DISPLAY DEVICE
    2.
    发明申请
    DISPLAY DEVICE 审中-公开
    显示设备

    公开(公告)号:US20150129875A1

    公开(公告)日:2015-05-14

    申请号:US14603328

    申请日:2015-01-22

    Abstract: In a liquid crystal display device it is desirable to test in the state of TFT substrates, without reducing the number of TFT substrates to be obtained from one mother TFT substrate, and without increasing the overall size of the TFT substrates. Test terminals are formed on the outside of terminals for driving the liquid crystal display device. The test terminals of the specific TFT substrate are formed in another TFT substrate just below the specific TFT substrate. The area in which the test lines are formed is a space in which a sealing material is formed, between the display area and an end of the lower TFT substrate. Thus, the size of the TFT substrates is not actually increased. A test line area is not separately formed and not discarded, so that the number of TFT substrates to be obtained from one mother TFT substrate is not reduced.

    Abstract translation: 在液晶显示装置中,期望在TFT基板的状态下进行测试,而不会减少从一个母TFT基板获得的TFT基板的数量,并且不增加TFT基板的整体尺寸。 测试端子形成在用于驱动液晶显示装置的端子的外侧。 特定TFT基板的测试端子形成在特定TFT基板正下方的另一TFT基板中。 在显示区域和下部TFT基板的一端之间,形成测试线的区域是形成密封材料的空间。 因此,TFT基板的尺寸实际上没有增加。 测试线区域不是单独形成并且不被丢弃,所以从一个母TFT基板获得的TFT基板的数量不会减少。

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