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公开(公告)号：US09638714B2
公开(公告)日：2017-05-02
申请号：US14328581
申请日：2014-07-10
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
IPC分类号： G01R1/04
CPC分类号： G01R1/0466
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a. In an alternate embodiment, the lower section includes a leg extension 320 and a sliding contact land 360 which slides against an aperture in the housing. A spacer 342 provides space for decoupling components on the load board. The hinge may include a truncated cylinder 40b which is configured to permit remove of the upper pin without removal of the lower.
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公开(公告)号：US11209458B2
公开(公告)日：2021-12-28
申请号：US16939602
申请日：2020-07-27
发明人： John Nelson , Ranauld Perez , Jeffrey Sherry , Michael Andres , David Johnson
摘要： The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.
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公开(公告)号：US10401386B2
公开(公告)日：2019-09-03
申请号：US15249605
申请日：2016-08-29
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a.
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公开(公告)号：US09341649B1
公开(公告)日：2016-05-17
申请号：US14212168
申请日：2014-03-14
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
CPC分类号： G01R1/0466
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability.
摘要翻译： 公开了一种用于在被测器件（DUT）和提供轴向对准的上下接触点的负载板之间提供接触针的结构和方法。 销具有上部（30）和下部（32）部分以及在其间允许上部和下部接触（24/26）的挠曲的铰链（44/46），但是该轴向对准可以直接替代 POGO引脚，但具有更高的可靠性。
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公开(公告)号：US20150015293A1
公开(公告)日：2015-01-15
申请号：US14328581
申请日：2014-07-10
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
IPC分类号： G01R1/04
CPC分类号： G01R1/0466
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a. In an alternate embodiment, the lower section includes a leg extension 320 and a sliding contact land 360 which slides against an aperture in the housing. A spacer 342 provides space for decoupling components on the load board. The hinge may include a truncated cylinder 40b which is configured to permit remove of the upper pin without removal of the lower.
摘要翻译： 公开了一种用于在被测器件（DUT）和提供轴向对准的上下接触点的负载板之间提供接触针的结构和方法。 销具有上部（30）和下部（32）部分，并且铰链之间允许上部和下部接触（24/26）的弯曲，但是轴向对准可以直接替代POGO引脚，但具有更大的 可靠性。 它还包括通过使用改进的铰链244a去除上销230的结构和方法。 在一个替代实施例中，下部包括一个腿部延伸部分320和一个抵靠壳体中的一个孔滑动的滑动接触台面360。 间隔件342提供用于在装载板上去耦组件的空间。 铰链可以包括截头圆筒40b，其被构造成允许去除上销而不移除下销。
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公开(公告)号：US10725069B1
公开(公告)日：2020-07-28
申请号：US16134346
申请日：2018-09-18
发明人： John Nelson , Ranauld Perez , Jeffrey Sherry , Michael Andres , David Johnson
摘要： The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.
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公开(公告)号：US20160370406A1
公开(公告)日：2016-12-22
申请号：US15249605
申请日：2016-08-29
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
CPC分类号： G01R1/0466 , G01R1/045 , G01R1/07307
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a.
摘要翻译： 公开了一种用于在被测器件（DUT）和提供轴向对准的上下接触点的负载板之间提供接触针的结构和方法。 销具有上部（30）和下部（32）部分以及在其间允许上部和下部接触（24/26）的挠曲的铰链（44/46），但是该轴向对准可以直接替代 POGO引脚，但具有更高的可靠性。 它还包括通过使用改进的铰链244a去除上销230的结构和方法。
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公开(公告)号：US09429591B1
公开(公告)日：2016-08-30
申请号：US14229579
申请日：2014-03-28
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
CPC分类号： G01R1/0466 , G01R1/045 , G01R1/07307
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a.
摘要翻译： 公开了一种用于在被测器件（DUT）和提供轴向对准的上下接触点的负载板之间提供接触针的结构和方法。 销具有上部（30）和下部（32）部分以及在其间允许上部和下部接触（24/26）的挠曲的铰链（44/46），但是该轴向对准可以直接替代 POGO引脚，但具有更高的可靠性。 它还包括通过使用改进的铰链244a去除上销230的结构和方法。
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