Abstract:
A bank precharge signal generation circuit includes a precharge signal generation unit for generating a second precharge signal including a pulse, which is generated in a period delayed by a predetermined period as compared to a pulse of a first precharge signal, in response to an all-bank precharge signal, and a bank precharge signal generation unit for receiving the first and second precharge signals and generate first and second bank precharge signals for precharging first and second banks.
Abstract:
A cell inferiority test circuit includes a compression data generator configured to compress selected data in response to selection signals and to generate compression data including information about cell inferiority, a strobe signal delayer configured to delay a strobe signal by an amount of time set by a test signal and to generate a delayed strobe signal, and an input/output line driver configured to receive the compression data in sync with the delayed strobe signal and to drive a global input/output line.
Abstract:
A data output control circuit in a semiconductor memory device includes a driving signal generating unit configured to decode first and second I/O mode signals and first and second address level signals in response to a bank active signal and generate driving signals, and a data output multiplexing unit configured to output data signals of global I/O lines as multiplexing signals in response to the driving signals.
Abstract:
A bank precharge signal generation circuit includes a precharge signal generation unit for generating a second precharge signal including a pulse, which is generated in a period delayed by a predetermined period as compared to a pulse of a first precharge signal, in response to an all-bank precharge signal, and a bank precharge signal generation unit for receiving the first and second precharge signals and generate first and second bank precharge signals for precharging first and second banks.
Abstract:
A burst length control circuit capable of performing read and write operations in high speed according to a burst length and a semiconductor memory device using the same includes a clock signal generating unit for generating first and second internal clock signals from a clock signal in response to a first and second burst signals, a control signal generating unit for driving in response to the first and second internal clock signals, wherein the control signal generating unit for generating first and second control signals, enable sections of the first and second control signals being controlled according to the first and second burst signals at a read operation or write operation, and a burst termination signal generating unit for generating a burst termination signal in response to the first and second burst signals. The first control signal is disabled in response to the burst termination signal.
Abstract:
A burst length control circuit capable of performing read and write operations in high speed according to a burst length and a semiconductor memory device using the same includes a clock signal generating unit for generating first and second internal clock signals from a clock signal in response to a first and second burst signals, a control signal generating unit for driving in response to the first and second internal clock signals, wherein the control signal generating unit for generating first and second control signals, enable sections of the first and second control signals being controlled according to the first and second burst signals at a read operation or write operation, and a burst termination signal generating unit for generating a burst termination signal in response to the first and second burst signals. The first control signal is disabled in response to the burst termination signal.
Abstract:
A data output control circuit in a semiconductor memory device includes a driving signal generating unit configured to decode first and second I/O mode signals and first and second address level signals in response to a bank active signal and generate driving signals, and a data output multiplexing unit configured to output data signals of global I/O lines as multiplexing signals in response to the driving signals.
Abstract:
An address control circuit is presented for use in reducing a skew in a write operation mode. The address control circuit includes a read column address control circuit and a write column address control circuit. The read column address control circuit is configured to generate a read column address from an address during a first burst period for a read operation mode. The write column address control circuit is configured to generate a write column address from the address during a second burst period for a write operation mode.
Abstract:
A cell inferiority test circuit includes a compression data generator configured to compress selected data in response to selection signals and to generate compression data including information about cell inferiority, a strobe signal delayer configured to delay a strobe signal by an amount of time set by a test signal and to generate a delayed strobe signal, and an input/output line driver configured to receive the compression data in sync with the delayed strobe signal and to drive a global input/output line.
Abstract:
The present invention relates to an organic light emitting element and an organic light emitting device including the same. An impurity layer close to an electrode is doped with a small amount, and an impurity layer for a p-n junction is doped with a large amount, such that a high current may flow under a low voltage.