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公开(公告)号:US11315843B2
公开(公告)日:2022-04-26
申请号:US16472837
申请日:2016-12-28
Applicant: Intel Corporation
Inventor: Yi Elyn Xu , Bilal Khalaf , Dennis Sean Carr
IPC: H01L23/48 , H01L23/13 , H01L21/48 , H01L23/498 , H01L25/16
Abstract: Various embodiments disclosed relate to a substrate for a semiconductor device. The substrate includes a first major surface and a second major surface opposite the first major surface. The substrate further includes a cavity defined by a portion of the first major surface. The cavity includes a bottom dielectric surface and a plurality of sidewalls extending from the bottom surface to the first major surface. A first portion of a first sidewall includes a conductive material.
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公开(公告)号:US20220223487A1
公开(公告)日:2022-07-14
申请号:US17707094
申请日:2022-03-29
Applicant: Intel Corporation
Inventor: Yi Elyn Xu , Bilal Khalaf , Dennis Sean Carr
IPC: H01L23/13 , H01L21/48 , H01L23/498 , H01L25/16
Abstract: Various embodiments disclosed relate to a substrate for a semiconductor device. The substrate includes a first major surface and a second major surface opposite the first major surface. The substrate further includes a cavity defined by a portion of the first major surface. The cavity includes a bottom dielectric surface and a plurality of sidewalls extending from the bottom surface to the first major surface. A first portion of a first sidewall includes a conductive material.
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公开(公告)号:US11710674B2
公开(公告)日:2023-07-25
申请号:US17707094
申请日:2022-03-29
Applicant: Intel Corporation
Inventor: Yi Elyn Xu , Bilal Khalaf , Dennis Sean Carr
IPC: H01L23/48 , H01L23/13 , H01L21/48 , H01L23/498 , H01L25/16
CPC classification number: H01L23/13 , H01L21/4846 , H01L23/49838 , H01L25/16
Abstract: Various embodiments disclosed relate to a substrate for a semiconductor device. The substrate includes a first major surface and a second major surface opposite the first major surface. The substrate further includes a cavity defined by a portion of the first major surface. The cavity includes a bottom dielectric surface and a plurality of sidewalls extending from the bottom surface to the first major surface. A first portion of a first sidewall includes a conductive material.
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