公开(公告)号：US20180089984A1

公开(公告)日：2018-03-29

申请号：US15277811

申请日：2016-09-27

申请人： Intel Corporation

发明人： Vijay Krishnan Subramanian ,  Steven A. Klein ,  Pramod Malatkar ,  Rajendra C. Dias ,  Aleksandar Aleksov ,  Jason P. Glumbik ,  Nadine L. Dabby

IPC分类号： G08B21/18 ,  H05K1/02 ,  H05K1/18 ,  G01R31/28

CPC分类号： G01R31/2846 ,  H05K1/0268 ,  H05K1/189 ,  H05K2201/09263 ,  H05K2201/10151

摘要： Techniques and mechanisms for determining a level of degradation of flexible circuitry. In an embodiment, a flexible substrate has disposed therein first circuitry and one or more components coupled thereto, the one or more components to monitor a physical property of the first circuitry. Further disposed in or on the flexible substrate are memory resources to store predefined reference information which corresponds amounts of the physical property each with a different respective level of degradation. Evaluation logic accesses the reference information to determine, based on a detected amount of the physical property, a level of degradation of second circuitry. In another embodiment, the second circuitry is more flexible, as compared to the first circuitry.