公开(公告)号：US20080213078A1

公开(公告)日：2008-09-04

申请号：US12103306

申请日：2008-04-15

申请人： Jae Gyun SHIM ,  Yun Sung NA ,  In Gu JEON ,  Tae Hung KU ,  Dong Hyun YO

发明人： Jae Gyun SHIM ,  Yun Sung NA ,  In Gu JEON ,  Tae Hung KU ,  Dong Hyun YO

IPC分类号： B65G1/133

CPC分类号： G01R31/2893 ,  H05K13/0482

摘要： A pick and place apparatus includes a plurality of device holing elements in a predetermined arrangement; a power supply mechanism for supplying a power for controlling a horizontal pitch between the plurality of device holding elements; a power transmission mechanism for delivering the power from the power supply mechanism to the plurality of device holding elements as a translational force in a horizontal direction; a first linear motion guide mechanism for guiding horizontal movements of some of the plurality of device holding elements; and a second linear motion guide mechanism disposed below the first linear motion guide mechanism, for guiding horizontal movements of the other device holding elements. The plurality of device holding elements are slidably coupled to the first and the second linear motion guide mechanism alternately.

摘要翻译： 拾取和放置装置包括预定布置的多个装置孔元件; 电源机构，用于提供用于控制所述多个设备保持元件之间的水平间距的电力; 动力传递机构，用于将来自供电机构的动力作为水平方向的平移力传递到多个装置保持元件; 用于引导所述多个装置保持元件中的一些的水平移动的第一线性运动引导机构; 以及第二线性运动引导机构，其设置在所述第一线性运动引导机构的下方，用于引导所述另一装置保持元件的水平运动。 多个装置保持元件交替地可滑动地联接到第一和第二直线运动引导机构。

公开(公告)号：US20090153178A1

公开(公告)日：2009-06-18

申请号：US12389469

申请日：2009-02-20

申请人： Jae Gyun SHIM ,  Yun Sung NA ,  In Gu JEON ,  Tae Hung KU ,  Dong Han KIM

发明人： Jae Gyun SHIM ,  Yun Sung NA ,  In Gu JEON ,  Tae Hung KU ,  Dong Han KIM

IPC分类号： G01R31/26 ,  G01R31/02

CPC分类号： G01R31/2893 ,  Y10S414/135 ,  Y10S414/138

摘要： The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.

摘要翻译： 本发明涉及一种用于测试处理器的测试托盘。 根据本发明，公开了一种技术，即装入装载部件中的镶嵌在测试托盘的框架中的矩阵图案的技术允许根据其位置来确定其自由运动的量和方向 加载部件，其中插入物被加载在基体上，从而使匹配板或测试托盘的热膨胀或收缩得以补偿。

公开(公告)号：US20080265874A1

公开(公告)日：2008-10-30

申请号：US12170680

申请日：2008-07-10

申请人： Jae Gyun SHIM ,  Yun Sung NA ,  In Gu JEON ,  Tae Hung KU ,  Dong Han KIM

发明人： Jae Gyun SHIM ,  Yun Sung NA ,  In Gu JEON ,  Tae Hung KU ,  Dong Han KIM

IPC分类号： G01R1/02

CPC分类号： G01R31/2893

摘要： A test handler includes a loading unit for loading semiconductor devices from customer trays onto a test tray; a test chamber for performing a test for the semiconductor devices loaded on the test tray; a pushing unit having at least one pushing member for pushing the test tray located in the test chamber to be tested, and a press unit for operating the pushing member; a position control unit for adjusting a position of the pushing member to compensate a deviation between the pushing member and the test tray due to a thermal expansion or contraction of any one of the pushing member and the test tray; and an unloading unit for unloading the semiconductor devices loaded on the test tray onto the customer trays after a test for the semiconductor devices is completed.

摘要翻译： 测试处理器包括用于将半导体器件从客户托盘加载到测试托盘上的加载单元; 测试室，用于对装载在测试盘上的半导体器件进行测试; 推动单元，具有至少一个用于推动位于待测试的测试室中的测试托盘的推动构件和用于操作推动构件的按压单元; 位置控制单元，用于调节推动构件的位置，以补偿推动构件和测试托盘之间由于推动构件和测试托盘中的任一个的热膨胀或收缩而产生的偏差; 以及卸载单元，用于在半导体器件的测试完成之后，将装载在测试托盘上的半导体器件卸载到客户托盘上。

公开(公告)号：US20080203999A1

公开(公告)日：2008-08-28

申请号：US12035555

申请日：2008-02-22

申请人： Yun Sung NA ,  In Gu JEON ,  Tae Hung KU ,  Dong-Hyun YO ,  Doo-Woo KIM

发明人： Yun Sung NA ,  In Gu JEON ,  Tae Hung KU ,  Dong-Hyun YO ,  Doo-Woo KIM

IPC分类号： G01R1/02

CPC分类号： G01R31/2893

摘要： A test handler is disclosed. First and second gripping blocks for respective front and rear test trays to be transferred along a circulation path move together in a circulation direction, but move independently in a direction perpendicular to the circulation path and grip and release independently. The test trays can be transferred by a single power source and interference between an assisting a test and a transferring can be minimized.

摘要翻译： 公开了一种测试处理程序。 用于沿着循环路径传送的相应的前后测试托盘的第一和第二夹持块沿循环方向一起移动，但是在垂直于循环路径的方向上独立地移动，并且独立地抓握和释放。 测试托盘可以通过单个电源传输，辅助测试和传输之间的干扰可以最小化。

公开(公告)号：US20100316478A1

公开(公告)日：2010-12-16

申请号：US12788200

申请日：2010-05-26

申请人： Yun Sung NA ,  Tae-Hung KU ,  Cheul-Gyu BOO

发明人： Yun Sung NA ,  Tae-Hung KU ,  Cheul-Gyu BOO

IPC分类号： H01L21/673 ,  H01L21/677

CPC分类号： H01L21/6838 ,  G01R31/2893

摘要： A pick-and-place module for test handlers is disclosed that includes a main body and a kit. The main body forms vacuum paths therein and the kit also forms vacuum passages therein. The kit is detachably mounted to the main body in a hook coupling manner. The pick-and-place module can be applied to all customer trays having different loading capabilities when only the kit of the pick-and-place module needs to be replaced, so there is no need to manufacture the entire pick-and-place module and this reduces manufacturing costs. The pick-and-place module can reduce the amount of resources to be replaced and reduce the replacement time since the kit can be easily removed from the main body of the pick-and-place module in a hook manner.

摘要翻译： 公开了一种用于测试处理程序的拾取和放置模块，其包括主体和套件。 主体在其中形成真空路径，套件还在其中形成真空通道。 套件以钩式联接方式可拆卸地安装到主体。 当仅需要更换取样模块的套件时，拾取和放置模块可以应用于具有不同加载能力的所有客户托盘，因此不需要制造整个拾取和放置模块 这降低了制造成本。 拾取和放置模块可以减少更换的资源数量，并减少更换时间，因为套件可以以钩状方式从拾取和放置模块的主体轻松移除。

公开(公告)号：US20090245982A1

公开(公告)日：2009-10-01

申请号：US12407454

申请日：2009-03-19

申请人： Yun Sung NA ,  Tae Hung KU ,  Jung Woo HWANG

发明人： Yun Sung NA ,  Tae Hung KU ,  Jung Woo HWANG

IPC分类号： H01L21/673 ,  H01L21/68

CPC分类号： G01R31/2893

摘要： A unit for opening an insert of a test tray which comprises an accommodating space for accommodating a semiconductor device and a support for supporting the semiconductor device accommodated in the accommodating space, the unit includes a body, a pair of opening devices provided in the body to open the insert, and a positioning guide unit protruding to be inserted into an accommodating space for a semiconductor device when opening the insert and supporting the semiconductor device that is transferred into the accommodating space to be spaced upward apart from a support provided in the accommodating space.

摘要翻译： 一种用于打开测试托盘的插入件的单元，其包括用于容纳半导体器件的容纳空间和用于支撑容纳在容纳空间中的半导体器件的支撑件，该单元包括主体，设置在主体中的一对打开装置 打开插入件，以及定位引导单元，当打开插入件并且支撑转移到容纳空间中的半导体器件与设置在容纳空间中的支撑件向上分开时，突出地插入到用于半导体器件的容纳空间中 。