公开(公告)号：US07100087B2

公开(公告)日：2006-08-29

申请号：US10329683

申请日：2002-12-27

申请人： Jen-Tsung Yang ,  Wen-Bin Jian

发明人： Jen-Tsung Yang ,  Wen-Bin Jian

IPC分类号： G06F11/00

CPC分类号： G06F9/4401 ,  G06F11/1417 ,  G06F11/1433

摘要： A BIOS module for automatic restoring and the related method are provided. The BIOS module has a BIOS memory and a prime BIOS code embedded therein. When the contents of a BIOS memory is damaged, a backup BIOS code can be loaded from other storage media for rebooting the computer system. The BIOS code comprises a BIOS function program module having a compressed function program, a detecting means for detecting the correctness of the BIOS function program module, a restoring module responsive to the detecting means for automatic rebooting the computer when the decompressing procedure has errors to load and execute the BIOS backup code from other storing media. And after rebooting the computer system successfully the restoring module also can restore the BIOS backup code into the BIOS memory. Besides, a differentiating means is applied to check the versions of the backup BIOS code and the prime BIOS code. When the prime BIOS code can boot the computer system successfully and the version thereof is latest than that of the backup BIOS code, the prime BIOS code can be backuped to the storage media.

公开(公告)号：US20070262254A1

公开(公告)日：2007-11-15

申请号：US11459359

申请日：2006-07-23

申请人： Cheng-Hsun Nien ,  Chuen-Horng Tsai ,  Kun-Ying Shin ,  Wen-Bin Jian

发明人： Cheng-Hsun Nien ,  Chuen-Horng Tsai ,  Kun-Ying Shin ,  Wen-Bin Jian

IPC分类号： H01J37/26

CPC分类号： G01R31/307 ,  H01J2237/2594

摘要： An electron microscope suitable for observing at least one sample is provided. The sample has at least one testing area, and a material of the sample on the testing area is semiconductive or conductive. The electron microscope includes a stage, an electron gun, and at least one probe. The stage is suitable for carrying the sample and the sample is not electrically grounded. The electron gun is suitable for generating an electron beam and accumulating charges on the sample. When the probe contacts with the testing area, the image contrast of the testing area will change. The current through the probe will also change upon contact. Methods have been provided based on these principles to determine “when” and “where” the probe starts to contact the sample surface inside an electron microscope.

摘要翻译： 提供适用于观察至少一个样品的电子显微镜。 样品具有至少一个测试区域，测试区域上的样品材料是半导体或导电的。 电子显微镜包括载物台，电子枪和至少一个探针。 该阶段适用于携带样品，样品不接地。 电子枪适用于产生电子束并在样品上积累电荷。 当探头与测试区域接触时，测试区域的图像对比度将发生变化。 通过探头的电流也将随接触而改变。 已经基于这些原理提供了用于确定探针在电子显微镜内开始与样品表面接触的“何时”和“在哪里”的方法。

公开(公告)号：US07435954B2

公开(公告)日：2008-10-14

申请号：US11459359

申请日：2006-07-23

申请人： Cheng-Hsun Nien ,  Chuen-Horng Tsai ,  Kun-Ying Shin ,  Wen-Bin Jian

发明人： Cheng-Hsun Nien ,  Chuen-Horng Tsai ,  Kun-Ying Shin ,  Wen-Bin Jian

IPC分类号： H01J37/26 ,  H01J37/20

CPC分类号： G01R31/307 ,  H01J2237/2594

摘要： An electron microscope suitable for observing at least one sample is provided. The sample has at least one testing area, and a material of the sample on the testing area is semiconductive or conductive. The electron microscope includes a stage, an electron gun, and at least one probe. The stage is suitable for carrying the sample and the sample is not electrically grounded. The electron gun is suitable for generating an electron beam and accumulating charges on the sample. When the probe contacts with the testing area, the image contrast of the testing area will change. The current through the probe will also change upon contact. Methods have been provided based on these principles to determine “when” and “where” the probe starts to contact the sample surface inside an electron microscope.

摘要翻译： 提供适用于观察至少一个样品的电子显微镜。 样品具有至少一个测试区域，测试区域上的样品材料是半导体或导电的。 电子显微镜包括载物台，电子枪和至少一个探针。 该阶段适用于携带样品，样品不接地。 电子枪适用于产生电子束并在样品上积累电荷。 当探头与测试区域接触时，测试区域的图像对比度将发生变化。 通过探头的电流也将随接触而改变。 已经基于这些原理提供了用于确定探针在电子显微镜内开始与样品表面接触的“何时”和“在哪里”的方法。