公开(公告)号：US06219139B1

公开(公告)日：2001-04-17

申请号：US09412254

申请日：1999-10-05

Applicant: Jon R. Lesniak

Inventor： Jon R. Lesniak

IPC: G01J400

CPC classification number: G01L1/241

Abstract: A structural specimen coated with or constructed of photoelastic material, when illuminated with circularly polarized light will, when stressed; reflect or transmit elliptically polarized light, the direction of the axes of the ellipse and variation of the elliptically light from illuminating circular light will correspond to and indicate the direction and magnitude of the shear stresses for each illuminated point on the specimen. The principles of this invention allow for several embodiments of stress analyzing apparatus, ranging from those involving multiple rotating optical elements, to those which require no moving parts at all. A simple polariscope may be constructed having two polarizing filters with a single one-quarter waveplate placed between the polarizing filters. Light is projected through the first polarizing filter and the one-quarter waveplate and is reflected from a sub-fringe birefringent coating on a structure under load. Reflected light from the structure is analyzed with a polarizing filter. The two polarizing filters and the one-quarter waveplate may be rotated together or the analyzer alone may be rotated. Computer analysis of the variation in light intensity yields shear stress magnitude and direction.

Abstract translation: 用光弹性材料涂覆或构造的结构试样，当用圆偏振光照射时，会受到压力; 反射或透射椭圆偏振光，椭圆轴的方向和照明圆形光的椭圆偏振将对应于并指示样品上每个照明点的剪切应力的方向和大小。 本发明的原理允许应力分析装置的几个实施例，从涉及多个旋转光学元件的那些到完全不需要移动部件的那些。 可以构造简单的偏振器，其具有两个偏振滤光器，其中放置有偏振滤光片之间的单个四分之一波片。 光通过第一偏振滤光器和四分之一波片投影，并且在负载下的结构上的副边缘双折射涂层反射。 用偏振滤光片分析来自结构的反射光。 两个偏振滤光器和四分之一波片可以一起旋转，或者单独的分析仪可以旋转。 光强变化的计算机分析产生剪切应力的大小和方向。

公开(公告)号：US06441972B1

公开(公告)日：2002-08-27

申请号：US09592713

申请日：2000-06-13

Applicant: Jon R. Lesniak ,  Eann Alexander Patterson

Inventor： Jon R. Lesniak ,  Eann Alexander Patterson

IPC: G02B2714

CPC classification number: G02B27/106 ,  G02B27/123 ,  G02B27/126

Abstract: An optical assembly divides a single image into a plurality of images which are simultaneously projected onto a single sensor array. The optical assembly is arranged so that each of the plurality of images can be made to pass through a filter of a different type. For example a polarizing filter of a different orientation, or a filter which passes a different spectral band. In this way a single digital camera having a single chip sensor array can simultaneously receive multiple substantially identical images which have been acted on by different filters. This allows data capture from a single frame of a single camera to be used to perform stress analysis, or spectral analysis. This is particularly useful when high speed image capture is desired which contains stress or spectral data, because each frame captured from the sensor array contains multiple images which can be processed to obtain stress or spectral data.

Abstract translation: 光学组件将单个图像划分成同时投影到单个传感器阵列上的多个图像。 光学组件布置成使得可以使多个图像中的每一个通过不同类型的滤光器。 例如，不同取向的偏振滤光器，或通过不同光谱带的滤光片。 以这种方式，具有单个芯片传感器阵列的单个数字照相机可以同时接收已经被不同滤光器作用的多个基本相同的图像。 这允许从单个摄像机的单个帧进行的数据采集用于执行应力分析或光谱分析。 当需要包含应力或光谱数据的高速图像捕捉时，这是特别有用的，因为从传感器阵列捕获的每个帧包含可被处理以获得应力或光谱数据的多个图像。

公开(公告)号：US06788462B2

公开(公告)日：2004-09-07

申请号：US10039218

申请日：2002-01-03

Applicant: Jon R. Lesniak

Inventor： Jon R. Lesniak

IPC: G02B530

CPC classification number: G02B27/28 ,  G02B5/3025

Abstract: Light of multiple wavelengths passes through, in order, a plane polarizer, a ½ wave plate, a means for attenuating polarized light in a selected plane, and a ¼ wave plate. The ¼ wave plate and the ½ wave plate are selected for green light. The ½ wave plate induces an error for nongreen light which is twice the error which the ¼ wave plate would induce for a particular light wavelength but of opposite sign. The errors are reduced by ½ by attenuation by passing all wavelengths of light through glass air interfaces defined by a plurality of glass plates, angled at between about 45 and 55 degrees with respect to the optical axis. Light which is plane polarized for green light, and precorrected for every other wavelength is passed through the ¼ wave plate and all wavelengths are converted to circularly polarized light.

Abstract translation: 多个波长的光顺序通过平面偏振器，1/2波片，用于衰减选定平面中的偏振光的装置和1/4波片。 ¼波片和½波片选用绿光。 ½波片对非绿光产生误差，这是¼波片对于特定的光波长而引起的相反符号的两倍误差。 通过使所有波长的光通过由多个玻璃板限定的玻璃空气界面而相对于光轴在约45度和55度之间成角度，衰减减小了1/2。 对于绿光平行偏振的光，并且对于每隔一个波长进行预校正的光通过1/4波片，所有波长都被转换成圆偏振光。

公开(公告)号：US6055053A

公开(公告)日：2000-04-25

申请号：US867475

申请日：1997-06-02

Applicant: Jon R. Lesniak

Inventor： Jon R. Lesniak

IPC: G01L1/24 ,  G01J4/00 ,  G01B11/18

CPC classification number: G01L1/241

Abstract: A structural specimen coated with or constructed of photoelastic material, when illuminated with circularly polarized light will, when stressed; reflect or transmit elliptically polarized light, the direction of the axes of the ellipse and variation of the elliptically light from illuminating circular light will correspond to and indicate the direction and magnitude of the shear stresses for each illuminated point on the specimen. The principles of this invention allow for several embodiments of stress analyzing apparatus, ranging from those involving multiple rotating optical elements, to those which require no moving parts at all. A simple polariscope may be constructed having two polarizing filters with a single one-quarter waveplate placed between the polarizing filters. Light is projected through the first polarizing filter and the one-quarter waveplate and is reflected from a sub-fringe birefringent coating on a structure under load. Reflected light from the structure is analyzed with a polarizing filter. The two polarizing filters and the one-quarter waveplate may be rotated together or the analyzer alone may be rotated. Computer analysis of the variation in light intensity yields shear stress magnitude and direction.

Abstract translation: 用光弹性材料涂覆或构造的结构试样，当用圆偏振光照射时，会受到压力; 反射或透射椭圆偏振光，椭圆轴的方向和照明圆形光的椭圆偏振将对应于并指示样品上每个照明点的剪切应力的方向和大小。 本发明的原理允许应力分析装置的几个实施例，从涉及多个旋转光学元件的那些到完全不需要移动部件的那些。 可以构造简单的偏振器，其具有两个偏振滤光器，其中放置有偏振滤光片之间的单个四分之一波片。 光通过第一偏振滤光器和四分之一波片投影，并且在负载下的结构上的副边缘双折射涂层反射。 用偏振滤光片分析来自结构的反射光。 两个偏振滤光器和四分之一波片可以一起旋转，或者单独的分析仪可以旋转。 光强变化的计算机分析产生剪切应力的大小和方向。

公开(公告)号：US5719395A

公开(公告)日：1998-02-17

申请号：US713229

申请日：1996-09-12

Applicant: Jon R. Lesniak

Inventor： Jon R. Lesniak

IPC: G01N25/72

CPC classification number: G01N25/72

Abstract: Cracks in bridges or other structures are detected by applying a thermal gradient to the test structure in a selected region so heat flows from left to right. A first image of the thermal gradient with heat flowing from left to right is taken and stored for further processing. Next a thermal gradient is applied so heat flows from right to left through the selected region. A second thermal image is taken and stored of the heat flowing from right to left. An image taken before a thermal gradient is applied is subtracted from the first and second images to remove thermal reflection and non-induced gradients from the stored images. Each differentiated image is then normalized by dividing each pixel of the differentiated image by the total photon flux from the undifferentiated image. The second image is than subtracted from the first image producing a third image which highlights features which produce thermal gradients of opposite signs. Paint chips and paint drips and other variations in surface emissivity which can produce the appearance of a thermal gradient have the same apparent gradient when heat is applied from either side. Thus the technique of utilizing two temperature gradient images where the gradient is applied from opposite sides uniquely highlights real defects.

Abstract translation: 桥梁或其他结构中的裂缝通过在选定的区域中对测试结构施加热梯度来检测，因此热量从左向右流动。 采取从左到右流动的热梯度的第一图像并存储用于进一步处理。 接下来，应用热梯度，使得热量从右向左流过所选择的区域。 拍摄第二个热图像，并存储从右向左流动的热量。 从第一和第二图像中减去在施加热梯度之前拍摄的图像，以从存储的图像中去除热反射和非诱导梯度。 然后通过将差分图像的每个像素除以未分化图像的总光子通量来对每个差分图像进行归一化。 第二个图像不是从第一个图像中减去产生第三个图像，它突出了产生相反符号的热梯度的特征。 当从任一侧施加热量时，可产生热梯度出现的表面发射率的油漆屑和油漆滴落等变化具有相同的表观梯度。 因此，使用两个温度梯度图像的技术，其中从相对侧施加梯度，唯一地突出了真实缺陷。

公开(公告)号：US5582485A

公开(公告)日：1996-12-10

申请号：US351817

申请日：1994-12-08

Applicant: Jon R. Lesniak

Inventor： Jon R. Lesniak

IPC: G01N25/72

CPC classification number: G01N25/72

Abstract: An instrument employs a projector which projects a moving pattern of heat onto a test object. An exemplary pattern is formed of bars or lines of infrared radiation separated by unheated areas, or areas of shadow. An infrared camera which is not sensitive to the wavelength of the projected light is used to detect the heat emitted by the test object. The projected bands of thermal radiation heat the surface of the test object. Some of the energy in the form of heat sinks into the structure, while some of the heat energy flows laterally from the heated band to the unheated bands between the projected bands. The lateral flow of heat between bands is resisted by cracks in the surface. This resistance causes heat energy to build up on one side of each crack. The downward flow of heat energy is resisted by less conductive material such as a debonding between layers which traps the heat, causing it to build up laterally. Thus, flaws caused by cracks normal to the surface and delaminations or cracks parallel to the surface may be detected by the same device.

Abstract translation: 仪器采用投影机，将投影模式的热量投射到测试对象上。 示例性图案由不加热区域或阴影区域分离的红外辐射线或线形成。 使用对投射光的波长不敏感的红外线摄像机来检测被测物体发出的热量。 投射的热辐射带加热被测物体的表面。 一些散热形式的能量沉入结构中，而一些热能从加热带横向流到投射带之间的未加热带。 带之间的横向热流受到表面裂纹的抵抗。 这种阻力使得每个裂纹的一侧积聚热能。 热能的向下流动被较少导电的材料抵抗，例如层间的剥离，这些导电材料会吸收热量，导致其横向积聚。 因此，可以通过相同的装置检测由与表面垂直的裂纹引起的缺陷和与表面平行的分层或裂纹。

公开(公告)号：US06438255B1

公开(公告)日：2002-08-20

申请号：US09549376

申请日：2000-04-14

Applicant: Jon R. Lesniak

Inventor： Jon R. Lesniak

IPC: G06K900

CPC classification number: A63B24/0003 ,  A61B5/1127 ,  A63B22/02 ,  A63B2220/806 ,  A63B2220/807 ,  B21C51/00 ,  B21C51/005

Abstract: Portions of an organism, object, engineering structure, sheet or moving web are selectively heated, and thereby marked with a thermal spot or spots, which are imaged by an infrared camera. The positions of the imaged markings are tracked over time, to thereby extract kinematic and other information about the marked object.

Abstract translation: 有机体，物体，工程结构，片材或移动纤维网的部分被选择性地加热，并且由此用由红外相机成像的热点或斑点标记。 随着时间的推移跟踪成像标记的位置，从而提取关于标记对象的运动学和其他信息。

公开(公告)号：US5376793A

公开(公告)日：1994-12-27

申请号：US122892

申请日：1993-09-15

Applicant: Jon R. Lesniak

Inventor： Jon R. Lesniak

IPC: G01N25/72 ,  G01N21/84 ,  G01N25/00

CPC classification number: G01N25/72

Abstract: An instrument employs a projector which projects a moving pattern of heat onto a test object. An exemplary pattern is formed of bars or lines of infrared radiation separated by unheated areas, or areas of shadow. An infrared camera which is not sensitive to the wave-length of the projected light is used to detect the heat emitted by the test object. The projected bands of thermal radiation heat the surface of the test object. Some of the energy in the form of heat sinks into the structure, while some of the heat energy flows laterally from the heated band to the unheated bands between the projected bands. The lateral flow of heat between bands is resisted by cracks in the surface. This resistance causes heat energy to build up on one side of each crack. The downward flow of heat energy is resisted by less conductive material such as a debonding between layers which traps the heat, causing it to build up laterally. Thus, flaws caused by cracks normal to the surface and delaminations or cracks parallel to the surface may be detected by the same device.

Abstract translation: 仪器采用投影机，将投影模式的热量投射到测试对象上。 示例性图案由不加热区域或阴影区域分离的红外辐射线或线形成。 使用对投射光的波长不敏感的红外线摄像机来检测被测物体发出的热量。 投射的热辐射带加热被测物体的表面。 一些散热形式的能量沉入结构中，而一些热能从加热带横向流到投射带之间的未加热带。 带之间的横向热流受到表面裂纹的抵抗。 这种阻力使得每个裂纹的一侧积聚热能。 热能的向下流动被较少导电的材料抵抗，例如层间的剥离，这些导电材料会吸收热量，导致其横向积聚。 因此，可以通过相同的装置检测由与表面垂直的裂纹引起的缺陷和与表面平行的分层或裂纹。

公开(公告)号：US5201582A

公开(公告)日：1993-04-13

申请号：US884067

申请日：1992-05-15

Applicant: Jon R. Lesniak

Inventor： Jon R. Lesniak

IPC: G01N25/72

CPC classification number: G01N25/72

Abstract: The instrument has a focal plane array of infrared sensors of the integrating type such as a multiplexed device in which a charge is built up on a capacitor which is proportional to the total number of photons which that sensor is exposed to between read-out cycles.The infrared sensors of the array are manufactured as part of an overall array which is part of a micro-electronic device. The sensor achieves greater sensitivity by applying a local offset to the output of each sensor before it is converted into a digital word. The offset which is applied to each sensor will typically be the sensor's average value so that the digital signal which is periodically read from each sensor of the array corresponds to the portion of the signal which is varying in time. With proper synchronization between the cyclical loading of the test object and the frame rate of the infrared array the output of the A/D converted signal will correspond to the stress field induced temperature variations. A digital lock-in operation may be performed on the output of each sensor in the array. This results in a test instrument which can rapidly form a precise image of the thermoelastic stresses in an object.

Abstract translation: 该仪器具有积分型红外传感器的焦平面阵列，例如多路复用装置，其中在电容器上积累电荷，该电容与在该读出周期之间暴露于该传感器的光子总数成比例。 阵列的红外传感器是作为微电子器件的一部分的整体阵列的一部分制造的。 传感器通过在将每个传感器转换为数字字之前对每个传感器的输出施加局部偏移来实现更高的灵敏度。 施加到每个传感器的偏移通常将是传感器的平均值，使得从阵列的每个传感器周期性地读取的数字信号对应于在时间上变化的信号部分。 通过测试对象的周期性加载与红外阵列的帧速率之间的适当同步，A / D转换信号的输出将对应于应力场引起的温度变化。 可以对阵列中的每个传感器的输出执行数字锁定操作。 这导致可以快速形成物体中的热弹性应力的精确图像的测试仪器。