公开(公告)号：US20130016559A1

公开(公告)日：2013-01-17

申请号：US13547435

申请日：2012-07-12

申请人： JONG-UK SONG ,  SOON-BOK JANG ,  YOUNG-WOOK KIM ,  HYUN-JIN KIM

发明人： JONG-UK SONG ,  SOON-BOK JANG ,  YOUNG-WOOK KIM ,  HYUN-JIN KIM

IPC分类号： G11C16/04

CPC分类号： G06F1/3275 ,  G11C7/1057 ,  G11C7/1084 ,  G11C16/0483 ,  G11C2207/105 ,  G11C2207/2227 ,  Y02D10/14

摘要： A NAND flash memory device comprises a NAND flash memory comprising a first pad and a plurality of second pads. The first pad comprises a first receiver configured to receive a first signal. The second pads comprise a plurality of respective second receivers configured to receive a plurality of respective second signals. The second receivers are selectively powered, i.e., turned on or off, according to a logic level of the first signal.

摘要翻译： NAND闪存器件包括NAND闪存，其包括第一焊盘和多个第二焊盘。 第一焊盘包括被配置为接收第一信号的第一接收器。 第二焊盘包括被配置为接收多个相应的第二信号的多个相应的第二接收器。 根据第一信号的逻辑电平，第二接收机被选择性地供电，即接通或断开。

公开(公告)号：US20130094312A1

公开(公告)日：2013-04-18

申请号：US13584849

申请日：2012-08-14

申请人： SOON-BOK JANG ,  JONG-UK SONG ,  YOUNG-WOOK KIM ,  HWA-SEOK OH

发明人： SOON-BOK JANG ,  JONG-UK SONG ,  YOUNG-WOOK KIM ,  HWA-SEOK OH

IPC分类号： G11C7/00 ,  H01L35/00

CPC分类号： G11C29/021 ,  G11C7/04 ,  G11C7/222 ,  G11C29/023 ,  G11C29/028 ,  G11C2029/5002

摘要： A voltage scaling device of a semiconductor memory device, the voltage scaling device including: a delay tester for determining the number of delay cells of a delay locked loop (DLL) required to cumulatively delay a clock signal having a constant frequency, and which is input to the DLL, by one clock period; a temperature sensor for measuring the temperature of the semiconductor memory device; and a voltage regulator for regulating a supply voltage of a voltage source which provides a chip voltage to the semiconductor memory device in response to the temperature measured by the temperature sensor and a locking value corresponding to the number of delay cells calculated by the delay tester.

摘要翻译： 一种半导体存储器件的电压调节装置，所述电压缩放装置包括：延迟测试器，用于确定累积地延迟具有恒定频率的时钟信号所需的延迟锁定环（DLL）的延迟单元数量，并且其被输入 到DLL，一个时钟周期; 温度传感器，用于测量半导体存储器件的温度; 以及电压调节器，用于响应于由温度传感器测量的温度和对应于由延迟测试器计算的延迟单元的数量的锁定值，调节向半导体存储器件提供芯片电压的电压源的电源电压。