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公开(公告)号:US11450390B2
公开(公告)日:2022-09-20
申请号:US17118703
申请日:2020-12-11
Applicant: Kioxia Corporation
Inventor: Fumiya Watanabe , Masaru Koyanagi , Yutaka Shimizu , Yasuhiro Hirashima , Kei Shiraishi , Mikihiko Ito
Abstract: In a semiconductor integrated circuit, an input circuit includes an input and an output stage electrically connected to the input stage via a first node and a second node. The input stage includes a first transistor, a second transistor, a third transistor, a fourth transistor, a first time constant adjusting circuit, and a second time constant adjusting circuit. The first transistor includes a gate that receives an input signal. The second transistor includes a gate that receives a reference signal. The third transistor is disposed adjacent to a drain of the first transistor. The fourth transistor is disposed adjacent to a drain of the second transistor. The first time constant adjusting circuit is electrically connected between a gate of the third transistor and the first node. The second time constant adjusting circuit is electrically connected between a gate of the fourth transistor and the second node.
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公开(公告)号:US11456023B2
公开(公告)日:2022-09-27
申请号:US17121231
申请日:2020-12-14
Applicant: Kioxia Corporation
Inventor: Yutaka Shimizu , Satoshi Inoue , Isao Fujisawa , Yumi Takada
Abstract: There is provided a semiconductor integrated circuit including an input circuit. The input circuit includes a first amplifier and a second amplifier. The second amplifier is electrically connected to the first amplifier. The second amplifier includes a first transistor, a second transistor, a third transistor, a fourth transistor, and a time constant providing circuit. The first transistor has a gate electrically connected to a first node of the first amplifier. The second transistor has a gate electrically connected to a second node of the first amplifier. The third transistor is disposed adjacent to a drain of the first transistor. The fourth transistor is disposed adjacent to a drain of the second transistor. The time constant providing circuit is electrically connected between a gate of the third transistor and a drain of the third transistor, a gate of the fourth transistor.
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公开(公告)号:US11100975B2
公开(公告)日:2021-08-24
申请号:US16803260
申请日:2020-02-27
Applicant: KIOXIA CORPORATION
Inventor: Rui Ito , Makoto Morimoto , Yutaka Shimizu , Ryuichi Fujimoto
IPC: G11C16/34 , G11C11/4074 , G11C11/408 , G11C7/10 , G11C11/4076 , G11C16/04 , G11C16/26
Abstract: According to one embodiment, a semiconductor memory device includes a plurality of memory cells connected to a word line, a circuit configured to apply a voltage to the word line, a detection circuit configured to detect a first time difference from when a first signal of which a voltage is increased with a first slope is applied to the word line to when a current flows through the memory cells in response to applying the first signal, and a second time difference from when a second signal of which a voltage is increased with a second slope is applied to the word line to when a current flows through the memory cells in response to applying the second signal, the second slope being different from the first slope, and a determination circuit configured to determine a threshold voltage of the memory cells based on a difference between the first time difference and the second time difference.
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