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    High speed defect detection apparatus having defect detection circuits mounted in the camera housing
    1.
    发明授权
    High speed defect detection apparatus having defect detection circuits mounted in the camera housing 失效
    具有安装在摄像机壳体中的缺陷检测电路的高速缺陷检测装置

    公开(公告)号：US5440648A

    公开(公告)日：1995-08-08

    申请号：US794861

    申请日：1991-11-19

    申请人： James W. Roberts ,  John G. Elias ,  Graham A. Jullien

    发明人： James W. Roberts ,  John G. Elias ,  Graham A. Jullien

    IPC分类号： H04N7/18 ,  G01N21/88 ,  G01N21/89 ,  G06T7/00

    CPC分类号： G06T7/0006 ,  G01N21/8851 ,  G01N21/8903 ,  G06T2207/10021 ,  G06T2207/30124

    摘要： A defect detection system includes a video camera with defect detection circuits for detecting defects in video signals being outputted by corresponding sections of an array sensor such as a TDI CCD two-dimensional array sensor. Each defect detection circuit includes a subtraction circuit for subtracting a prior stored pixel from an incoming pixel to generate a difference. Comparators compare the difference with positive and negative limits defining an acceptable range of difference values. The prior stored pixel is updated to the succeeding pixel only when the difference value is acceptable. Memories store the defect pixels from the respective detection circuits along with X-coordinates and end of line bits. The memories are sequentially read up to their end of line bits, and the defect pixel values along with coordinates expanded to include section indicating bits are transferred from the camera to further processing facilities.

    摘要翻译： 缺陷检测系统包括具有用于检测诸如TDI CCD二维阵列传感器的阵列传感器的相应部分输出的视频信号中的缺陷的缺陷检测电路的摄像机。 每个缺陷检测电路包括用于从输入像素中减去先前存储的像素以产生差值的减法电路。 比较者将差异与定义可接受的差值范围的正和负极限进行比较。 仅当差值可接受时，先前存储的像素被更新为后续像素。 存储器存储来自相应检测电路的缺陷像素以及X坐标和行尾位。 存储器被顺序读取到它们的行末端位置，并且缺陷像素值以及被扩展以包括指示位的部分的位置从相机传送到另外的处理设施。