Burn-in testing of circuits
    1.
    发明授权

    公开(公告)号:US10180455B2

    公开(公告)日:2019-01-15

    申请号:US15601716

    申请日:2017-05-22

    Abstract: Circuits and methods are provided for a signal path between circuit parts. During normal operation, a delay is deactivated. During a burn-in test, the delay is activated. In the deactivated state, a delay component may be disconnected from a supply voltage.

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