公开(公告)号：US09086464B2

公开(公告)日：2015-07-21

申请号：US13425533

申请日：2012-03-21

申请人： Jung-woo Lee ,  Seung-je Choi ,  Hyug-rae Cho

发明人： Jung-woo Lee ,  Seung-je Choi ,  Hyug-rae Cho

IPC分类号： G01V3/00 ,  G01R33/385 ,  G01R33/36

CPC分类号： G01R33/3852 ,  G01R33/3614

摘要： An magnetic resonance imaging (MRI) device includes at least one amplifier, a control module which controls an operating module of the at least one amplifier, a back-up control module, a determination unit for determining whether the control module is operating normally, and a switching module for performing a switching operation to switch operations of the control module to the at least one back-up control module in the event of abnormal operation of the control module.

摘要翻译： 磁共振成像（MRI）装置包括至少一个放大器，控制至少一个放大器的操作模块的控制模块，备用控制模块，用于确定控制模块是否正常运行的确定单元;以及 切换模块，用于在所述控制模块发生异常操作的情况下执行切换操作以将所述控制模块的操作切换到所述至少一个备用控制模块。

公开(公告)号：US08085679B2

公开(公告)日：2011-12-27

申请号：US11723492

申请日：2007-03-20

申请人： Jung-woo Lee

发明人： Jung-woo Lee

IPC分类号： H04L1/00

CPC分类号： H04N19/154 ,  H04N19/124 ,  H04N19/146

摘要： A bit rate control method may include calculating a quality measure of a current frame and a mean of quality measures of two or more previous frames in order to calculate a deviation of the quality measure of the current frame from the mean of the quality measures of the two or more previous frames; comparing the deviation to a critical value measure; and controlling a quantization parameter in response to a result of the comparison. A bit rate control apparatus may include a quality measure calculator that calculates the quality measure of the current frame and the mean of the quality measures of the two or more previous frames in order to calculate the deviation; a comparator that compares the deviation to the critical value measure; and a quantization parameter setting unit that controls the quantization parameter in response to the result of the comparison.

摘要翻译： 比特率控制方法可以包括计算当前帧的质量度量和两个或更多个先前帧的质量度量的平均值，以便计算当前帧的质量测量的偏差与质量测量的平均值 两个或多个以前的帧; 将偏差与临界值测量进行比较; 以及响应于所述比较的结果来控制量化参数。 比特率控制装置可以包括质量测量计算器，其计算当前帧的质量度量和两个或更多个先前帧的质量度量的平均值，以便计算偏差; 将偏差与临界值测量值进行比较的比较器; 以及量化参数设定单元，其根据比较结果控制量化参数。

公开(公告)号：US20090022900A1

公开(公告)日：2009-01-22

申请号：US12045039

申请日：2008-03-10

申请人： Su-mi Lee ,  Chan-hwa Chung ,  Moon-gyu Lee ,  Jung-woo Lee

发明人： Su-mi Lee ,  Chan-hwa Chung ,  Moon-gyu Lee ,  Jung-woo Lee

IPC分类号： B05D1/32 ,  B05D5/00

CPC分类号： C23C18/1605 ,  C23C18/1879 ,  C23C18/206 ,  C23C18/30 ,  C23C18/31 ,  C23C18/44 ,  G02B5/3058

摘要： A method of manufacturing a wire grid device is provided. The method includes: forming SAM (self assembly monomer) nano patterns on a substrate; and forming a wire grid between neighboring SAM nano patterns on the substrate on which the SAM nano patterns are formed by using an electroless plating technique or forming the wire grid on the SAM nano patterns on the SAM nano patterns by using the SAM nano patterns as a seed layer by using the electroless plating technique.

摘要翻译： 提供一种制造线栅装置的方法。 该方法包括：在衬底上形成SAM（自组装单体）纳米图案; 并通过使用无电镀技术在其上形成SAM纳米图案的基板上的相邻SAM纳米图案之间形成网格，或者通过使用SAM纳米图案作为SAM纳米图案在SAM纳米图案上的SAM纳米图案上形成网格 种子层采用化学镀技术。

公开(公告)号：US06582860B2

公开(公告)日：2003-06-24

申请号：US09783064

申请日：2001-02-14

申请人： Jung-woo Lee ,  Hak Kim

发明人： Jung-woo Lee ,  Hak Kim

IPC分类号： G03F900

CPC分类号： G03F7/40 ,  G03F1/50

摘要： A photomask having small pitch images of openings for fabricating an opening of a semiconductor memory device includes a plurality of images of openings arranged in a row direction with a predetermined pitch to be used to transfer the images of openings onto a photoresist layer, and is used for a photolithographic process employing a photoresist flow process. The distance between the centers of the images of openings arranged in the photomask is larger than the pitch. A photolithographic method for fabricating reduced size openings and a semiconductor memory device having openings fabricated using the same method is also provided.

公开(公告)号：US20070237223A1

公开(公告)日：2007-10-11

申请号：US11723492

申请日：2007-03-20

申请人： Jung-woo Lee

发明人： Jung-woo Lee

IPC分类号： H04N11/04 ,  H04N7/12

CPC分类号： H04N19/154 ,  H04N19/124 ,  H04N19/146

摘要： A bit rate control method may include calculating a quality measure of a current frame and a mean of quality measures of two or more previous frames in order to calculate a deviation of the quality measure of the current frame from the mean of the quality measures of the two or more previous frames; comparing the deviation to a critical value measure; and controlling a quantization parameter in response to a result of the comparison. A bit rate control apparatus may include a quality measure calculator that calculates the quality measure of the current frame and the mean of the quality measures of the two or more previous frames in order to calculate the deviation; a comparator that compares the deviation to the critical value measure; and a quantization parameter setting unit that controls the quantization parameter in response to the result of the comparison.

摘要翻译： 比特率控制方法可以包括计算当前帧的质量度量和两个或更多个先前帧的质量度量的平均值，以便计算当前帧的质量测量的偏差与质量测量的平均值 两个或多个以前的帧; 将偏差与临界值测量进行比较; 以及响应于所述比较的结果来控制量化参数。 比特率控制装置可以包括质量测量计算器，其计算当前帧的质量度量和两个或更多个先前帧的质量度量的平均值，以便计算偏差; 将偏差与临界值测量值进行比较的比较器; 以及量化参数设定单元，其根据比较结果控制量化参数。