公开(公告)号：US20160329972A1

公开(公告)日：2016-11-10

申请号：US15145485

申请日：2016-05-03

Applicant: Infineon Technologies AG

Inventor： Karl DOMINIZI ,  Oliver Frank ,  Herbert Jaeger ,  Herbert Knapp ,  Hao Li ,  Florian Starzer ,  Rainer Stuhlberger ,  Jonas Wursthorn

IPC: H04B17/00 ,  H04B17/11 ,  H04B17/21

CPC classification number: H04B17/0085 ,  H04B17/102 ,  H04B17/11 ,  H04B17/18 ,  H04B17/21

Abstract: One exemplary embodiment of the present invention relates to a circuit that includes at least one RF signal path for an RF signal and at least one power sensor, which is coupled to the RF signal path and configured to generate a sensor signal representing the power of the RF signal during normal operation of the circuit. The circuit further includes a circuit node for receiving an RF test signal during calibration operation of the circuit. The circuit node is coupled to the at least one power sensor, so that the at least one power sensor receives the RF test signal additionally or alternatively to the RF signal and generates the sensor signal as representing the power of the RF test signal.

Abstract translation: 本发明的一个示例性实施例涉及一种电路，其包括用于RF信号的至少一个RF信号路径和至少一个功率传感器，其耦合到RF信号路径并被配置为产生代表 RF信号在电路正常工作期间。 电路还包括用于在电路的校准操作期间接收RF测试信号的电路节点。 所述电路节点耦合到所述至少一个功率传感器，使得所述至少一个功率传感器另外或替代于所述RF信号接收所述RF测试信号，并且生成所述传感器信号以表示所述RF测试信号的功率。

公开(公告)号：US20190068295A1

公开(公告)日：2019-02-28

申请号：US16174867

申请日：2018-10-30

Applicant: Infineon Technologies AG

Inventor： Karl DOMINIZI ,  Oliver FRANK ,  Herbert JAEGER ,  Herbert KNAPP ,  Hao LI ,  Florian STARZER ,  Rainer STUHLBERGER ,  Jonas WURSTHORN

IPC: H04B17/00 ,  H04B17/21 ,  H04B17/18 ,  H04B17/11 ,  H04B17/10

Abstract: One exemplary embodiment of the present invention relates to a circuit that includes at least one RF signal path for an RF signal and at least one power sensor, which is coupled to the RF signal path and configured to generate a sensor signal representing the power of the RF signal during normal operation of the circuit. The circuit further includes a circuit node for receiving an RF test signal during calibration operation of the circuit. The circuit node is coupled to the at least one power sensor, so that the at least one power sensor receives the RF test signal additionally or alternatively to the RF signal and generates the sensor signal as representing the power of the RF test signal.