-
公开(公告)号:US20240347539A1
公开(公告)日:2024-10-17
申请号:US18752147
申请日:2024-06-24
Applicant: Intel Corporation
Inventor: Tahir GHANI , Mohit K. HARAN , Mohammad HASAN , Biswajeet GUHA , Alison V. DAVIS , Leonard P. GULER
IPC: H01L27/092 , H01L29/06 , H01L29/66 , H01L29/78
CPC classification number: H01L27/0924 , H01L29/0649 , H01L29/66795 , H01L29/785
Abstract: Integrated circuit structures having cut metal gates, and methods of fabricating integrated circuit structures having cut metal gates, are described. For example, an integrated circuit structure includes a fin having a portion protruding above a shallow trench isolation (STI) structure. A gate dielectric material layer is over the protruding portion of the fin and over the STI structure. A conductive gate layer is over the gate dielectric material layer. A conductive gate fill material is over the conductive gate layer. A dielectric gate plug is laterally spaced apart from the fin, the dielectric gate plug on but not through the STI structure. The gate dielectric material layer and the conductive gate layer are not along sides of the dielectric gate plug, and the conductive gate fill material is in contact with the sides of the dielectric gate plug.
-
公开(公告)号:US20220392898A1
公开(公告)日:2022-12-08
申请号:US17340429
申请日:2021-06-07
Applicant: Intel Corporation
Inventor: Tahir GHANI , Mohit K. HARAN , Mohammad HASAN , Biswajeet GUHA , Alison V. DAVIS , Leonard P. GULER
IPC: H01L27/092 , H01L29/78 , H01L29/06 , H01L29/66
Abstract: Integrated circuit structures having cut metal gates, and methods of fabricating integrated circuit structures having cut metal gates, are described. For example, an integrated circuit structure includes a fin having a portion protruding above a shallow trench isolation (STI) structure. A gate dielectric material layer is over the protruding portion of the fin and over the STI structure. A conductive gate layer is over the gate dielectric material layer. A conductive gate fill material is over the conductive gate layer. A dielectric gate plug is laterally spaced apart from the fin, the dielectric gate plug on but not through the STI structure. The gate dielectric material layer and the conductive gate layer are not along sides of the dielectric gate plug, and the conductive gate fill material is in contact with the sides of the dielectric gate plug.
-