PLATFORM COMPONENT INTERCONNECT TESTING
    1.
    发明申请

    公开(公告)号:US20180172759A1

    公开(公告)日:2018-06-21

    申请号:US15385500

    申请日:2016-12-20

    Abstract: A method and apparatus for platform component interconnect testing is disclosed. In one embodiment, an integrated circuit comprises: a plurality of interface circuitries, wherein each interface circuitry comprises a driver with adjustable pullup and pulldown resistances and having a driver output to output a driver voltage to a pad during test mode, and a comparator having a first input coupled to the driver output and a second input coupled to a voltage reference, the comparator being operable to generate a comparator output in response to comparing the driver voltage with the voltage reference; and analysis circuitry coupled to receive the comparator output, the analysis circuitry operable, during the test mode, to detect existence of a fault associated with a signal path coupled to the pad for each interface circuitry.

    MAINTAINING IO BLOCK OPERATION IN ELECTRONIC SYSTEMS FOR BOARD TESTING

    公开(公告)号:US20180276094A1

    公开(公告)日:2018-09-27

    申请号:US15468523

    申请日:2017-03-24

    CPC classification number: G06F11/2221

    Abstract: Embodiments are generally directed to maintaining IO block operation in electronic systems for board testing. An embodiment of a system includes a processor; a power management block for the system; a plurality of IO (input/output) blocks; a read only memory for storage of firmware for the processor. The system is to provide support for a board-level test of the system including testing of one or more IO blocks of the plurality of IO blocks; and the firmware includes elements to stall a reset sequence of the system including the system branching to a mode that maintains power to the one or more IO blocks.

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