and the first digital code, analog-to-digital conversion over a voltage range wider than that of a least significant bit of the first converter circuit; an error detector detecting a conversion error of the analog-to-digital conversion on the basis of the first and second digital codes, thereby generating error data indicating a bit having a conversion error and the kind of the conversion error; and a calibration circuit estimating an error factor on the basis of the first and second digital codes and the error data, and performing calibration of a circuit relevant to the estimated error factor on the basis of an estimation result.

公开(公告)号：US20210344349A1

公开(公告)日：2021-11-04

申请号：US17221166

申请日：2021-04-02

Applicant: Imec vzw

Inventor： Ewout Martens ,  Davide Dermit ,  Jan Craninckx

IPC: H03M1/06

Abstract: An successive approximation register analog-to-digital converter is provided. The successive approximation register analog-to-digital converter includes a digital-to-analog converter, a successive approximation register, a comparator, and a threshold voltage determining unit. In this context, the threshold voltage determining unit is configured to dynamically determine the threshold voltage of the comparator on the basis of the input signal of the digital-to-analog converter or the output signal of the comparator.