PATTERN DATA CREATING METHOD, TEMPLATE, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
    1.
    发明申请
    PATTERN DATA CREATING METHOD, TEMPLATE, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD 有权
    模式数据创建方法,模板和半导体器件制造方法

    公开(公告)号:US20160064368A1

    公开(公告)日:2016-03-03

    申请号:US14630672

    申请日:2015-02-25

    CPC classification number: G05B19/418 G03F7/0002 G05B2219/45031

    Abstract: According to one embodiment, a pattern data creating method includes a calculation process, a determination process, and a correction process. In the calculation process, it is calculated a stress distribution of stresses that are applied to a template when a distance between the template and a substrate on which resist are disposed is predetermined, the template including a template pattern. In the determination process, it is determined whether or not there is a stress concentration spot in the template pattern at which a stress value larger than a predetermined criterion value is to appear. If the stress concentration spot is present, in the correction process, it is a corrected pattern data of the template pattern such that the stress value at the stress concentration spot becomes a stress value not larger than the predetermined criterion value.

    Abstract translation: 根据一个实施例,图案数据创建方法包括计算处理,确定处理和校正处理。 在计算过程中,计算当模板与其上设置有抗蚀剂的基板之间的距离是预定时施加到模板的应力的应力分布,该模板包括模板图案。 在确定处理中,确定在模板图案中是否存在应力值大于预定标准值的应力集中点。 如果存在应力集中点,则在校正处理中,是模板图案的校正图案数据,使得应力集中点处的应力值成为不大于预定标准值的应力值。

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