公开(公告)号：US20250004878A1

公开(公告)日：2025-01-02

申请号：US18539380

申请日：2023-12-14

Applicant: Intel Corporation

Inventor： Yanxin ZHAO ,  Tao XU ,  Yufu LI ,  Shijie LIU ,  Lei ZHU

IPC: G06F11/10

Abstract: A method and system for error check and scrub (ECS) error data collection and reporting for a memory device. A controller includes circuitry and a buffer. The circuitry may be configured to read ECS error data from a register of a memory device and calculate an ECS error increase rate based on the ECS error data. The circuitry may be configured to inform basic input output system (BIOS) by interrupt if a total number of ECS errors reaches or exceeds an ECS error number threshold or if the ECS error increase rate reaches or exceeds an ECS error rate threshold. The controller may be an out-of-band device, e.g., a baseboard management controller or a memory micro controller.