BUILT-IN SELF-TEST CIRCUIT FOR LIQUID CRYSTAL DISPLAY SOURCE DRIVER
    1.
    发明申请
    BUILT-IN SELF-TEST CIRCUIT FOR LIQUID CRYSTAL DISPLAY SOURCE DRIVER 有权
    用于液晶显示源驱动器的内置自检电路

    公开(公告)号:US20110260746A1

    公开(公告)日:2011-10-27

    申请号:US12764346

    申请日:2010-04-21

    IPC分类号: G01R31/02 G01R31/26

    摘要: A built-in self-test (BIST) circuit for a liquid crystal display (LCD) source driver includes at least one digital-to-analog converter (DAC) and at least one buffer coupled to the respective DAC, wherein the buffer is reconfigurable as a comparator. A first input signal and a second input signal are coupled to the comparator. The first input signal is a predetermined reference voltage level. The second input signal is a test offset voltage in a test range.

    摘要翻译: 用于液晶显示器(LCD)源驱动器的内置自检(BIST)电路包括至少一个数模转换器(DAC)和耦合到相应DAC的至少一个缓冲器,其中缓冲器可重新配置 作为比较。 第一输入信号和第二输入信号耦合到比较器。 第一输入信号是预定的参考电压电平。 第二输入信号是测试范围内的测试偏移电压。

    SYSTEM AND METHOD FOR ALIGNING DATA BITS
    2.
    发明申请
    SYSTEM AND METHOD FOR ALIGNING DATA BITS 有权
    用于对准数据位的系统和方法

    公开(公告)号:US20140006883A1

    公开(公告)日:2014-01-02

    申请号:US13539519

    申请日:2012-07-02

    IPC分类号: G06F11/07

    CPC分类号: H04L25/14 G06F13/1689

    摘要: Systems and methods are disclosed for aligning multiple data bits by adjusting the timing of input lines for those data bits. Embodiments include a hierarchical structure for comparing the timing of multiple sets of bits. Other embodiments include aligning data bits from multiple chips in a 3D die stacking architecture.

    摘要翻译: 公开了通过调整这些数据位的输入线的定时来对准多个数据位的系统和方法。 实施例包括用于比较多组位的定时的分层结构。 其他实施例包括在3D管芯堆叠架构中对准来自多个芯片的数据位。