CONTACTING MODULE HAVING A MOUNTING PLATE FOR CONTACTING OPTOELECTRONIC CHIPS

    公开(公告)号:US20240219461A2

    公开(公告)日:2024-07-04

    申请号:US18041598

    申请日:2021-01-27

    CPC classification number: G01R31/311 G01R31/2887

    Abstract: A contacting module and to a method for assembling a contacting module. The contacting module includes: an optical module which contains an optical block made of glass, which optical block has an arrangement of optical interfaces (Sopt) in an optical interface plane (Eopt); and an electronic module, which has an arrangement of electrical interfaces (Sele) in an electrical interface plane (Eele). The optical module and the electronic module are arranged relative to each other such that the arrangement of optical interfaces (Sopt) and the arrangement of electrical interfaces (Sele) have a defined alignment position relative to each other. The optical module contains a mounting plate which is connected to the electronic module by means of a repeatedly releasable, reproducible connection.

    OPTICAL DEVICE AND METHOD FOR PRODUCING AN OPTICAL DEVICE

    公开(公告)号:US20240361542A1

    公开(公告)日:2024-10-31

    申请号:US18291295

    申请日:2022-07-13

    CPC classification number: G02B6/4214

    Abstract: An optical module for modifying a light beam, wherein the optical module is made of a single-piece solid body material and has a passage surface for receiving the light beam. Furthermore, the optical module comprises a beam deflecting region lying opposite the passage surface for deflecting the light beam, wherein the beam deflecting region is designed as a curved region on the exterior of the optical module, in particular so as to have a hollow mirror function, a pass-through surface for outputting the light beam deflected by the beam deflecting region and a beam shaping region that is designed to shape the light beam and additionally or alternatively thereto the deflected light beam such that the light beam has a beam profile a with homogeneous intensity distribution over a specified range.

    WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS

    公开(公告)号:US20240369624A1

    公开(公告)日:2024-11-07

    申请号:US18287141

    申请日:2022-04-12

    Abstract: A method for testing optoelectronic chips that are arranged on a wafer and comprise electric interfaces in the form of contact pads and optical interfaces, which are arranged in a fixed manner relative to the electric interfaces, in the form of optical deflecting elements, e.g. grating couplers, at a specified coupling angle. In the process, the wafer is adjusted in three adjustment steps in such a manner that one of the chips is positioned relative to a contacting module such that the electric interfaces of the chip and the contacting module are in contact with one another and the optical interfaces of the chip and the contacting module assume a maximum position of the optical coupling.

Patent Agency Ranking