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公开(公告)号:US11450799B2
公开(公告)日:2022-09-20
申请号:US16772909
申请日:2018-08-07
发明人: Xiuquan Zhang , Houbin Zhu , Wen Hu , Juting Luo , Hui Hu , Yangyang Li
IPC分类号: H01L41/08 , C30B29/18 , C30B29/30 , H01L41/312 , H01L41/187 , H03H9/17 , H03H9/56
摘要: The invention provides a micron-scale monocrystal film. The micron-scale monocrystal film includes 1) a substrate layer, and 2) a micron-scale monocrystal film layer located on the substrate layer, wherein a transition layer is interposed between the substrate layer and micron-scale monocrystal film layer, and the transition layer may include a first transition layer disposed adjacent to the substrate layer and a second transition layer disposed adjacent to the micron monocrystal film layer, wherein the transition layer may include H and an element from at least one kind of plasma gas used during the plasma bonding of the substrate layer and the micron-scale monocrystal film layer.
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公开(公告)号:US20200313068A1
公开(公告)日:2020-10-01
申请号:US16772909
申请日:2018-08-07
发明人: Xiuquan Zhang , Houbin Zhu , Wen Hu , Juting Luo , Hui Hu , Yangyang Li
IPC分类号: H01L41/08 , H01L41/312 , C30B29/18 , C30B29/30
摘要: The invention provides a micron-scale monocrystal film. The micron-scale monocrystal film includes 1) a substrate layer, and 2) a micron-scale monocrystal film layer located on the substrate layer, wherein a transition layer is interposed between the substrate layer and micron-scale monocrystal film layer, and the transition layer may include a first transition layer disposed adjacent to the substrate layer and a second transition layer disposed adjacent to the micron monocrystal film layer, wherein the transition layer may include H and an element from at least one kind of plasma gas used during the plasma bonding of the substrate layer and the micron-scale monocrystal film layer.
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