Static randon access memory cell
    1.
    发明授权
    Static randon access memory cell 有权
    静态随机存取存储单元

    公开(公告)号:US08183636B2

    公开(公告)日:2012-05-22

    申请号:US13072805

    申请日:2011-03-28

    IPC分类号: H01L21/84 H01L21/8238

    摘要: One or more embodiments relate to a static random access memory cell comprising: a first inverter including a first n-channel pull-down transistor coupled between a first node and a ground voltage; a second inverter including a second n-channel pull-down transistor coupled between a second node and the ground voltage; a first n-channel access transistor coupled between a first bit line and the first node of the first inverter, a fin of the first n-channel access transistor having a lower charge carrier mobility than a fin of the first n-channel pull-down transistor; and a second n-channel access transistor coupled between a second bit line and the second node of the second inverter, a fin of the second n-channel access transistor having a lower charge carrier mobility than a fin of the second n-channel pull-down transistor.

    摘要翻译: 一个或多个实施例涉及静态随机存取存储器单元,包括:第一反相器,包括耦合在第一节点和地电压之间的第一n沟道下拉晶体管; 第二反相器,包括耦合在第二节点和地电压之间的第二n沟道下拉晶体管; 耦合在第一位线和第一反相器的第一节点之间的第一n沟道存取晶体管,第一n沟道存取晶体管的鳍具有比第一n沟道下拉的鳍低的电荷载流子迁移率 晶体管 以及耦合在所述第二反相器的第二位线和所述第二节点之间的第二n沟道存取晶体管,所述第二n沟道存取晶体管的鳍具有比所述第二n沟道下拉沿的鳍更低的电荷载流子迁移率, 下降晶体管。