APPARATUSES AND METHODS FOR INSPECTING EMBEDDED FEATURES

    公开(公告)号:US20230314682A1

    公开(公告)日:2023-10-05

    申请号:US17706654

    申请日:2022-03-29

    CPC classification number: G02B5/3066 G02B5/305 G02B5/208 G02B5/26 G01L1/248

    Abstract: An apparatus includes a light source configured to emit light to a translucent material and an embedded feature disposed in the translucent material, a first linear polarizer configured to linearly polarize the emitted light, based on a first orientation of an optical axis of the first linear polarizer, and a second linear polarizer configured to filter the light that is reflected from the translucent material, from the light that is reflected from the embedded feature and the translucent material, based on a second orientation of an optical axis of the second linear polarizer. The apparatus further includes a sensor configured to receive the light reflected from the embedded feature, from which the light reflected from the translucent material is filtered, and capture an image of the embedded feature and the translucent material, based on the received light.

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