IN SITU OPTICAL DIAGNOSTIC FOR MONITORING OR CONTROL OF SODIUM DIFFUSION IN PHOTOVOLTAICS MANUFACTURING
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    发明申请
    IN SITU OPTICAL DIAGNOSTIC FOR MONITORING OR CONTROL OF SODIUM DIFFUSION IN PHOTOVOLTAICS MANUFACTURING 有权
    用于监测或控制光伏制造中钠扩散的原位光学诊断

    公开(公告)号:US20140093985A1

    公开(公告)日:2014-04-03

    申请号:US14112033

    申请日:2012-02-17

    IPC分类号: H01L21/66 H01L31/18 G01N9/00

    摘要: A method of fabricating a photovoltaic device 100, includes the steps of providing a glass substrate 102, depositing a molybdenum layer 104 on a surface of the glass substrate, directing light through the glass substrate to the near-substrate region of the molybdenum layer 206, detecting an optical property of the near-substrate region of the molybdenum layer after interaction with the incident light 208 and determining a density of the near-substrate region of the molybdenum layer from the detected optical property 210. A molybdenum deposition parameter may be controlled based upon the determined density of the near-substrate region of the molybdenum layer 218. A non-contact method measures a density of the near-substrate region of a molybdenum layer and a deposition chamber 300.

    摘要翻译: 制造光伏器件100的方法包括以下步骤:提供玻璃衬底102,在玻璃衬底的表面上沉积钼层104,将光引导通过玻璃衬底到钼层206的近衬底区域, 在与入射光208相互作用之后检测钼层的近基底区域的光学特性,并根据检测到的光学特性210确定钼层的近底基区域的密度。钼沉积参数可以基于 取决于钼层218的近基底区域的确定密度。非接触方法测量钼层和沉积室300的近基底区域的密度。