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公开(公告)号:US20180172759A1
公开(公告)日:2018-06-21
申请号:US15385500
申请日:2016-12-20
Applicant: Intel Corporation
Inventor: Lakshminarayana PAPPU , James J. GREALISH
CPC classification number: G01R31/2853 , G01R31/31715 , G11C29/022 , G11C29/025 , G11C29/028 , H03K5/24
Abstract: A method and apparatus for platform component interconnect testing is disclosed. In one embodiment, an integrated circuit comprises: a plurality of interface circuitries, wherein each interface circuitry comprises a driver with adjustable pullup and pulldown resistances and having a driver output to output a driver voltage to a pad during test mode, and a comparator having a first input coupled to the driver output and a second input coupled to a voltage reference, the comparator being operable to generate a comparator output in response to comparing the driver voltage with the voltage reference; and analysis circuitry coupled to receive the comparator output, the analysis circuitry operable, during the test mode, to detect existence of a fault associated with a signal path coupled to the pad for each interface circuitry.
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公开(公告)号:US20180276094A1
公开(公告)日:2018-09-27
申请号:US15468523
申请日:2017-03-24
Applicant: Intel Corporation
Inventor: Lakshminarayana PAPPU , James J. GREALISH
IPC: G06F11/22
CPC classification number: G06F11/2221
Abstract: Embodiments are generally directed to maintaining IO block operation in electronic systems for board testing. An embodiment of a system includes a processor; a power management block for the system; a plurality of IO (input/output) blocks; a read only memory for storage of firmware for the processor. The system is to provide support for a board-level test of the system including testing of one or more IO blocks of the plurality of IO blocks; and the firmware includes elements to stall a reset sequence of the system including the system branching to a mode that maintains power to the one or more IO blocks.
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