摘要:
Provided are methods and systems for inspecting surfaces of various components, such as evaluating height deviations on these surfaces. A method involves aggregating inspection data from multiple line scanners into a combined data set. This combined data set represents a portion of the surface that is larger than the field of measurement any one of the scanners. Furthermore, each pair of adjacent scanners operate at different periods of time to avoid interference. Because operating periods are offset, surface portions scanned by the pair of adjacent scanners can overlap without interference. This overlap of the scanned portions ensures that the entire surface is analyzed. The position of scanners relative to the inspection surface may be changed in between the scans and, in some embodiments, even during the scan. This approach allows precise scanning of large surfaces.
摘要:
The invention relates to a device and a method for monitoring and/or inspecting material webs which are moving in the direction of a material web length and/or a material web width, The method comprises the following steps: taking a first picture of a first portion of a material web at a first point in time with a camera which has a matrix chip with a binning function, and taking a second picture of a second portion of the material web at a second point in time with the camera. A first binning step level is used for the first picture here, in each case a first number of pixels of the matrix chip being grouped together using the binning function. A second binning step level is used for the second picture, in each case a second number of pixels of the matrix chip being grouped together using the binning function. The first number of pixels which are in each case grouped together is higher or lower than the second number of pixels which are in each case grouped together, as a result of which a physi
摘要:
The invention relates to a method for measuring a long profile (2), in particular one at an increased temperature, wherein a cross-section of the long profile (2) is determined, wherein the long profile (2) is measured using a light section sensor (4) that is moveably mounted on a swivel device (3). The invention also relates to a device for measuring a long profile (2), in particular one at an increased temperature, comprising a measuring device for determining a cross-section of the long profile (2), wherein a swivel device (3) is provided and the measuring device is formed as a light section sensor (4), wherein the light section sensor (4) is moveably mounted on the swivel device (3). The invention further relates to a use of a device (1) of this type.
摘要:
Provided are an image processing program and an image processing apparatus that support imaging setting in an imaging apparatus. In a focus value display window, temporal change of a focus value (index value) in an input image is outputted. A user operates the imaging apparatus with reference to graph display in the focus value display window to adjust the focus. The focus value displayed in the focus value display window indicates a relatively high value in a “focused” state to a subject such as a work. In the focus value display window, a maximum focus value indicating bar is displayed in association with a focus value indication. The user adjusts the focus state in the imaging apparatus so that the focus value indication “approaches” or “exceeds” this maximum focus value indicating bar as much as possible.
摘要:
A reflection type optical sensor that detect a surface condition of a moving body and that is used for an image generation apparatus which forms images on a recording media includes a light-emitting device which has a plurality of light emitter systems including at least two light-emitting members and a light-emitting optical system having a plurality of light-emitting lenses corresponding to a plurality of the light emitter systems and guiding light emitted from the light emitter systems to the moving body and a light-receiving device which has a light receiver system including at least two light-receiving members and a light-receiving optical system having light-receiving lenses corresponding to the at least two light-receiving members and guiding light reflected by the moving body to the light receiver system. The image generation apparatus has further a surface condition judging device in addition to the reflection type optical sensor.
摘要:
A CMOS optical detector includes a plurality of optical elements for a device for detecting parameters of moving yarn or another linear textile formation on textile machines by means of a perpendicular projection of yarn onto individual optical elements of a sensor with the aid of one source of radiation. The optical elements are arranged in two parallel rows perpendicular to the direction of the movement of the projection of yarn. Each optical element produces an output analog signal corresponding to the intensity of its irradiation. The individual optical elements of the first row are oriented to have their longer sides in the direction of the movement of the projection of yarn, whereas the optical elements of the second row are oriented to have their longer sides perpendicular to the direction of the movement of the projection of yarn.
摘要:
An apparatus for measuring the position and shape of a pattern formed on a sheet includes a sheet on which a pattern is formed, a camera holding mechanism that is disposed perpendicular to a transportation direction of the sheet, at least one camera that is disposed such that the camera is movable in a longitudinal direction of the camera holding mechanism, and an image processing computer that processes an image picked up by the at least one camera. In the measuring apparatus, when calibration is performed, calibration is performed with reference to a picked up image of the coating pattern and a picked up image of a reference body for calibration.
摘要:
Provided are an image processing program and an image processing apparatus that support imaging setting in an imaging apparatus. In a focus value display window, temporal change of a focus value (index value) in an input image is outputted. A user operates the imaging apparatus with reference to graph display in the focus value display window to adjust the focus. The focus value displayed in the focus value display window indicates a relatively high value in a “focused” state to a subject such as a work. In the focus value display window, a maximum focus value indicating bar is displayed in association with a focus value indication. The user adjusts the focus state in the imaging apparatus so that the focus value indication “approaches” or “exceeds” this maximum focus value indicating bar as much as possible.
摘要:
The invention relates to a method and device for detecting flaws in a continuously produced float glass band by checking a glass strip, which extends perpendicularly to the conveying direction and which is observed in transmitted light. The device has the following characteristics: a) the flow of a float glass band is monitored without any gaps by a modularly constructed fastening bridge, scanning sensors fastened to the fastening bridge and two transmission lighting means arranged perpendicular to the glass band, b) each scanning sensor can be oriented by an adjusting apparatus according to the three spatial coordinates in positive and negative directions and can be finely adjusted by a target apparatus that can be pivoted in, in the form of an artificial measurement plane, and c) the lighting means are cooled by a cooling apparatus.
摘要:
A device for inspection of print products (36) produced by a printing machine (10) is provided with a first camera (48) being directed to an inspection field to be checked. At least one further camera (50) is provided being directed at least partially (58) to the same inspection field (54) being checked already by the first camera (48).