公开(公告)号：US20170212013A1

公开(公告)日：2017-07-27

申请号：US15456198

申请日：2017-03-10

Applicant: KABUSHIKI KAISHA TOSHIBA

Inventor： Ena ISHII ,  Hideki ITO ,  Tadatoshi ISHll ,  Ken ISHll

IPC: G01M17/007 ,  G01P3/00 ,  B60L11/18 ,  G01L5/22

CPC classification number: G01M17/007 ,  B60L3/12 ,  B60L7/18 ,  B60L7/26 ,  B60L2200/12 ,  B60L2240/12 ,  B60L2240/421 ,  B60L2240/423 ,  B60L2240/642 ,  B60L2250/26 ,  G01L5/225 ,  G01M13/025 ,  G01P3/00 ,  G01R31/343 ,  Y02T10/642 ,  Y02T10/7291 ,  Y02T90/16

Abstract: According to one embodiment, an electric-vehicle testing apparatus includes processing circuitry. The circuitry generates a first signal corresponding to accelerator operation amount and a second signal corresponding to brake operation amount in accordance with test conditions. The circuitry controls torque of a test motor included in a test object. The circuitry computes running resistance to be assumed using a rotation speed of the test motor. The circuitry computes braking force using the second signal and an actual vehicle speed obtained from the rotation speed of the test motor. The circuitry controls torque of a load motor coupled to the test motor, based on a second command value corresponding to the running resistance and the braking force.