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    LEARNING APPARATUS, METHOD, AND STORAGE MEDIUM
    1.
    发明申请
    LEARNING APPARATUS, METHOD, AND STORAGE MEDIUM 有权

    公开(公告)号：US20230056947A1

    公开(公告)日：2023-02-23

    申请号：US17652805

    申请日：2022-02-28

    申请人： KABUSHIKI KAISHA TOSHIBA

    发明人： Shuhei NITTA ,  Yasutaka Furusho ,  Albert Rodriguez Mulet ,  Atsushi Yaguchi ,  Akiyuki TANIZAWA

    IPC分类号： G06N3/08 ,  G06N3/04

    摘要： According to one embodiment, a learning apparatus includes a processing circuit. The processing circuit acquires a first training condition and a first model trained in accordance with the first training condition, sets a second training condition used to reduce a model size of the first model, different from the first training condition, in accordance with the second training condition and based on the first model, trains a second model whose model size is smaller than that of the first model, and in accordance with a third training condition that is not the same as the second training condition and complies with the first training condition, trains a third model based on the second model.

    LEARNING APPARATUS, METHOD AND PROGRAM
    3.
    发明申请
    LEARNING APPARATUS, METHOD AND PROGRAM 有权

    公开(公告)号：US20220284238A1

    公开(公告)日：2022-09-08

    申请号：US17461082

    申请日：2021-08-30

    申请人： KABUSHIKI KAISHA TOSHIBA

    发明人： Shuhei NITTA ,  Akiyuki TANIZAWA

    IPC分类号： G06K9/62 ,  G06T3/40 ,  G06N3/04

    摘要： According to one embodiment, a learning apparatus includes a processor. The processor determines, based on a data resolution of subject data obtained at a subject device, a plurality of data resolutions that differ from one another within a range covering the data resolution of the subject data, the data resolutions each indicating a corresponding amount of information per unit. The processor trains a scalable network with training samples corresponding to each of the plurality of data resolutions, the scalable network being a neural network adapted to change a data resolution of input data.

    DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND STORAGE MEDIUM
    6.
    发明申请
    DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND STORAGE MEDIUM 有权

    公开(公告)号：US20210065344A1

    公开(公告)日：2021-03-04

    申请号：US16802274

    申请日：2020-02-26

    申请人： Kabushiki Kaisha Toshiba

    发明人： Ryusuke HIRAI ,  Kyoka SUGIURA ,  Yukinobu SAKATA ,  Akiyuki TANIZAWA

    IPC分类号： G06T7/00

    摘要： A defect inspection device includes at least one memory storing instructions and at least one processor. The at least one processor is configured to execute the instructions to acquire a first image of an inspection target created in a first creation method, acquire a second image obtained by photographing the inspection target, extract index data similar to the acquired first image with reference to a database, the index data being a third image created in the first creation method or a feature quantity obtained by the third image, the database including the index data associated with correct data that is used as a comparison target of the index data and is an image determined not to be defective in previous inspection, acquire the correct data associated with the extracted index data in the database, generate a reference image on the basis of the acquired correct data, and estimate a pixel associated with a defective position on the inspection target photographed in the second image by comparing the reference image with the second image.